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1. 发明专利

JP2009180681A Foreign substance inspecting apparatus 有权
标题翻译：外部物质检查装置
公开(公告)号：JP2009180681A
公开(公告)日：2009-08-13
申请号：JP2008021794
申请日：2008-01-31
申请人： System Square Inc , 株式会社システムスクエア
发明人： SAITO SUMIMITSU
IPC分类号： G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide a foreign substance inspecting apparatus which is excellent in safety and practicality, by which the amount of leakage of X rays is lessened as much as possible, and the amount of measurement mistake is also lessened.
SOLUTION: The foreign substance inspecting apparatus has a shield box 5 having an X-ray irradiation section 3 which irradiates an object to be inspected 1 with X rays 2 from above, such that an irradiation cross-section shape is widened toward the end in a direction perpendicular to the conveying direction of the object to be inspected 1, and having an X-ray detecting section 4 which is disposed so as to face the X-ray irradiation section 3 and detects the X rays 2 passing through the object to be inspected 1, wherein a carry-in aperture 6 for carrying the object to be inspected 1 which is conveyed by a conveying mechanism 8, into the shield box 5 is disposed on one side of the shield box 5, and a carry-out aperture 7 for carrying the object to be inspected 1 out of the shield box 5 is disposed on the opposite side of the shield box 5. The whole of the carry-in aperture 6 of the shield box 5 is configured to have an aperture cross-section shape being widened toward the end and approximately coinciding with or being slightly wider than a portion of the irradiation cross-section shape of the X rays 2 which is widened toward the end and positioned on a height position corresponding to the carry-in aperture 6.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：解决的问题：为了提供安全性和实用性优异的异物检查装置，通过该异物检查装置尽可能地减少X射线的泄漏量，并且也减少了测量误差的量。＆lt; P＆gt;解决方案：异物检查装置具有屏蔽盒5，其具有从上方向X射线2照射被检查物体1的X射线照射部3，使得照射截面形状朝向在与待检查物体1的输送方向正交的方向上结束，并且具有配置为与X射线照射部3相对的X射线检测部4，并检测穿过被检体的X射线2 待检查1，其中，用于将由输送机构8输送的检查对象1的携带孔6设置在屏蔽箱5的一侧，并且进行输出屏蔽盒5的相反侧设置有用于将屏蔽盒5内的被检查物体1携带的孔7，保护盒5的整个进入孔6被构造成具有孔径横截面，截面形状向后扩大并通过与X射线2的照射截面形状的一部分相比或稍微宽一些，X射线2的朝向端部变宽并且位于对应于进入孔6的高度位置。版权所有（C））2009，JPO＆INPIT

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