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    • 2. 发明授权
    • Regulation circuit and method for the erasing phase of non-volatile
memory cells
    • 非易失性存储单元擦除阶段的调节电路和方法
    • US5617356A
    • 1997-04-01
    • US395361
    • 1995-02-21
    • Carla GollaSilvia PadoanMarco Olivo
    • Carla GollaSilvia PadoanMarco Olivo
    • G11C17/00G11C16/06G11C16/14G11C16/16G11C16/02
    • G11C16/16G11C16/14
    • A regulating circuit for discharging non-volatile memory cells in an electrically programmable memory device, of the type which comprises at least one switch connected between a programming voltage reference and a line shared by the source terminals of the transistors forming said memory cells, and at least one discharge connection between said common line to the source terminals and a ground voltage reference, further comprises a second connection to ground of the line in which a current generator is connected and a normally open switch. Also provided is a logic circuit connected to the line to compare the voltage value present on the latter with a predetermined value, and to output a control signal for causing the switch to make. This solution allows a slow discharging phase of the line to be effected at the end of the erasing phase.
    • 一种用于对电可编程存储器件中的非易失性存储单元进行放电的调节电路,该电路包括连接在编程电压基准和由形成所述存储单元的晶体管的源极端子共享的线之间的至少一个开关, 所述公共线与源极端子之间的至少一个放电连接和接地电压基准,还包括与电流发生器连接的线路的第二连接点和常开开关。 还提供了连接到线路的逻辑电路,用于将存在于其上的电压值与预定值进行比较,并输出用于使开关产生的控制信号。 该解决方案允许在擦除阶段结束时实现线路的缓慢放电阶段。
    • 5. 发明授权
    • Stable reference voltage generator circuit
    • 稳定的参考电压发生器电路
    • US06392469B1
    • 2002-05-21
    • US08347788
    • 1994-11-30
    • Silvia PadoanCarla Golla
    • Silvia PadoanCarla Golla
    • G05F110
    • G05F3/245
    • A circuit for generating a stable reference voltage (Vref) as temperature and process parameters vary, including at least one field-effect transistor (M1) and an associated resistive bias element (R) connected in series between a supply voltage (Vcc) and ground (GND), further includes a second field-effect transistor (M2) connected to the first transistor such that the reference voltage (Vref) can be picked up as the difference between the respective threshold voltages of the two transistors. This provides a reference voltage which is uniquely stable against variations in temperature and process parameters.
    • 用于产生作为温度和过程参数的稳定参考电压(Vref)的电路变化,包括串联连接在电源电压(Vcc)和地之间的至少一个场效应晶体管(M1)和相关联的电阻偏置元件(R) (GND),还包括连接到第一晶体管的第二场效应晶体管(M2),使得可以拾取参考电压(Vref)作为两个晶体管的各个阈值电压之间的差。 这提供了对温度和工艺参数变化独特稳定的参考电压。