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1. 发明授权

US09157826B2 Method and system to compensate for temperature and pressure in piezo resistive devices 有权
标题翻译：用于补偿压电器件温度和压力的方法和系统
公开(公告)号：US09157826B2
公开(公告)日：2015-10-13
申请号：US14197221
申请日：2014-03-05
申请人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
发明人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
IPC分类号： G01L27/00 , G01L9/06
CPC分类号： G01L27/005 , G01L9/065 , G01L27/002
摘要： A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.
摘要翻译：一种用于校准具有两个变量的非线性传感器的压电器件中的温度和压力的方法和系统，其中压电电阻器件例如压力传感器系统中使用的压阻式换能器（PRT）被校准以计算实际/ 环境温度和压力即使PRT阻抗相对于压力不平衡。

2. 发明申请

US20120247175A1 METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIEZO RESISTIVE DEVICES 有权
标题翻译：在PIEZO电阻器件中补偿温度和压力的方法和系统
公开(公告)号：US20120247175A1
公开(公告)日：2012-10-04
申请号：US13077963
申请日：2011-03-31
申请人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
发明人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
IPC分类号： G01L27/00
CPC分类号： G01L27/005 , G01L9/065 , G01L27/002
摘要： A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.
摘要翻译：一种用于校准具有两个变量的非线性传感器的压电器件中的温度和压力的方法和系统，其中压电电阻器件例如压力传感器系统中使用的压阻式换能器（PRT）被校准以计算实际/ 环境温度和压力即使PRT阻抗相对于压力不平衡。

3. 发明申请

US20140182353A1 METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIEZO RESISTIVE DEVICES 有权
标题翻译：在PIEZO电阻器件中补偿温度和压力的方法和系统
公开(公告)号：US20140182353A1
公开(公告)日：2014-07-03
申请号：US14197221
申请日：2014-03-05
申请人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
发明人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
IPC分类号： G01L27/00
CPC分类号： G01L27/005 , G01L9/065 , G01L27/002
摘要： A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.
摘要翻译：一种用于校准具有两个变量的非线性传感器的压电器件中的温度和压力的方法和系统，其中压电电阻器件例如压力传感器系统中使用的压阻式换能器（PRT）被校准以计算实际/ 环境温度和压力即使PRT阻抗相对于压力不平衡。

4. 发明授权

US08701460B2 Method and system to compensate for temperature and pressure in piezo resistive devices 有权
标题翻译：用于补偿压电器件温度和压力的方法和系统
公开(公告)号：US08701460B2
公开(公告)日：2014-04-22
申请号：US13077963
申请日：2011-03-31
申请人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
发明人： Siddhartha Gopal Krishna , Chad S. Dawson , Vikram Varma
IPC分类号： G01L27/00
CPC分类号： G01L27/005 , G01L9/065 , G01L27/002
摘要： A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.
摘要翻译：一种用于校准具有两个变量的非线性传感器的压电器件中的温度和压力的方法和系统，其中压电电阻器件例如压力传感器系统中使用的压阻式换能器（PRT）被校准以计算实际/ 环境温度和压力即使PRT阻抗相对于压力不平衡。

5. 发明授权

US09353017B2 Method of trimming current source using on-chip ADC 有权
标题翻译：使用片上ADC调整电流源的方法
公开(公告)号：US09353017B2
公开(公告)日：2016-05-31
申请号：US14307472
申请日：2014-06-17
申请人： Siddhartha Gopal Krishna , Vikram Varma
发明人： Siddhartha Gopal Krishna , Vikram Varma
IPC分类号： H03L5/00 , C05F3/02 , H03M1/12
CPC分类号： C05F3/02 , G05F3/02 , H03M1/12 , H03M1/48 , Y02A40/206 , Y02P20/145
摘要： A method of trimming a current source in an IC includes deriving a reference voltage from an external supply, and developing a measurement voltage across an external reference resistance receiving the current to be trimmed. An on-chip ADC is used to provide corresponding digital reference and digital measurement signals. A digital comparator compares the digital signals and provides a digital trim signal, which is used to adjust the current to be trimmed until the digital measurement signal is equal to the digital reference signal within an acceptable tolerance. Gain and offset errors in the ADC cancel and do not affect the calibration of the trim operation.
摘要翻译：在IC中修整电流源的方法包括从外部电源导出参考电压，以及跨接在待修整电流上的外部参考电阻产生测量电压。片上ADC用于提供相应的数字参考和数字测量信号。数字比较器比较数字信号并提供数字微调信号，用于调整待修整的电流，直到数字测量信号等于可接受公差内的数字参考信号。 ADC中的增益和偏移误差取消，不影响校正操作的校准。

6. 发明授权

US09643558B2 Input signal mismatch detection circuit 有权
公开(公告)号：US09643558B2
公开(公告)日：2017-05-09
申请号：US14624591
申请日：2015-02-18
申请人： Siddhartha Gopal Krishna , Russell J. Lynch , Vikram Varma
发明人： Siddhartha Gopal Krishna , Russell J. Lynch , Vikram Varma
IPC分类号： B60R21/013 , H03K17/94 , G06F11/16 , B60R21/0132 , B60R21/017 , B60R21/01
CPC分类号： B60R21/01336 , B60R21/0173 , B60R2021/01129 , B60R2021/01177 , B60R2021/01286
摘要： A system for detecting a mismatch between first and second input signals includes first and second analog-to-digital converters, a time-division multiplexing circuit, first and second processors, a time-division de-multiplexing circuit, and a gating circuit. The first processor includes a first sinc filter, a first trimmer, a first infinite impulse response (IIR) filter, and a first high pass filter (HPF). The second processor includes a second sinc filter, a second IIR filter, and a second HPF. A bandwidth of the second IIR filter and the second HPF is greater than a bandwidth of the first IIR filter and the first HPF. A transfer function of the first IIR filter and the first HPF uses floating-point coefficients and a transfer function of the second IIR filter and the second HPF uses coefficients that are an integral power of two.

7. 发明申请

US20160236637A1 INPUT SIGNAL MISMATCH DETECTION CIRCUIT 有权
标题翻译：输入信号误差检测电路
公开(公告)号：US20160236637A1
公开(公告)日：2016-08-18
申请号：US14624591
申请日：2015-02-18
申请人： SIDDHARTHA GOPAL KRISHNA , Russell J. Lynch , Vikram Varma
发明人： SIDDHARTHA GOPAL KRISHNA , Russell J. Lynch , Vikram Varma
IPC分类号： B60R21/013 , H03K17/94
CPC分类号： B60R21/01336 , B60R21/0173 , B60R2021/01129 , B60R2021/01177 , B60R2021/01286
摘要： A system for detecting a mismatch between first and second input signals includes first and second analog-to-digital converters, a time-division multiplexing circuit, first and second processors, a time-division de-multiplexing circuit, and a gating circuit. The first processor includes a first sinc filter, a first trimmer, a first infinite impulse response (IIR) filter, and a first high pass filter (HPF). The second processor includes a second sinc filter, a second IIR filter, and a second HPF. A bandwidth of the second IIR filter and the second HPF is greater than a bandwidth of the first IIR filter and the first HPF. A transfer function of the first IIR filter and the first HPF uses floating-point coefficients and a transfer function of the second IIR filter and the second HPF uses coefficients that are an integral power of two.
摘要翻译：用于检测第一和第二输入信号之间的失配的系统包括第一和第二模数转换器，时分复用电路，第一和第二处理器，时分解复用电路和选通电路。第一处理器包括第一正弦滤波器，第一微调器，第一无限脉冲响应（IIR）滤波器和第一高通滤波器（HPF）。第二处理器包括第二sinc滤波器，第二IIR滤波器和第二HPF。第二IIR滤波器和第二HPF的带宽大于第一IIR滤波器和第一HPF的带宽。第一IIR滤波器和第一HPF的传递函数使用浮点系数和第二IIR滤波器的传递函数，并且第二HPF使用作为2的整数倍的系数。

8. 发明申请

US20150362942A1 METHOD OF TRIMMING CURRENT SOURCE USING ON-CHIP ADC 有权
标题翻译：使用片上ADC研究电流源的方法
公开(公告)号：US20150362942A1
公开(公告)日：2015-12-17
申请号：US14307472
申请日：2014-06-17
申请人： Siddhartha Gopal Krishna , Vikram Varma
发明人： Siddhartha Gopal Krishna , Vikram Varma
IPC分类号： G05F3/02 , H03M1/12
CPC分类号： C05F3/02 , G05F3/02 , H03M1/12 , H03M1/48 , Y02A40/206 , Y02P20/145
摘要： A method of trimming a current source in an IC includes deriving a reference voltage from an external supply, and developing a measurement voltage across an external reference resistance receiving the current to be trimmed. An on-chip ADC is used to provide corresponding digital reference and digital measurement signals. A digital comparator compares the digital signals and provides a digital trim signal, which is used to adjust the current to be trimmed until the digital measurement signal is equal to the digital reference signal within an acceptable tolerance. Gain and offset errors in the ADC cancel and do not affect the calibration of the trim operation.
摘要翻译：在IC中修整电流源的方法包括从外部电源导出参考电压，以及跨接在待修整电流上的外部参考电阻产生测量电压。片上ADC用于提供相应的数字参考和数字测量信号。数字比较器比较数字信号并提供数字微调信号，用于调整要修整的电流，直到数字测量信号等于可接受公差内的数字参考信号。 ADC中的增益和偏移误差取消，不影响校正操作的校准。

9. 发明授权

US09071265B1 Successive approximation analog-to-digital converter with linearity error correction 有权
标题翻译：具有线性误差校正的逐次逼近模数转换器
公开(公告)号：US09071265B1
公开(公告)日：2015-06-30
申请号：US14457124
申请日：2014-08-12
申请人： Sanjoy K. Dey , Vikram Varma
发明人： Sanjoy K. Dey , Vikram Varma
IPC分类号： H03M1/10 , H03M1/14 , H03M1/12 , H03M1/80 , H03M1/06 , H03M1/00 , H03M7/16
CPC分类号： H03M1/0695 , H03M1/00 , H03M1/0607 , H03M1/12 , H03M1/468 , H03M1/804 , H03M7/165
摘要： A SAR ADC includes capacitors, a comparator, and a SAR logic circuit. The capacitors include a first set of capacitors and an error-detection capacitor. The first set of capacitors generates a first set of voltage signals that are compared with a common-mode voltage signal (VCM) by the comparator during a first set of comparison cycles. The comparator generates a first set of control signals that is used by the SAR logic circuit to successively approximate the first set of voltage signals and generate a first set of bits. An error-detection capacitor generates an error-detection signal that is compared with the common-mode voltage signal VCM by the comparator to generate an error-detection control signal. The SAR logic circuit compensate for an error in the first set of bits based the logic state of the error-detection control signal.
摘要翻译： SAR ADC包括电容，比较器和SAR逻辑电路。电容器包括第一组电容器和误差检测电容器。第一组电容器产生第一组电压信号，该电压信号在第一组比较周期期间由比较器与共模电压信号（VCM）进行比较。比较器产生第一组控制信号，由SAR逻辑电路用来连续近似第一组电压信号并产生第一组位。误差检测电容器生成与比较器的共模电压信号VCM进行比较以产生检错控制信号的检错信号。 SAR逻辑电路基于错误检测控制信号的逻辑状态来补偿第一组位中的错误。

10. 发明申请

US20130249723A1 METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGISTER (SAR) A/D CONVERTER 有权
标题翻译：自适应寄存器（SAR）A / D转换器自检的方法和装置
公开(公告)号：US20130249723A1
公开(公告)日：2013-09-26
申请号：US13901590
申请日：2013-05-24
申请人： Sanjoy K. Dey , Michael T. Berens , James R. Feddeler , Vikram Varma
发明人： Sanjoy K. Dey , Michael T. Berens , James R. Feddeler , Vikram Varma
IPC分类号： H03M1/10
CPC分类号： H03M1/1071 , H03M1/109 , H03M1/468
摘要： A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.
摘要翻译：单端SAR ADC包括一个额外的电容器，一个自检引擎，以及对采样和保持条件的独立控制，可以对ADC进行快速准确的测试。

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