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    • 4. 发明申请
    • Confocal microscope, fluorescence measuring method and polarized light measuring method using cofocal microscope
    • 共焦显微镜,荧光测量法和偏光测量方法采用共焦显微镜
    • US20060012872A1
    • 2006-01-19
    • US10529395
    • 2003-09-18
    • Terutake HayashiKatsuhiro MaekawaTakayuki Shibata
    • Terutake HayashiKatsuhiro MaekawaTakayuki Shibata
    • G02B21/06
    • G01N21/6458G01N21/21G01N21/6445G01N21/6452G01N2021/6471G01N2021/6478G01N2201/0675G02B21/0024G02B21/0068G02B21/0076
    • The present invention relates to a confocal microscope and the measuring methods of fluorescence and the polarized light using the same, and said confocal microscope is provided with the inlet optical part (10, 10′) to let the polarized light from an illuminating light source (11) onto an object to be observed (2) via a matrix type liquid crystal device (22) provided with a microlens array (21) on its top part, and an objective lens (23), the light detecting part (30, 30′) to detect the reflected or the fluorescent light from the object to be observed, and the liquid crystal control subpart (52) to control a liquid crystal device (22), and it transmits the light passing through said microlens array (21) from each microlens to each pixel (22a) of the liquid crystal device (22), and makes a plurality of foci (24) on the object to be observed (2) by the objective lens (23), as well as controls polarization directions of the lights transmitted through each pixel of the liquid crystal device (22) using the liquid crystal control subpart (52) so that they are made mutually orthogonal.
    • 本发明涉及共焦显微镜以及使用其的荧光和偏振光的测量方法,并且所述共聚焦显微镜设置有入射光学部件(10,10'),以使来自照明光源的偏振光 11)通过在其顶部设置有微透镜阵列(21)的矩阵型液晶装置(22)和物镜(23)到待观察的物体(2)上,光检测部分(30,30) ')来检测来自被观察物体的反射光或荧光,以及液晶控制部(52)来控制液晶装置(22),将通过所述微透镜阵列(21)的光从 每个微透镜到液晶装置(22)的每个像素(22a),并且通过物镜(23)在被观察物体(2)上形成多个焦点(24),并且控制偏振方向 的光线通过每个像素传输 使用液晶控制子部(52)使液晶装置(22)相互正交。
    • 5. 发明授权
    • Displacement measuring device and displacement measuring method
    • 位移测量装置和位移测量方法
    • US08804130B2
    • 2014-08-12
    • US13266782
    • 2010-02-22
    • Yasuhiro TakayaTerutake HayashiMasaki Michihata
    • Yasuhiro TakayaTerutake HayashiMasaki Michihata
    • G01B11/02
    • G01B11/14B82Y15/00
    • A displacement measuring device is provided which can directly measure a position and shape of a target object with high precision even if the target object has a minute shape with a high aspect ratio. A displacement measuring device 100 for measuring a change in a distance to a target object S includes a light irradiation section 10 configured to irradiate, with laser light, a light transmissive particle 50 provided at a predetermined distance from a surface of the target object S, a movement section 20 configured to move, relative to the target object S, the particle 50 held in an optical standing wave field generated by interference between light transmitted from the particle 50 and light reflected from the target object S, a sensing section 30 configured to sense a movement signal occurring when the particle 50 relatively moves against confining force caused by the optical standing wave field, and a calculation section 40 configured to derive the change in the distance to the target object S based on the movement signal.
    • 提供了一种位移测量装置,即使目标物体具有高纵横比的微小形状,也可以高精度地直接测量目标物体的位置和形状。 用于测量与目标物体S的距离变化的位移测量装置100包括:光照射部10,被配置为用激光照射设置在距目标物体S的表面预定距离处的透光性粒子50; 运动部分20,被配置为相对于目标物体S移动,保持在由粒子50发射的光与从目标物体S反射的光之间的干涉产生的光驻波中的粒子50;感测部30, 感测当粒子50相对于由光驻波引起的限制力相对移动时发生的运动信号;以及计算部40,被配置为基于移动信号导出与目标物体S的距离的变化。
    • 6. 发明申请
    • DISPLACEMENT MEASURING DEVICE AND DISPLACEMENT MEASURING METHOD
    • 位移测量装置和位移测量方法
    • US20120068066A1
    • 2012-03-22
    • US13266782
    • 2010-02-22
    • Yasuhiro TakayaTerutake HayashiMasaki Michihata
    • Yasuhiro TakayaTerutake HayashiMasaki Michihata
    • G01N23/225G01N23/00
    • G01B11/14B82Y15/00
    • A displacement measuring device is provided which can directly measure a position and shape of a target object with high precision even if the target object has a minute shape with a high aspect ratio. A displacement measuring device 100 for measuring a change in a distance to a target object S includes a light irradiation section 10 configured to irradiate, with laser light, a light transmissive particle 50 provided at a predetermined distance from a surface of the target object S, a movement section 20 configured to move, relative to the target object S, the particle 50 held in an optical standing wave field generated by interference between light transmitted from the particle 50 and light reflected from the target object S, a sensing section 30 configured to sense a movement signal occurring when the particle 50 relatively moves against confining force caused by the optical standing wave field, and a calculation section 40 configured to derive the change in the distance to the target object S based on the movement signal.
    • 提供了一种位移测量装置,即使目标物体具有高纵横比的微小形状,也可以高精度地直接测量目标物体的位置和形状。 用于测量与目标物体S的距离变化的位移测量装置100包括:光照射部10,被配置为用激光照射设置在距目标物体S的表面预定距离处的透光性粒子50; 运动部分20,被配置为相对于目标物体S移动,保持在由粒子50发射的光与从目标物体S反射的光之间的干涉产生的光驻波中的粒子50;感测部30, 感测当粒子50相对于由光驻波引起的限制力相对移动时发生的运动信号;以及计算部40,被配置为基于移动信号导出与目标物体S的距离的变化。