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    • 1. 发明授权
    • Semiconductor differential amplifier
    • 半导体差分放大器
    • US4780686A
    • 1988-10-25
    • US1028
    • 1987-01-07
    • Shuji MurakamiKatsuki Ichinose
    • Shuji MurakamiKatsuki Ichinose
    • H03F3/345H03F3/45H03K19/0952
    • H03F3/45076H03F2203/45112
    • A semiconductor differential amplifier includes first and second MOS transistors of a first conductivity type acting as driver transistors, and third through sixth MOS transistors of a second conductivity type acting as load transistors. First and second input terminals are respectively connected to gate terminals of the first and fifth, and second and sixth transistors. Therefore, since input signals are applied to transistors of both the load and driver sections of the amplifier, the amplifier exhibits a higher sensitivity for detecting relatively small differences between the voltage at the first input terminal and the voltage at the second input terminal.
    • 半导体差分放大器包括用作驱动晶体管的第一导电类型的第一和第二MOS晶体管,以及用作负载晶体管的第二导电类型的第三至第六MOS晶体管。 第一和第二输入端子分别连接到第一和第五和第二和第六晶体管的栅极端子。 因此,由于输入信号被施加到放大器的负载和驱动器部分的晶体管,所以放大器具有较高的灵敏度,用于检测第一输入端子处的电压与第二输入端子处的电压之间的较小的差异。
    • 2. 发明授权
    • Static random access memory with reduced soft error rate
    • 具有降低软错误率的静态随机存取存储器
    • US4879690A
    • 1989-11-07
    • US231063
    • 1988-08-11
    • Kenji AnamiKatsuki IchinoseTomohisa Wada
    • Kenji AnamiKatsuki IchinoseTomohisa Wada
    • G11C5/00G11C11/412
    • G11C11/4125G11C5/005
    • A storage node in each of memory cells in a static RAM is connected to a bit line through an accessing MOSFET. The accessing MOSFET has its gate connected to a word line. A word line driver comprising a level shifting N channel MOSFET and a CMOS inverter is connected to the word line. At the time of selecting the word line, a potential which is lower, by a threshold voltage of the MOSFET, than a power-supply potential is applied to the word line. Thus, a sub-threshold current flowing in the MOSFET connected between the storage node for storing data at a high level and the bit line to which data of a high level is read out becomes substantially small, so that a potential of the storage node for storing data of a high level is not lowered.
    • 静态RAM中每个存储单元中的存储节点通过访问MOSFET连接到位线。 存取MOSFET的栅极连接到字线。 包括电平移位N沟道MOSFET和CMOS反相器的字线驱动器连接到字线。 在选择字线时,对字线施加低于MOSFET的阈值电压的电位低于电源电位的电位。 因此,在连接在用于存储高电平的数据的存储节点和读出高电平的数据的位线之间的MOSFET中流动的子阈值电流变得基本上小,从而存储节点的电位 存储高电平的数据不降低。
    • 6. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US4709354A
    • 1987-11-24
    • US788228
    • 1985-10-16
    • Katsuki IchinoseHirofumi Shinohara
    • Katsuki IchinoseHirofumi Shinohara
    • G11C7/00G11C8/08G11C11/40
    • G11C8/08
    • A semiconductor memory device includes a plurality of memory cell rows each including a plurality of memory cells; a plurality of row selection signal lines each for transmitting a row selection signal to the memory cells of each memory cell row; and a row decoder for giving a row selection signal to the row selection signal line connected to the memory cells on a memory cell row in accordance with the row address input externally, wherein the row selection signal is at a power supply voltage level during a reading-out period, an intermediate voltage level between the power supply voltage and a ground level during the writing-in period, and the ground level at periods other than the writing-in and reading-out periods.
    • 半导体存储器件包括多个存储单元行,每个存储单元行包括多个存储单元; 多个行选择信号线,用于将行选择信号发送到每个存储单元行的存储单元; 以及行解码器,用于根据从外部输入的行地址向连接到存储单元行上的存储单元的行选择信号线提供行选择信号,其中行选择信号在读取期间处于电源电压电平 在写入期间,电源电压和地电平之间的中间电压电平以及写入和读出周期以外的周期的地电平。
    • 8. 发明授权
    • Semiconductor stress sensor
    • 半导体应力传感器
    • US5381696A
    • 1995-01-17
    • US883752
    • 1992-05-15
    • Katsuki IchinoseKatuhiko Takebe
    • Katsuki IchinoseKatuhiko Takebe
    • G01D3/00G01D5/18G01L1/18G01L9/00G01L9/04G01P15/12H01L29/84G01B7/16
    • G01P15/124G01D5/18G01L1/18
    • A semiconductor stress sensor includes a field-effect transistor for producing a drain current commensurate with a stress applied thereto. The gate of the field-effect transistor is supplied with a gate bias voltage from a gate bias voltage generator. The drain current from the field-effect transistor is converted into a detected output signal by a current-to-voltage converter. The gate-to-source voltage of the field-effect transistor can be varied to reduce the drain current in a standby mode when no stress is to be detected. To vary the gate-to-source voltage, the gate bias voltage applied to the gate of the field-effect transistor may be slightly varied or the source potential thereof may be slightly varied. The gate-to-source voltage of the field-effect transistor slightly differ from each other in the standby and stress sensing modes. Even in the standby mode, the field-effect transistor is supplied with substantially the same voltage as in the stress sensing mode. When the semiconductor stress sensor switches from the standby mode to the stress sensing mode, the drain current is subjected to an only small drift, allowing the semiconductor stress sensor to produce a highly accurate, stable detected output signal within a short period of time.
    • 半导体应力传感器包括用于产生与施加到其上的应力相当的漏极电流的场效应晶体管。 场效应晶体管的栅极被提供来自栅极偏置电压发生器的栅极偏置电压。 来自场效应晶体管的漏极电流由电流 - 电压转换器转换成检测的输出信号。 当不需要检测到应力时,可以改变场效应晶体管的栅极 - 源极电压,以便在待机模式下减小漏极电流。 为了改变栅极至源极电压,施加到场效应晶体管的栅极的栅极偏置电压可以稍微变化,或者其源极电位可能稍微变化。 在待机和应力感测模式下,场效应晶体管的栅源电压略有不同。 即使在待机模式下,场效应晶体管被提供与应力感测模式基本上相同的电压。 当半导体应力传感器从待机模式切换到应力感测模式时,漏极电流仅经受一个小的漂移,允许半导体应力传感器在短时间内产生高精度,稳定的检测输出信号。
    • 9. 发明授权
    • Semiconductor memory device having hierarchical row selecting lines
    • 具有分级行选择线的半导体存储器件
    • US4977538A
    • 1990-12-11
    • US400223
    • 1989-08-29
    • Kenji AnamiKatsuki Ichinose
    • Kenji AnamiKatsuki Ichinose
    • G11C11/401G11C7/00G11C8/12G11C8/14G11C11/407G11C11/41
    • G11C8/14G11C8/12
    • A memory cell array of this semiconductor memory device is divided into a plurality of large memory cell groups, and each of the large memory cell groups is further divided into a plurality of small memory cell groups. A plurality of main row-selecting lines, a plurality of sub row-selecting lines and a plurality of word lines are provided in the memory cell array, each of the large memory cell groups and each of the small memory cell groups, respectively. Main global decoders select one of the main row-selecting lines in response to an internal address signal. Sub global decoders select a sub row-selecting line associated with the selected main row-selecting line in the large memory cell group selected by a large memory cell group selecting signal. Local decoders select a word line associated with the selected sub row-selecting line in the small memory cell group selected by a small memory cell group selecting signal.
    • 该半导体存储器件的存储单元阵列被分成多个大存储单元组,并且每个大存储单元组进一步分成多个小存储单元组。 多个主行选择线,多个子行选择线和多个字线分别设置在存储单元阵列中,每个大存储单元组和每个小存储单元组。 主要全局解码器响应内部地址信号选择主行选择行之一。 子全局解码器选择与由大存储器单元组选择信号选择的大存储单元组中的所选主行选择线相关联的子行选择线。 本地解码器选择与由小存储单元组选择信号选择的小存储单元组中的所选子行选择线相关联的字线。