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    • 1. 发明申请
    • Semiconductor device
    • 半导体器件
    • US20060220166A1
    • 2006-10-05
    • US11395599
    • 2006-03-30
    • Shuichi KikuchiShigeaki OkawaKiyofumi NakayaToshiyuki Takahashi
    • Shuichi KikuchiShigeaki OkawaKiyofumi NakayaToshiyuki Takahashi
    • H01L29/861
    • H01L29/872H01L29/866
    • In a semiconductor device of the present invention, a protection diode for protecting a device is formed on an epitaxial layer formed on a substrate. A Schottky barrier metal layer is formed on a surface of the epitaxial layer and a P-type diffusion layer is formed at a lower portion of an end portion of the Schottky barrier metal layer. Then, a P-type diffusion layer is formed to be connected to a P-type diffusion layer and is extended to a cathode region. A metal layer to which an anode electrode is applied is formed above the P-type diffusion layer, thereby making it possible to obtain a field plate effect. This structure reduces a large change in a curvature of a depletion layer, thereby improving a withstand voltage characteristic of the protection diode.
    • 在本发明的半导体器件中,在形成在基板上的外延层上形成用于保护器件的保护二极管。 在外延层的表面上形成肖特基势垒金属层,在肖特基势垒金属层的端部的下部形成P型扩散层。 然后,形成P型扩散层以连接到P型扩散层并延伸到阴极区。 在P型扩散层的上方形成有施加了阳极电极的金属层,能够得到场板效应。 这种结构减小了耗尽层的曲率的大的变化,从而提高了保护二极管的耐电压特性。
    • 2. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07737523B2
    • 2010-06-15
    • US11395599
    • 2006-03-30
    • Shuichi KikuchiShigeaki OkawaKiyofumi NakayaToshiyuki Takahashi
    • Shuichi KikuchiShigeaki OkawaKiyofumi NakayaToshiyuki Takahashi
    • H01L29/93
    • H01L29/872H01L29/866
    • In a semiconductor device of the present invention, a protection diode for protecting a device is formed on an epitaxial layer formed on a substrate. A Schottky barrier metal layer is formed on a surface of the epitaxial layer and a P-type diffusion layer is formed at a lower portion of an end portion of the Schottky barrier metal layer. Then, a P-type diffusion layer is formed to be connected to a P-type diffusion layer and is extended to a cathode region. A metal layer to which an anode electrode is applied is formed above the P-type diffusion layer, thereby making it possible to obtain a field plate effect. This structure reduces a large change in a curvature of a depletion layer, thereby improving a withstand voltage characteristic of the protection diode.
    • 在本发明的半导体器件中,在形成在基板上的外延层上形成用于保护器件的保护二极管。 在外延层的表面上形成肖特基势垒金属层,在肖特基势垒金属层的端部的下部形成P型扩散层。 然后,形成P型扩散层以连接到P型扩散层并延伸到阴极区。 在P型扩散层的上方形成有施加了阳极电极的金属层,能够得到场板效应。 这种结构减小了耗尽层的曲率的大的变化,从而提高了保护二极管的耐电压特性。
    • 7. 发明授权
    • Reservoir tank and brake system using the reservoir tank
    • 储罐和制油系统采用储罐
    • US08997481B2
    • 2015-04-07
    • US13119792
    • 2009-09-16
    • Toshiyuki Takahashi
    • Toshiyuki Takahashi
    • B60T11/22
    • B60T11/22
    • In a reservoir tank (5) of the present invention, a hydraulic fluid movement deterring wall (26) is disposed integrally with an upper half body (9) and extending toward a radial direction center of a cylindrical upper half body neck section (24) on a curved portion at a boundary between an inner peripheral surface (24a) of the cylindrical upper half body neck section (24) and an inner surface (25a1) of a ceiling portion (25a) of an upper half body trunk section (25) or on the inner peripheral surface (24a) of the upper half body neck section (24). The movement of the hydraulic fluid frontward (toward a hydraulic fluid inlet (10)) in a hydraulic fluid storage chamber 13 at a time when the reservoir tank (5) is tilted frontward is controlled by this hydraulic fluid movement deterring wall (26).
    • 在本发明的储罐(5)中,液压流体运动阻止壁(26)与上半体(9)一体地设置并且朝向圆柱形上半体颈部(24)的径向中心延伸, 在圆筒形上半身颈部(24)的内周面(24a)与上半身躯干部(25)的顶部(25a)的内表面(25a1)之间的边界处的弯曲部分上, 或在上半体颈部(24)的内周面(24a)上。 在液压流体移动阻止壁(26)中控制储存箱(5)向前倾斜时液压流体向前(朝向液压流体入口(10))的运动。
    • 8. 发明授权
    • Microphone
    • 麦克风
    • US08917897B2
    • 2014-12-23
    • US13318248
    • 2011-03-16
    • Yusuke NakagawaYasuhiro HorimotoTadashi InoueToshiyuki Takahashi
    • Yusuke NakagawaYasuhiro HorimotoTadashi InoueToshiyuki Takahashi
    • H04R9/08H04R11/04H04R17/02H04R19/04H04R21/02H04R1/04H04R1/06
    • H04R1/04H01L2224/16225H04R1/06H04R19/04
    • Provided is a microphone capable of reducing a plane area seen from above, and further increasing a capacity of a back chamber of an acoustic sensor. An interposer 52 is mounted on a top surface of a circuit board 43, and an acoustic sensor 51 is mounted on the top surface thereof. A signal processing circuit 53 is accommodated in a space 70 provided in the interposer 52, and mounted on the circuit board 43. The acoustic sensor 51 is connected to the circuit board 43 through a wiring structure provided in the interposer 52. The acoustic sensor 51, the interposer 52 and the like are covered by a cover 42 put on the top surface of the circuit board 43. In the cover 42, a sound introduction hole 48 is opened in a position opposed to the front chamber of the acoustic sensor 51. The interposer 52 is formed with a ventilation notch 71 for acoustically communicating a space below a diaphragm 56 of the acoustic sensor 51 with a space inside the cover 42 and outside the interposer 52.
    • 提供了能够减少从上方看到的平面区域并进一步增加声学传感器的后室的容量的麦克风。 插入器52安装在电路板43的顶表面上,声传感器51安装在其顶表面上。 信号处理电路53容纳在设置在插入器52中的空间70中,并且安装在电路板43上。声传感器51通过设置在插入器52中的布线结构连接到电路板43.声传感器51 插入器52等被放置在电路板43的上表面上的盖42覆盖。在盖42中,声音引入孔48在与声学传感器51的前室相对的位置打开。 内插件52形成有通气凹口71,用于将声传感器51的隔膜56下方的空间与罩42内的空间和插入件52外部隔开。
    • 10. 发明申请
    • PROGRAMMING METHOD TO TIGHTEN THRESHOLD VOLTAGE WIDTH WITH AVOIDING PROGRAM DISTURB
    • 使用避免程序干扰来调节阈值电压宽度的编程方法
    • US20140016415A1
    • 2014-01-16
    • US13546553
    • 2012-07-11
    • Teruhiko KameiCuong TrinhAtsushi InoueToshiyuki Takahashi
    • Teruhiko KameiCuong TrinhAtsushi InoueToshiyuki Takahashi
    • G11C16/04
    • G11C11/5628G11C16/3418G11C16/3427
    • A non-volatile storage system that performs a multi-stage programming process to program non-volatile storage to a set of data threshold voltage distributions. The multi-stage programming process includes performing a first stage of the multi-stage programming process to change threshold voltages of at least a subset of the non-volatile storage elements from an erased distribution to one or more intermediate distributions, performing an intermediate stage of the multi-stage programming process to change threshold voltages of at least some of the non-volatile storage elements to appropriate distributions of the data threshold voltage distributions, and performing a later stage of the multi-stage programming process, after performing the intermediate stage of the multi-stage programming process, to tighten only a subset of the data threshold voltage distributions.
    • 执行多级编程处理以将非易失性存储器编程为一组数据阈值电压分布的非易失性存储系统。 多级编程过程包括执行多阶段编程过程的第一阶段,以将非易失性存储元件的至少一个子集的阈值电压从擦除分布改变到一个或多个中间分布,执行中间阶段 所述多级编程处理将所述非易失性存储元件中的至少一些的阈值电压改变为所述数据阈值电压分布的适当分布,以及在执行所述多级编程过程的后期阶段之后,执行所述多级编程处理的中间级 多级编程过程,仅收紧数据阈值电压分布的子集。