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    • 2. 发明申请
    • REMOTE TEST MANAGEMENT OF DIGITAL LOGIC CIRCUITS
    • 数字逻辑电路远程测试管理
    • WO2015119540A1
    • 2015-08-13
    • PCT/SE2014/050145
    • 2014-02-05
    • TELEFONAKTIEBOLAGET L M ERICSSON (PUBL)
    • DUBROVA, ElenaNÄSLUND, MatsCARLSSON, GunnarFORNEHED, JohnSMEETS, Bernard
    • G01R31/3181G01R31/3183
    • G01R31/2884G01R31/31813G01R31/318335G01R31/318385
    • Electronic devices (320) are provided which comprise a digital logic circuit (101 ) and a test module (322) adapted to receive test parameters from a remote test management device (310), generate test patterns based on the test parameters, apply the test patterns to the digital logic circuit, receive test responses from the digital logic circuit, compact the test responses into a test signature, and either transmit the test signature to the remote test management device or determine a test result based on a comparison of an expected signature received from the remote test management device with the test signature. Further provided are remote test management devices comprising means adapted to acquire test parameters suitable for generating test patterns for a digital logic circuit, acquire an expected signature corresponding to the test patterns, transmit the test parameters to at least one electronic device comprising the digital logic circuit, and either receive a test signature from the at least one electronic device and determine a test result based on a comparison of the expected signature with the test signature, or transmit the expected signature to the at least one electronic device.
    • 提供电子设备(320),其包括适于从远程测试管理设备(310)接收测试参数的数字逻辑电路(101)和测试模块(322),基于测试参数生成测试模式,应用测试 数字逻辑电路的模式,接收来自数字逻辑电路的测试响应,将测试响应压缩成测试签名,并将测试签名传送到远程测试管理设备,或者基于预期签名的比较来确定测试结果 从具有测试签名的远程测试管理设备接收。 还提供了远程测试管理设备,其包括适于获取适于产生数字逻辑电路的测试模式的测试参数的装置,获取与测试模式对应的预期签名,将测试参数发送到包括数字逻辑电路的至少一个电子设备 并且从所述至少一个电子设备接收测试签名,并且基于所述预期签名与所述测试签名的比较来确定测试结果,或者将所述预期签名发送到所述至少一个电子设备。