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1. 发明申请

US20130001421A1 METHOD AND APPARATUS FOR ANALYZING SAMPLE USING TERAHERTZ WAVE 审中-公开
标题翻译：使用TERAHERTZ波分析样品的方法和装置
公开(公告)号：US20130001421A1
公开(公告)日：2013-01-03
申请号：US13534200
申请日：2012-06-27
申请人： Seong-Min PYO , Wang-Joo LEE , Jae-Ick CHOI
发明人： Seong-Min PYO , Wang-Joo LEE , Jae-Ick CHOI
IPC分类号： G01J5/10 , H01L27/146
CPC分类号： G01J3/42 , G01N21/3581
摘要： Disclosed are a method and an apparatus for analyzing a sample using terahertz waves. The method of analyzing a sample using terahertz waves includes: generating terahertz waves; simultaneously radiating two or more electromagnetic waves with different radiation angles, using the terahertz waves with a transmitting antenna; receiving the two or more electromagnetic waves transmitting the sample with a receiving antenna; and acquiring an analysis image of the sample by processing the received two or more electromagnetic waves In accordance with the present invention, it is possible to reduce the time taken to acquire an analysis image of a sample by simultaneously radiating terahertz waves with different radiation angels from one antenna.
摘要翻译：公开了一种使用太赫兹波分析样本的方法和装置。使用太赫兹波分析样本的方法包括：产生太赫兹波; 使用具有发射天线的太赫兹波同时辐射具有不同辐射角的两个或更多个电磁波; 接收用接收天线发送样本的两个或更多个电磁波; 并且通过处理所接收的两个或更多个电磁波获取样本的分析图像根据本发明，可以通过以不同的辐射天使同时辐射太赫兹波来减少获取样本的分析图像所花费的时间一个天线。

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