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1. 发明申请

WO1995020937A1 A METHOD AND COMPOSITION FOR PROMOTING IMPROVED ADHESION TO SUBSTRATES 审中-公开
标题翻译：用于促进改进粘合剂到基材的方法和组合物
公开(公告)号：WO1995020937A1
公开(公告)日：1995-08-10
申请号：PCT/US1995001063
申请日：1995-01-31
申请人： THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE , AMERICAN DENTAL ASSOCIATION HEALTH FOUNDATION
发明人： THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE , AMERICAN DENTAL ASSOCIATION HEALTH FOUNDATION , ANTONUCCI, Joseph, M. , BENNETT, Patricia, S.
IPC分类号： A61K06/00
CPC分类号： A61K6/0029 , A61K6/0052 , A61K6/0023 , C08L33/08 , C08L33/10
摘要： An etchant/primer composition is provided which includes (a) a compound having the formula (I): RN(CH2YCO2M)2, wherein R = R or R ; R = an aromatic group; R = a conjugated aliphatic group; Y = a single bond, CH2, CHCH3 or C=CH2; and each M is independently H, an alkali metal, an alkaline earth metal, aluminum, a transition or redox metal or an alkyl group having 1 to 18 carbon atoms, with the proviso that when both M groups are alkyl groups, the compound corresponding to formula (I) be capable of being easily hydrolyzed, displaced or exchanged with other reagents present in the etchant/primer composition and (b) a polar solvent system. An etchant/primer/adhesive monomer composition is also provided which includes the etchant/primer composition and an adhesive monomer system. One and two step simplified methods for adhering and for preparing a substrate surface, such as a dental substrate surface, to a polymeric material are also provided. Kits which may be used with these compositions and methods are also provided.
摘要翻译：提供了一种蚀刻剂/底漆组合物，其包括（a）具有式（I）的化合物：RN（CH 2 YCO 2 M）2，其中R = R 1或R 2; R 1 =芳族基团; R 2 =共轭脂族基团; Y =单键，CH2，CHCH3或C = CH2; 每个M独立地为H，碱金属，碱土金属，铝，过渡金属或氧化还原金属或具有1至18个碳原子的烷基，条件是当两个M基团都是烷基时，对应于式（I）能够容易地与蚀刻剂/底漆组合物中存在的其它试剂水解，取代或交换，和（b）极性溶剂体系。还提供了包括蚀刻剂/底漆组合物和粘合剂单体体系的蚀刻剂/底漆/粘合剂单体组合物。还提供了一种和两步简单的方法，用于粘合和制备基材表面，例如牙科基材表面，聚合物材料。也可提供可与这些组合物和方法一起使用的试剂盒。

2. 发明申请

WO1995007469A1 NON-CONTACT LINEWIDTH MEASUREMENT OF SEMICONDUCTOR CONDUCTORS 审中-公开
标题翻译：半导体导体的非接触线性测量
公开(公告)号：WO1995007469A1
公开(公告)日：1995-03-16
申请号：PCT/US1994009322
申请日：1994-08-18
申请人： THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE
发明人： THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE , LARRABEE, Robert, D. , MARCHIANDO, Jay, F.
IPC分类号： G01R27/02
CPC分类号： G01R31/315 , G01R31/2884 , H01L22/12
摘要： A method of measuring the linewidth of an electrical conductor (4) on a semiconductor substrate (1) includes preparing a mutually separated test area (10) and an interconnection area (2) on a surface of the semiconductor substrate; forming the electrical interconnection conductor on the surface of the substrate in the interconnection area with a substantially uniform linewidth and electrically interconnecting elements on the surface; simultaneously with forming the interconnection conductor, forming in the test area a test structure (11) having a plurality of closed loops of the electrical conductor having the same linewidth as the interconnection conductor; measuring the impedance or complex reflection coefficient of the test structure using a head (20) disposed opposite the test area, spaced from the surface, and coupled to the test structure without directly contacting the test structure; and correlating the measured impedance or complex reflection coefficient of the test structure with measurements of geometrically identical structures of conductors having known linewidths to determine the linewidth of the test structure and, thereby, the linewidth of the interconnection conductor.
摘要翻译：测量半导体衬底（1）上的电导体（4）的线宽的方法包括在半导体衬底的表面上准备相互分离的测试区域（10）和互连区域（2）; 在所述互连区域中的所述基板的表面上形成所述电互连导体，其中所述表面上具有基本均匀的线宽和电互连元件; 同时形成互连导体，在测试区域中形成测试结构（11），该测试结构具有与导体相同的线宽的导电体的多个闭环; 使用与所述测试区域相对设置的与所述表面间隔开的头部（20）来测量所述测试结构的阻抗或复反射系数，并且耦合到所述测试结构而不直接接触所述测试结构; 并将测试结构的测量阻抗或复反射系数与具有已知线宽的导体的几何相同结构的测量值相关联，以确定测试结构的线宽，从而确定互连导体的线宽。

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