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    • 6. 发明授权
    • Adjustable programming speed for NAND memory devices
    • NAND存储器件可编程速度可调
    • US08595597B2
    • 2013-11-26
    • US13039553
    • 2011-03-03
    • Ningde XieMatthew GoldmanJawad B. KhanRobert W. Faber
    • Ningde XieMatthew GoldmanJawad B. KhanRobert W. Faber
    • G11C29/00G06F11/00
    • G06F11/1048G11C16/00G11C29/021G11C29/028G11C29/52G11C2029/0409G11C2029/0411
    • Embodiments of the invention describe methods, systems and apparatuses to improve solid state device (SSD) write speed by efficiently utilizing error correction code executed for the device. SSDs may be comprised of several NAND memory devices. It is understood that such devices tend to have a raw bit error rate (RBER) that is related to the program/erase cycle count for the device.Embodiments of the invention efficiently use system ECC by changing the operating conditions of the SSD to better utilize the robustness of the implemented ECC algorithm. For example, embodiments of the invention may alter the programming voltage supplied to an SSD to increase write speed; such an increase may increase the RBER of the device, but will not affect the accuracy of such operations due to the ECC that is provisioned for end of life storage fidelity (i.e., the RBER that will occur at the end of life).
    • 本发明的实施例描述了通过有效利用为设备执行的纠错码来改善固态设备(SSD)写入速度的方法,系统和装置。 SSD可以由多个NAND存储器件组成。 应当理解,这样的设备倾向于具有与设备的编程/擦除周期计数相关的原始误码率(RBER)。 本发明的实施例通过改变SSD的操作条件来有效地使用系统ECC,以更好地利用所实施的ECC算法的鲁棒性。 例如,本发明的实施例可以改变提供给SSD的编程电压以增加写入速度; 这样的增加可能增加设备的RBER,但是由于为终端存储保真度(即,将在生命结束时发生的RBER)提供的ECC而不会影响这种操作的准确性。