会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明申请
    • MICROELECTRONIC ASSEMBLIES HAVING VERY FINE PITCH STACKING
    • 具有非常精细的拼接堆叠的微电子组件
    • WO2007075678A2
    • 2007-07-05
    • PCT/US2006/048423
    • 2006-12-19
    • TESSERA, INC.HABA, BelgacemMITCHELL, Craig, S.
    • HABA, BelgacemMITCHELL, Craig, S.
    • H01L25/50H01L25/0657H01L25/105H01L2224/16H01L2225/1023H01L2225/1058H01L2924/15311H01L2924/1532H01L2924/15331H01L2924/3011H01L2924/3511
    • A method of making a stacked microelectronic assembly includes providing a first microelectronic package (122A) having a first substrate (124A) and conductive posts (130A) extending from a surface (128A) of the first substrate (124A), and providing a second microelectronic package (122B) having a second substrate (122B) and conductive, fusible masses (148B) extending from a surface (126B) of the second substrate (124B). A microelectronic element (154A) is secured over one of the surfaces of the first and second substrates (124A), (124B), the microelectronic element (154A) defining a vertical height H 1 that extends from the one of the surfaces of the first and second substrate to which the microelectronic element is secured. The tips (131A) of the conductive posts (130A) of the first substrate are abutted against the apexes of the fusible masses (148B) of the second substrate, whereby the vertical height of each conductive post/fusible mass combination is equal to or greater than the vertical height of the microelectronic element (154A) secured to the one of the surfaces of said first and second substrates .
    • 制造堆叠的微电子组件的方法包括提供具有第一衬底(124A)的第一微电子封装(122A)和从第一衬底(124A)的表面(128A)延伸的导电柱(130A),并且提供第二微电子 具有第二基板(122B)和从第二基板(124B)的表面延伸的导电的可熔块(148B)的封装(122B)。 微电子元件(154A)固定在第一和第二基板(124A),(124B)的一个表面上,微电子元件(154A)限定垂直高度H 1 微电子元件固定到其上的第一和第二基板的表面之一。 第一基板的导电柱(130A)的尖端(131A)抵靠第二基板的可熔块(148B)的顶点,由此​​每个导电柱/可熔组合的垂直高度等于或大于 比固定到所述第一和第二基板的一个表面的微电子元件(154A)的垂直高度高。