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1. 发明专利

JP2003196666A IMAGE PROCESSING DEVICE BY IMAGE VECTOR DEFINITION AND ITS METHOD 审中-公开
公开(公告)号：JP2003196666A
公开(公告)日：2003-07-11
申请号：JP2001400707
申请日：2001-12-28
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： AIKAWA TETSUO , SAKUMA MASATAKE , SEKI YOSHIRO , BUTSUEN TAKASHI
IPC分类号： G06T5/40 , G06T7/00 , G06T7/60
摘要： PROBLEM TO BE SOLVED: To provide a device and a method having an evaluation index of contour connection information of an image by measuring a histogram of an image vector as a means for evaluating the image quality by image processing. SOLUTION: This image processing device and this method are characterized by being equipped with a data generation means 1 for generating image data based on the reflection quantity of an electromagnetic wave from an object, an image vector operation means 11 for acquiring information on the gradient and the direction of brightness by defining the vector quantity of the image from thickness values of each pixel and its peripheral pixels relative to the image data from the data generation means, a vector processing means for measuring a frequency distribution of the vector length or a frequency distribution of the vector direction from a vector distribution operated by the image vector operation means, and quantitating contour information of the object in a space, a result display means 3 for displaying the result of representation of vectors at each pixel, and a result recording means 4 for recording an image vector operation result and a vector frequency distribution measurement result. COPYRIGHT: (C)2003,JPO

2. 发明专利

JPH11326580A AUTOMATIC SHROUD INSPECTION DEVICE 失效
公开(公告)号：JPH11326580A
公开(公告)日：1999-11-26
申请号：JP15080398
申请日：1998-05-15
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： AIKAWA TETSUO , OCHIAI MAKOTO , TAKABAYASHI JUNICHI , MURAKAMI KOJI , KURATA MASUO , FURUMURA ICHIRO , BUTSUEN TAKASHI , KAN SHIGETOSHI , SAKURAI YOSHISHIGE
IPC分类号： G01N29/00 , G21C17/003 , G21C17/08
摘要： PROBLEM TO BE SOLVED: To provide an automatic shroud inspection device capable of automatically detecting defects such as scratches and cracks from the shroud images continuously taken in and detecting the detected defect locations in a more detailed stereoscopic shape. SOLUTION: A sensing device 3 is moved on a shroud 2 surface to photograph the image signal which is stored in an inspection information recording device 10 and input in an image processing device 8. The image processing device 8 operates the stereoscopic shape of the part of the shroud having a possibility of defects such as scratches and cracks and a flaw detector 9 operates more detailed stereoscopic shape of the defects by transmitting flaw detection signals. These operation results are stored in the inspection information recording device 10.

3. 发明专利

JP2003156389A VIBRATION MEASURING APPARATUS AND STORAGE MEDIUM 审中-公开
公开(公告)号：JP2003156389A
公开(公告)日：2003-05-30
申请号：JP2001355652
申请日：2001-11-21
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： TSUYUKI AKIRA , KUBO KATSUMI , SAKUMA MASATAKE , UHARA YOSHIHIKO , BUTSUEN TAKASHI
IPC分类号： G01H9/00 , G06T7/20
摘要： PROBLEM TO BE SOLVED: To provide a vibration measuring apparatus which enables obtaining of the result of noncontact measurement of a measuring object, and measurement of a plurality of points. SOLUTION: Time series images of a measuring object portion of the vibration measuring object are taken by an imaging portion 14 through the intermediary of an optical portion 13, and are inputted to a data processing portion 16 via an image input portion 15. The processing portion 16 performs vibration analysis of the measuring object portion, on the basis of the inputted time series images of the object portion to be measured. Namely, existence of vibration is detected by cutting out the time series images or a part of them, is expressed numerically in addition, and is outputted by displaying, as needed.

4. 发明专利

JPH11101632A ULTRASONIC MEASURING DEVICE 失效
公开(公告)号：JPH11101632A
公开(公告)日：1999-04-13
申请号：JP27665697
申请日：1997-09-25
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： OCHIAI MAKOTO , OTSUKI MASAHIKO , BUTSUEN TAKASHI
IPC分类号： G01B17/02 , G01N29/00
摘要： PROBLEM TO BE SOLVED: To accurately measure the thickness of an object to be measured, the position of a phase change, and the state of a composition change even if the object is small or is located at a narrow section at a high temperature, by exciting and detecting ultrasonic waves in no contact with the object. SOLUTION: An ultrasonic wave transmitting means 11 excites ultrasonic waves 5 in no contact toward a face of a measured object 1, and an ultrasonic wave receiving means 12 detects reflected waves 9, 10 generated when the ultrasonic waves 5 propagated in the object 1 to be measured are reflected by an acoustic characteristic change region in no contact. A propagation time measuring means 13 measures the propagation time of the ultrasonic waves 5 based on the difference between transmission time of the ultrasonic waves 5 and the reception time of the reflected waves 9, 10. Temperature measuring means 14a, 14b measure the temperature of the ultrasonic wave excitation face of the measured object 1 or its back face or the temperatures of both of them. A velocity calibrating means 15 calibrates the propagation velocity of the ultrasonic waves 5 in the measured object 1 based on the temperatures measured by the temperature measuring means 14a, 14b. A propagation path length measuring means 16 calculates the propagation path length of the ultrasonic waves 5 based on the propagation time and the propagation velocity.

5. 发明专利

JP2001232315A LASER CLEANING DEVICE 失效
公开(公告)号：JP2001232315A
公开(公告)日：2001-08-28
申请号：JP2000050886
申请日：2000-02-28
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： OCHIAI MAKOTO , CHIHOSHI ATSUSHI , SANO YUJI , SHIMA MASAYUKI , NITTO KOICHI , BUTSUEN TAKASHI
IPC分类号： B08B7/00
摘要： PROBLEM TO BE SOLVED: To perform the optimum execution for removing deposit without the preliminary conditioning with respect to analysis, survey and execution of the material in detail. SOLUTION: The removing process in which the deposit on a base material 4 as the object is removed by a laser beam is monitored by a monitoring means 8 and the removal circumstance is judged by a circumstance judging means 9 in accordance with output signals of the monitoring means 8. Further, a control means 10 controls the irradiation conditions of the laser beam in accordance with a judgment result of the circumstance judging means 9.

6. 发明专利

JP2000180418A SURFACE INSPECTING APPARATUS 失效
公开(公告)号：JP2000180418A
公开(公告)日：2000-06-30
申请号：JP35144098
申请日：1998-12-10
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： OCHIAI MAKOTO , CHIHOSHI ATSUSHI , BUTSUEN TAKASHI , NARUSE KATSUHIKO , HIRANO SHOZO , HIRASAWA TAIJI
IPC分类号： G01N29/00 , G01B11/30 , G01N29/44
摘要： PROBLEM TO BE SOLVED: To provide a surface inspecting apparatus capable of detecting the presence and dimension of the surface flaw of an object to be measured in a non-contact and non-destructive manner with high accuracy. SOLUTION: A surface inspecting apparatus is constituted of a surface wave transmitting means 10 for exciting surface waves in a non-contact state with respect to a certain part of an object to be measured, a surface wave detecting means 14 comprising one surface wave detecting element preliminarily arranged at a known position with respect to a transmission position and detecting surface waves or both of surface waves and flaw waves among the surface waves propagated through the surface of the object to be measured and flaw waves generated by the reflection, transmission, diffraction and scattering of the surface waves at a flaw place in a non-contact state, a flaw-detecting means 17 detecting one of the presence and depth of a flaw or both of them from the output signal of the surface wave detecting element, a flaw identifying means 17 adding the presence and depth of the flaw from the flaw wave component contained in the output signal of the surface wave detecting element to identify the position of the flaw and a sonic speed calibrating means 17 calibrating the sonic speed of surface waves from the propagation time of the surface wave component.

7. 发明专利

JPH11216563A DEVICE AND METHOD TO MONITOR WELDING CONDITION 失效
公开(公告)号：JPH11216563A
公开(公告)日：1999-08-10
申请号：JP1988098
申请日：1998-01-30
申请人： TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： MATSUDA FUKUHISA , TANAKA KOTARO , TAKI KEIJI , BUTSUEN TAKASHI
IPC分类号： G01J5/48 , B23K9/095 , B23K9/12 , G01J5/00 , G06T1/00 , G06T7/00
摘要： PROBLEM TO BE SOLVED: To carry out an automatic welding while evaluating a metallurgical soundness of a welding condition during a welding operation in an automatic welding machine and the like which does not rely on a skill and the like of a welder. SOLUTION: A welding condition monitoring device is provided with a video device 1 which outputs video signals by shooting a weld execution surface 20 continuously, an image processing device 2 which extracts geometrical features corresponding to a fused portion 20a formed on the weld execution surface 20 by carrying out an image processing to the video signals outputted from the video device 1, a judging device 3 which evaluates a metallurgical soundness of a welding condition on the basis of the computed result obtained by computing a temperature variation of the fused metal during the welding operation based on brightness changes of geometrical features extruded by the image processing device 2, and a display device 4 which displays the processing result obtained from the image processing device 2 or the evaluation result by the judging device 3.

8. 发明专利

JP2004347410A Method and device for testing nuclear fuel pellet 有权
公开(公告)号：JP2004347410A
公开(公告)日：2004-12-09
申请号：JP2003143389
申请日：2003-05-21
申请人： Toshiba Corp , Toshiba Plant Systems & Services Corp , 東芝プラントシステム株式会社 , 株式会社東芝
发明人： AIKAWA TETSUO , BUTSUEN TAKASHI , ITO MASARU , UTSUNOMIYA KAZUHIRO , MASUBUCHI YUKIO , TSUJI KOICHI
IPC分类号： G21C17/06
摘要： PROBLEM TO BE SOLVED: To provide a method and a device for testing nuclear fuel pellets which enable accurate and efficient tests on the whole surface of them without being affected by inspectors'vision and the like.
SOLUTION: The device has a structure equipped with a conveyor 11 for conveying the nuclear fuel pellets 10, a cone mirror 12 that has a cone-shaped mirror surface whose central axis is passed by the nuclear fuel pellets 10 conveyed by the conveyor 11, a lateral face visualizing device 13 that irradiates lateral faces of the nuclear fuel pellets 10 with light through the medium of the cone mirror 12 and visualizes the reflected light from the nuclear fuel pellets 10 refracted by the cone mirror 12 and a tester mainframe 17 that conducts pass-fail tests on the nuclear fuel pellets 10 from the condition of images of the lateral faces of them obtained through the image processing of pictures inputted from the lateral face visualizing device 13.
COPYRIGHT: (C)2005,JPO&NCIPI

9. 发明专利

JP2008102160A Ultrasonic measuring system 审中-公开
标题翻译：超声波测量系统
公开(公告)号：JP2008102160A
公开(公告)日：2008-05-01
申请号：JP2008009219
申请日：2008-01-18
申请人： Toshiba Corp , Toshiba Plant Systems & Services Corp , 東芝プラントシステム株式会社 , 株式会社東芝
发明人： OCHIAI MAKOTO , OTSUKI MASAHIKO , BUTSUEN TAKASHI
IPC分类号： G01B17/02
摘要： PROBLEM TO BE SOLVED: To provide ultrasonic measuring system which can measure with high accurately the thickness, phase change position and compositional variation states of a measuring object, even when the measuring object is small or is located in a narrow section, or is at a high temperature, such as, in a metal which is being welded.
SOLUTION: In this ultrasonic measuring system, ultrasonic waves are excited by an ultrasonic transmission means in a non-contact manner, in the area where the measuring object is located, then the ultrasonic waves that passed through the measuring object are detected by an ultrasonic receiving means. In addition, a propagation time measuring means measures the propagation time of the ultrasonic waves, from the time difference between the transmission time of the ultrasonic waves and the reception time of the ultrasonic waves. A velocity calibration means calibrates the propagation velocity of the ultrasonic waves in the measuring object from the temperature or the temperature distribution of the measuring object measured by temperature measuring means; while a propagation path length measuring means computes the propagation path length of the ultrasonic waves, from both the propagation time measured by the propagation time measuring means and the sound wave velocity obtained by the velocity calibration means.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够高精度地测量测量对象的厚度，相位和组成变化状态的超声波测量系统，即使当测量对象较小或位于狭窄部分时，或处于高温下，例如在被焊接的金属中。解决方案：在这种超声波测量系统中，超声波被非接触式的超声波传输装置在测量对象所在的区域激发，然后通过测量对象的超声波被超声波接收装置。此外，传播时间测量装置根据超声波的传输时间与超声波的接收时间之间的时间差来测量超声波的传播时间。速度校准装置根据由测量装置测量的测量对象的温度或温度分布校准测量对象中超声波的传播速度; 而传播路径长度测量装置从由传播时间测量装置测量的传播时间和通过速度校准装置获得的声波速度两者来计算超声波的传播路径长度。版权所有（C）2008，JPO＆INPIT

10. 发明专利

JP2007101320A Processor and method for processing ultrasonic flaw detection image 有权
标题翻译：用于处理超声波检测图像的处理器和方法
公开(公告)号：JP2007101320A
公开(公告)日：2007-04-19
申请号：JP2005290395
申请日：2005-10-03
申请人： Toshiba Corp , Toshiba Plant Systems & Services Corp , 東芝プラントシステム株式会社 , 株式会社東芝
发明人： TSUYUKI AKIRA , KUBO KATSUMI , IWATA KIYOSHI , BUTSUEN TAKASHI
IPC分类号： G01N29/06 , G01N29/44
摘要： PROBLEM TO BE SOLVED: To provide a processor and a method for processing an ultrasonic flaw detection image, capable of obtaining an ultrasonic flaw detection inspection result of stable quality. SOLUTION: The processor 1 transmits an ultrasonic wave toward an inspected object, and receives an echo image corresponding an echo reflected by a reflection source inside the inspected object to detect a defect, the processor has an image preparation part 3 for converting the received echo image into an image data, a continuous image display part 5 for displaying continuously a plurality of images generated in the image preparation part 3, an image area information processing part 6 for limiting a pixel resolution and a display area of the image and for preparing a limited area image, an image-to-image motion tracking processing part 7 for tracking the moving of a pixel serving as a defect candidate, using the successive front and rear side images in the images, and a defect position determination part 8 for extracting the defect from the continuity of the plurality of defect candidates to determine a defect position thereof. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种处理器和处理超声波探伤图像的方法，能够获得质量稳定的超声波探伤检查结果。解决方案：处理器1向受检对象发送超声波，并且接收对应于被检查对象内的反射源反射的回波的回波图像以检测缺陷，处理器具有图像准备部分3，用于转换接收到的回波图像成为图像数据，连续图像显示部分5连续地显示在图像准备部分3中生成的多个图像，图像区域信息处理部分6，用于限制图像的像素分辨率和显示区域，准备有限区域图像，使用图像中的连续前侧和后侧图像跟踪用作缺陷候选的像素的移动的图像到图像运动跟踪处理部分7，以及用于从多个缺陷候选者的连续性中提取缺陷以确定其缺陷位置。版权所有（C）2007，JPO＆INPIT

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