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    • 3. 发明授权
    • Semiconductor laser
    • 半导体激光器
    • US06618416B1
    • 2003-09-09
    • US09807003
    • 2001-06-22
    • Mototaka TaneyaKunihiro TakataniSusumu Ohmi
    • Mototaka TaneyaKunihiro TakataniSusumu Ohmi
    • H01S500
    • B82Y20/00H01S5/0021H01S5/2004H01S5/2086H01S5/2205H01S5/2206H01S5/221H01S5/2218H01S5/222H01S5/2231H01S5/3213H01S5/3216H01S5/32325H01S5/32341H01S5/34333
    • An InGaAlN-based semiconductor laser device, comprising a first layer of a first conductivity type, an active layer having a smaller forbidden band than that of the first layer, and a second layer of a second conductivity type having a larger forbidden band than that of the active layer. The second layer includes a flat region and a stripe-shaped projecting structure. A stripe-shaped optical waveguide forming layer of the second conductivity type having a larger refractive index than that of the second layer is formed on the stripe-shaped projecting structure. A current-constricting layer of the first conductivity type or of a high resistance is formed for covering a top surface of the flat region of the second layer, a side surface of the projecting structure of the second layer, and a side surface of the optical waveguide forming layer. A difference between a thermal expansion coefficient of the current-constricting layer and a thermal expansion coefficient of the second layer is in the range of −4×10−9/° C. to +4×10−9/° C.
    • 1.一种InGaAlN系半导体激光器件,其特征在于,具有第一导电型的第一层,比第一层的禁带宽的有源层,以及具有比第一导电类型更大的禁带宽度的第二导电类型的第二层, 活动层。 第二层包括平坦区域和条形突起结构。 在条状突起结构上形成具有比第二层折射率大的第二导电类型的条形光波导形成层。 形成第一导电型或高电阻的电流限制层,用于覆盖第二层的平坦区域的顶表面,第二层的突出结构的侧表面和光学器件的侧表面 波导形成层。 电流限制层的热膨胀系数与第二层的热膨胀系数之间的差在-4×10 -9 /℃至+ 4×10 -9 /℃的范围内。