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1. 发明授权

US06262423B1 Scanning microscope in which a sample is simultaneously and optically excited at various points 失效
标题翻译：扫描显微镜，其中样品在各个点同时和光学激发
公开(公告)号：US06262423B1
公开(公告)日：2001-07-17
申请号：US09125484
申请日：1998-08-18
申请人： Stefan Hell , Jörg Bewersdorf , Rainer Pick
发明人： Stefan Hell , Jörg Bewersdorf , Rainer Pick
IPC分类号： H01J3700
CPC分类号： G02B21/002
摘要： An optical apparatus, especially a scanning microscope (1), wherein an expanded laser beam (2) is divided into several partial beams (4) by micro lenses (5) arranged next to one another. Each partial beam (4) is focused onto a focal point (11) by a common objective lens (7) to optically excite a sample (8). Fluorescent light emanating from the individual focal points (11) of the sample (8) is registered by a photo sensor (13) arranged behind the objective lens (7) as seen from the sample (8). Each photon of the fluorescent light coming from the sample (8) and being registered by the photo sensor (13) is excited by at least two photons of the laser beam (2).
摘要翻译：一种光学装置，特别是扫描显微镜（1），其中通过彼此相邻布置的微透镜（5）将扩展的激光束（2）分成几个部分光束（4）。每个部分光束（4）通过公共物镜（7）聚焦在焦点（11）上以光学激发样品（8）。由样品（8）的各个焦点（11）发出的荧光由配置在物镜（7）后面的光传感器（13）记录在样品（8）上。来自样品（8）并由光传感器（13）记录的荧光的每个光子被激光束（2）的至少两个光子激发。

2. 发明授权

US07054062B2 Double confocal scanning microscope 有权
标题翻译：双共焦扫描显微镜
公开(公告)号：US07054062B2
公开(公告)日：2006-05-30
申请号：US09826712
申请日：2001-04-05
申请人： Johann Engelhardt , Jörg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
发明人： Johann Engelhardt , Jörg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
IPC分类号： G02B21/06 , G02B21/00
CPC分类号： G02B21/0032 , G02B21/0056 , G02B21/0072 , G02B21/0076
摘要： The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.
摘要翻译：本发明涉及具有至少一个光源（3）的照明光束路径（2）和至少一个检测器（5）的检测光束路径（4）的双共聚焦扫描显微镜（1），并且按顺序为了实现几乎理论上可能的分辨能力，特别是在多色荧光应用的上下文中，其特征在于布置在光束路径中的特别是组件（6,10,13,14）的光学特性与彼此相对于样本区域中相对于光轴（33）和/或至少一个表面（18,19,20）的累积像差至少在理论上的数量级上可实现的分辨能力。

3. 发明授权

US07333207B2 Confocal 4-pi microscope and method for confocal 4-pi microscopy 失效
标题翻译：共焦4-pi显微镜和共焦4-pi显微镜的方法
公开(公告)号：US07333207B2
公开(公告)日：2008-02-19
申请号：US10541700
申请日：2004-01-06
申请人： Jörg Bewersdorf , Hilmar Gugel
发明人： Jörg Bewersdorf , Hilmar Gugel
IPC分类号： G01B9/02 , G01J3/45
CPC分类号： G02B21/0056 , G02B21/0032 , G02B21/0076
摘要： The invention relates to a confocal 4π microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.
摘要翻译：本发明涉及一种共聚焦4pi显微镜方法，其特征在于将来自两侧的样品相互照射一个物镜，每个物镜具有至少一个照明波长的照明光，从而产生具有主照明最大值和次照明最大值的固定照明波通过照射光在样品中的干扰。由样品发射的检测光具有至少一个检测波长，并通过两个目标进行检测。使检测光干涉，从而在样品中产生具有主检测最大值，二次检测最大值和检测最小值的检测图案，使得次级照明最大值和检测最小值至少部分重叠。

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