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1. 发明授权

US09245445B2 Optical target detection 有权
标题翻译：光学目标检测
公开(公告)号：US09245445B2
公开(公告)日：2016-01-26
申请号：US13401738
申请日：2012-02-21
申请人： Sri Rama Prasanna Pavani , Jonathan J. Hull , Sergey Chemishkain , Kathrin Berkner
发明人： Sri Rama Prasanna Pavani , Jonathan J. Hull , Sergey Chemishkain , Kathrin Berkner
IPC分类号： H04N5/89 , G03H1/00 , G08G1/0962 , G08G1/16 , G06E3/00 , G01V8/10
CPC分类号： G08G1/09623 , G01V8/10 , G06E3/003 , G08G1/166
摘要： An optically-based target detection system includes a holographic detection filter designed to produce a concentrated spot when a target is present.
摘要翻译：基于光学的目标检测系统包括设计成当存在目标时产生集中点的全息检测滤波器。

2. 发明申请

US20130215218A1 Optical Target Detection 有权
标题翻译：光学目标检测
公开(公告)号：US20130215218A1
公开(公告)日：2013-08-22
申请号：US13401738
申请日：2012-02-21
申请人： Sri Rama Prasanna Pavani , Jonathan J. Hull , Sergey Chemishkain , Kathrin Berkner
发明人： Sri Rama Prasanna Pavani , Jonathan J. Hull , Sergey Chemishkain , Kathrin Berkner
IPC分类号： H04N5/89
CPC分类号： G08G1/09623 , G01V8/10 , G06E3/003 , G08G1/166
摘要： An optically-based target detection system includes a holographic detection filter designed to produce a concentrated spot when a target is present.
摘要翻译：基于光学的目标检测系统包括设计成当存在目标时产生集中点的全息检测滤波器。

3. 发明授权

US08542268B2 Compact multi-aperture three-dimensional imaging system 有权
标题翻译：紧凑型多孔径三维成像系统
公开(公告)号：US08542268B2
公开(公告)日：2013-09-24
申请号：US13039052
申请日：2011-03-02
申请人： Sri Rama Prasanna Pavani , Jorge Moraleda , David G. Stork , Kathrin Berkner
发明人： Sri Rama Prasanna Pavani , Jorge Moraleda , David G. Stork , Kathrin Berkner
IPC分类号： H04N13/02
CPC分类号： H04N13/218 , H04N13/271
摘要： A stereo-imaging system estimates depth based on two images; a multiview-imaging system estimates depth based on two or more images. A passive multiview-imaging system based on a sensor array is designed by considering different candidate partitions of the sensor array into imaging subsystems, especially three or more imaging subsystems.
摘要翻译：立体成像系统基于两个图像估计深度; 多视觉成像系统基于两个或更多个图像来估计深度。通过将传感器阵列的不同候选分区考虑到成像子系统中，特别是三个或更多个成像子系统来设计基于传感器阵列的无源多视图成像系统。

4. 发明申请

US20120224029A1 Compact Multi-Aperture Three-Dimensional Imaging System 有权
标题翻译：紧凑型多孔三维成像系统
公开(公告)号：US20120224029A1
公开(公告)日：2012-09-06
申请号：US13039052
申请日：2011-03-02
申请人： Sri Rama Prasanna Pavani , Jorge Moraleda , David G. Stork , Kathrin Berkner
发明人： Sri Rama Prasanna Pavani , Jorge Moraleda , David G. Stork , Kathrin Berkner
IPC分类号： H04N13/02
CPC分类号： H04N13/218 , H04N13/271
摘要： A stereo-imaging system estimates depth based on two images; a multiview-imaging system estimates depth based on two or more images. A passive multiview-imaging system based on a sensor array is designed by considering different candidate partitions of the sensor array into imaging subsystems, especially three or more imaging subsystems.
摘要翻译：立体成像系统基于两个图像估计深度; 多视觉成像系统基于两个或更多个图像来估计深度。通过将传感器阵列的不同候选分区考虑到成像子系统中，特别是三个或更多个成像子系统来设计基于传感器阵列的无源多视图成像系统。

5. 发明申请

US20160116419A1 MULTIPLE CAMERA WAFER INSPECTION 审中-公开
标题翻译：多相机摄像机检测
公开(公告)号：US20160116419A1
公开(公告)日：2016-04-28
申请号：US14526484
申请日：2014-10-28
申请人： Sri Rama Prasanna Pavani
发明人： Sri Rama Prasanna Pavani
IPC分类号： G01N21/88 , H04N7/18 , G01N21/95
CPC分类号： H04N7/181 , G01N21/9501
摘要： A system and method for inspecting a surface, comprising: illuminating said surface with an electromagnetic radiation to generate scattered radiation, having a plurality of scattering angles, from features of said surface; collecting said scattered radiation from said surface at two or more positions, with radiation collected at each position forming an image of a plurality of points on said surface by collecting a portion of said scattered radiation propagating in a subset of said scattering angles; detecting images of surface at two or more said positions; and combining information from two or more said images of surface to generate a global information set, having information from a plurality of said scattering angles collected by two or more said imaging modules, whereby said features of said surface are detected in said images of surface and in said global information set.
摘要翻译：一种用于检查表面的系统和方法，包括：用电磁辐射照射所述表面，从所述表面的特征产生具有多个散射角的散射辐射; 在两个或更多个位置收集来自所述表面的散射辐射，其中在每个位置处收集的辐射通过收集在所述散射角的子集中传播的所述散射辐射的一部分来形成所述表面上的多个点的图像; 在两个或更多个所述位置检测表面的图像; 以及组合来自两个或更多个所述表面的所述图像的信息以产生全局信息集合，其具有由两个或更多个所述成像模块收集的多个所述散射角度的信息，由此在所述表面图像中检测所述表面的所述特征，在全球信息集中。

6. 发明申请

US20160109376A1 LENTICULAR WAFER INSPECTION 有权
标题翻译：透视检查
公开(公告)号：US20160109376A1
公开(公告)日：2016-04-21
申请号：US14519054
申请日：2014-10-20
申请人： Sri Rama Prasanna Pavani
发明人： Sri Rama Prasanna Pavani
IPC分类号： G01N21/88 , G01N21/95
CPC分类号： G01N21/8806 , G01B11/26 , G01N21/9501 , G01N2021/8822 , G01N2201/06113 , G01N2201/12 , G03F9/7088
摘要： A system and method for inspecting a surface, comprising: illuminating said surface with an electromagnetic radiation to generate scattered radiation from features of said surface; inducing a change in phase to said scattered radiation for reducing divergence of said scattered radiation and for redirecting said scattered radiation towards a predetermined spatial region; focusing after said radiation has propagated to said spatial region; capturing an image of radiation, whereby said features of said surface are detected in said image of radiation.
摘要翻译：一种用于检查表面的系统和方法，包括：用电磁辐射照射所述表面以从所述表面的特征产生散射辐射; 诱发所述散射辐射的相位变化，以减少所述散射辐射的发散并且将所述散射辐射重定向到预定的空间区域; 在所述辐射已经传播到所述空间区域之后聚焦; 捕获辐射图像，由此在所述辐射图像中检测所述表面的所述特征。

7. 发明申请

US20140153104A1 Fabrication of Lenses Using High Viscosity Liquid 有权
标题翻译：使用高粘度液体制作镜片
公开(公告)号：US20140153104A1
公开(公告)日：2014-06-05
申请号：US13693870
申请日：2012-12-04
申请人： Sri Rama Prasanna Pavani , Brian P. McCall
发明人： Sri Rama Prasanna Pavani , Brian P. McCall
IPC分类号： B05D5/06 , G02B3/00
CPC分类号： G02B3/0012 , B29D11/00365
摘要： A method for fabricating millimeter and sub-millimeter size lenses using a high viscosity curable liquid, such as epoxy. The method comprises dispensing a predetermined volume of the curable liquid onto a substrate. The curable liquid preferably has a viscosity higher than 100 cps. Additionally, to reduce spherical aberration, the curable liquid can be cured upside down to leverage the effects of gravity.
摘要翻译：使用高粘度可固化液体如环氧树脂制造毫米和亚毫米尺寸的透镜的方法。该方法包括将预定体积的可固化液体分配到基底上。可固化液体的粘度优选高于100cps。此外，为了减小球面像差，可固化液体可以颠倒固化以利用重力的作用。

8. 发明申请

US20220304546A1 DISH CLEANING BY DIRT LOCALIZATION AND TARGETING 有权
公开(公告)号：US20220304546A1
公开(公告)日：2022-09-29
申请号：US17211860
申请日：2021-03-25
申请人： Sri Rama Prasanna Pavani
发明人： Sri Rama Prasanna Pavani
IPC分类号： A47L15/42 , G06T7/174 , G06T1/00 , G06K9/62 , G06T7/521 , G06K9/00 , G06T7/593 , A47L15/46 , A47L15/00
摘要： A system and method for cleaning a dish, comprising: capturing at least one image of said dish using at least one camera; computing a bounding polygon for a dirty region in said image, wherein said dirty region is a region of said dish containing unwanted material that needs to be removed; computing a three dimensional representation of said bounding polygon by estimating three dimensional locations of multiple points within said bounding polygon; computing a spray pattern within said three dimensional representation of said bounding polygon such that the spray pattern substantially covers all regions of said three dimensional representation; and spraying a fluid on said dirty region of said dish with a nozzle, wherein said nozzle is reoriented or relocated such that said fluid reaches at least one location within said three dimensional representation of said bounding polygon according to said spray pattern, whereby dirty regions of said dish are targeted for a fast and efficient cleaning of said dish.

9. 发明申请

US20220288789A1 DISH PERCEPTION, PLANNING AND CONTROL FOR ROBOTS 有权
公开(公告)号：US20220288789A1
公开(公告)日：2022-09-15
申请号：US17202266
申请日：2021-03-15
申请人： Sri Rama Prasanna Pavani
发明人： Sri Rama Prasanna Pavani
IPC分类号： B25J9/16 , G06K9/62 , G06T7/73 , H04N5/225 , H04N7/18 , B25J11/00 , A47B81/04
摘要： A system and method for perceiving a dish, planning its handling, and controlling its motion, comprising: capturing at least one image of a region disposed to comprise said dish using at least one camera; classifying said image using a dish detection model to determine the presence of a dish; classifying said image using a dish identification model to determine the type of said dish; estimating the position and orientation of said dish using a dish localization model; picking up, holding, or dropping off said dish securely using said type, position, and orientation of said dish with a robotic arm, whereby said dish is detected, identified, and localized to securely move it from one location to another.

10. 发明授权

US09324541B1 Certified wafer inspection 有权
公开(公告)号：US09324541B1
公开(公告)日：2016-04-26
申请号：US14547111
申请日：2014-11-18
申请人： Sri Rama Prasanna Pavani
发明人： Sri Rama Prasanna Pavani
IPC分类号： G06K9/00 , H01J37/26 , H01J37/20 , H01J37/22
CPC分类号： H01J37/263 , H01J37/28 , H01J2237/221 , H01L22/12 , H01L22/20
摘要： A method for certifying an inspection system using a calibrated surface, comprising: acquiring a calibrated list from said calibrated surface, with said calibrated list comprising information about features located on said calibrated surface; inspecting said calibrated surface with said inspection system to generate an estimated list, with said estimated list comprising information about features located on said calibrated surface; generating a matched list by searching for the presence of one or more calibrated features in said estimated list, wherein said calibrated features are listed in said calibrated list; computing an estimated characteristic parameter from said matched list, wherein said estimated characteristic parameter quantifies features in said matched list having a unifying characteristic; and comparing said estimated characteristic parameter with a calibrated characteristic parameter, wherein said calibrated characteristic parameter quantifies features in said calibrated list having said unifying characteristic, whereby the ability of said inspection system to detect features with one or more characteristics is certified. A system and method for imaging a surface to generate an adaptive resolution image, comprising: determining a weakly scattering feature, wherein said weakly scattering feature produces a weak image response to be resolved by said adaptive resolution image; determining a coarse spot size such that said weakly scattering feature is detected in an image captured with said coarse spot size; capturing a coarse image of region with said coarse spot size, wherein said coarse image of region comprises one or more pixels corresponding to a predetermined region of said surface; classifying said coarse image of region into a coarse image of feature and a coarse image of surface, wherein a feature is detected in said coarse image of feature and a feature is not detected in said coarse image of surface; estimating a feature position from said coarse image of feature, wherein said feature position is the location of feature on said surface; capturing a fine image of feature at said feature position, wherein said fine image of feature is captured with a fine spot size having a smaller spot size than said coarse spot size; and combining said fine image of feature and said coarse image of surface to generate said adaptive resolution image, whereby feature regions are captured with finer resolution than featureless surface regions in said adaptive resolution image.

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