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    • 4. 发明申请
    • Nitride based semiconductor device
    • 氮化物基半导体器件
    • US20060086932A1
    • 2006-04-27
    • US11098278
    • 2005-04-04
    • Sun KimDong ChoJe KimKyu LeeJeong OhDong Kim
    • Sun KimDong ChoJe KimKyu LeeJeong OhDong Kim
    • H01L29/06
    • H01L33/32B82Y20/00H01L33/06H01S5/0213H01S5/3216H01S5/34333H01S2304/12
    • The present invention provides a nitride based semiconductor device comprising an active layer having a quantum well layer and a quantum barrier layer, wherein the device includes an electron emitting layer formed of at least two repeats of a first nitride semiconductor layer and a second nitride semiconductor layer having different compositions between a n-type nitride semiconductor layer and the active layer, the first nitride semiconductor layer has an energy band gap greater than that of the quantum well layer, smaller than that of the quantum barrier layer, and decreasing closer to the active layer, and the second nitride semiconductor layer has an energy band gap at least higher than that of the adjacent first nitride semiconductor layer(s) and has a thickness capable of tunneling electrons.
    • 本发明提供了一种氮化物基半导体器件,其包括具有量子阱层和量子势垒层的有源层,其中该器件包括由至少两个重复的第一氮化物半导体层和第二氮化物半导体层形成的电子发射层 在n型氮化物半导体层和有源层之间具有不同的组成,第一氮化物半导体层的能带隙大于量子阱层的能带隙,小于量子势垒层的能带隙,并且更接近于活性层 层,并且第二氮化物半导体层具有至少比相邻的第一氮化物半导体层的能带隙高的能带隙,并且具有能够隧穿电子的厚度。