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1. 发明申请

WO1994024575A1 ELECTROOPTIC INSTRUMENT 审中-公开
标题翻译：电子仪器
公开(公告)号：WO1994024575A1
公开(公告)日：1994-10-27
申请号：PCT/JP1994000611
申请日：1994-04-12
申请人： TERATEC CORPORATION , TAKEUCHI, Koichiro , KASAHARA, Yukio , MIURA, Akira , IWAOKA, Hideto , SUGIYAMA, Tadashi
发明人： TERATEC CORPORATION
IPC分类号： G01R19/00
CPC分类号： G01R31/2886 , G01Q60/38 , G01R1/06711 , G01R1/071 , Y10S977/868
摘要： A spike-shaped probe (2) is placed extremely close to an object (11) to be measured. This probe is made of an optically active material. The probe is not electrically conductive as it is, so that it does not electrically affect the object. However, if light pulses are applied to the probe, the probe becomes a conductor. As a result, a current flows between the probe and the object to make it possible to measure the potential of the object. This probe can also function as a probe for an interatomic force microscope. With this probe, it is possible to measure high-speed electric waveforms, monitor the position of the probe with a highly precise spacial resolution, and determine the points of control and measurement and others. Thus a highly reliable measurement can be implemented at a low cost.
摘要翻译：钉状探针（2）被放置得非常靠近待测物体（11）。该探针由光学活性材料制成。探头不是导电的，因此它不会电对物体影响。然而，如果光脉冲被施加到探头，则探针变成导体。结果，电流在探针和物体之间流动，使得可以测量物体的电位。该探针也可以用作原子力显微镜的探针。使用该探头，可以测量高速电波形，以高精度的空间分辨率监测探头的位置，并确定控制点和测量点等。因此，可以以低成本实现高度可靠的测量。

2. 发明申请

WO1995022856A1 A/D CONVERTOR 审中-公开
标题翻译： A / D转换器
公开(公告)号：WO1995022856A1
公开(公告)日：1995-08-24
申请号：PCT/JP1995000133
申请日：1995-02-02
申请人： TERATEC CORPORATION , SAKAYORI, Hiroshi
发明人： TERATEC CORPORATION
IPC分类号： H03M01/36
CPC分类号： H03M1/64 , H03M1/368
摘要： An ultrahigh-speed A/D convertor having a simple circuit construction without using optical signals. A phase difference is detected between a signal modulated in phase by an analog signal and its carrier signal. At this time, the phase modulation factor is subjected to binary weighting for A/D conversion. Alternatively, (2 -1) different steps (n: resolution) of delay are given between an analog phase-modulated signal and its carrier. The phase of the signal having this delay and the phase of the signal not having the delay are compared with each other at the (2 -1) steps. An n-bit digital signal is generated and outputted on the basis of this comparison result. The carrier wave is phase shifted in n steps by the analog signal, and the output phases of the phase modulation in n steps are compared with the phase of the carrier wave, respectively. The n-bit digital signal is generated and outputted on the basis of this comparison result. In this case, the hardware quantity can be reduced by using this method in combination with the method described above. In this way, ultrahigh-speed A/D conversion can be executed. Further, accuracy, reliability and frequency can be increased, and noise characteristics, signal quality and modulation efficiency can be improved, too.
摘要翻译：具有简单的电路结构而不使用光信号的超高速A / D转换器。在通过模拟信号相位调制的信号与其载波信号之间检测相位差。此时，对A / D转换进行二进制加权。或者，在模拟相位调制信号与其载波之间给出（2n）-1个延迟的不同步骤（n：分辨率）。具有该延迟的信号的相位和不具有延迟的信号的相位在（2 -1）步骤中彼此进行比较。基于该比较结果生成并输出n位数字信号。载波通过模拟信号以n个步进相移，并且将n个步进中的相位调制的输出相位分别与载波的相位进行比较。基于该比较结果生成并输出n位数字信号。在这种情况下，可以通过结合上述方法使用该方法来减少硬件量。以这种方式，可以执行超高速A / D转换。此外，可以提高精度，可靠性和频率，并且还可以提高噪声特性，信号质量和调制效率。

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