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    • 2. 发明授权
    • Module for packaging semiconductor integrated circuit chips on a base
substrate
    • 在基板上封装半导体集成电路芯片的模块
    • US4866507A
    • 1989-09-12
    • US864228
    • 1986-05-19
    • Scott L. JacobsPerwaiz NihalBurhan OzmatHenri D. SchnurmannArthur R. Zingher
    • Scott L. JacobsPerwaiz NihalBurhan OzmatHenri D. SchnurmannArthur R. Zingher
    • H01L23/12H01L23/50H01L23/538
    • H01L23/5383H01L23/50H01L2224/16H01L2924/01014H01L2924/01079H01L2924/10253H01L2924/3011H01L2924/3025
    • An integrated circuit chip packaging structure, preferably having a semiconductor base substrate, i.e., silicon or gallium arsenide, alternating insulation and conductive layers on the base structure, at least two conductive layers being patterned into thin film wiring (i.e., thin film copper of approximately 5 microns), semiconductor integrated circuit chips connected to the upper-most patterned conductive layer, and means to connected the packaging structure to the next level of packaging (i.e., board or card).The thin film wiring layers typically each having coplanar ground, power and signal lines, with at least one power or ground line existing between coplanar signal lines to minimize cross talk. To facilitate efficient power distribution, lines of specific power levels of the patterned planes are connected to lines of the same power level on other patterned planes to form three dimensional power planes. To reduce package capacitance and keep the RC constant low, a personalized reference plane is incorporated. The personalized plane has insulating regions extending at least partially through the plane at predetermined locations that coincide with long signal lines on the wiring layers. The combined package provides a packaging alternative that has excellent electrical performance (i.e., speed, low RC constant, efficient power distribution), high density and thermal expansion matching between the underlying semiconductor structure and semiconductor chips mounted on the package. A high yield process for manufacturing the package is also disclosed.
    • 一种集成电路芯片封装结构,优选地具有半导体基底(即,硅或砷化镓),在基底结构上的交替绝缘和导电层,将至少两个导电层图案化成薄膜布线(即大约为薄膜铜 5微米),连接到最上层图案的导电层的半导体集成电路芯片,以及将封装结构连接到下一级封装(即板或卡)的装置。 薄膜布线层通常各自具有共面的接地,功率和信号线,其中至少一个电源线或地线存在于共面信号线之间,以最小化串扰。 为了便于有效的功率分配,图案化平面的特定功率电平的线被连接到在其它图案化平面上的相同功率电平的线以形成三维电源平面。 为了减少封装电容并使RC恒定不变,引入了一个个性化的参考平面。 个性化平面具有至少部分地延伸穿过平面的绝缘区域,该预定位置与布线层上的长信号线重合。 组合封装提供具有优异的电性能(即,速度,低RC恒定,有效功率分布),下层半导体结构和安装在封装上的半导体芯片之间的高密度和热膨胀匹配的封装替代方案。 还公开了用于制造封装的高产量工艺。
    • 6. 发明申请
    • System and Method for Software Debugging
    • 软件调试的系统和方法
    • US20080077780A1
    • 2008-03-27
    • US10565618
    • 2004-07-23
    • Arthur R. Zingher
    • Arthur R. Zingher
    • G06F9/00
    • G06F11/3636G06F11/3648
    • The software debugging system provides a processor that is executing a software process, and the software process has a bug or other failure. A fast-response reporter circuit connects to a low level asset in the processor, such as a reorder buffer, commit buffer, or high speed data path. The fast response reporter circuit is configured to selectively extract data from the low-level asset, and the extracted data is transmitted to an evidence file for review and analysis. In one arrangement, a fast-response sentry circuit also connects to a low-level asset in the processor, and is configured to monitor for a predefined event. When the predefined event occurs, the fast-response sentry circuit causes an action to occur, such as activation of the reporter fast-response circuit.
    • 软件调试系统提供了一个正在执行软件过程的处理器,并且软件进程有一个错误或其他故障。 快速响应记者电路连接到处理器中的低级别资产,例如重排序缓冲器,提交缓冲器或高速数据路径。 快速响应报告器电路被配置为从低级别资产中选择性地提取数据,并将提取的数据传送到证据文件进行审查和分析。 在一种安排中,快速响应报警电路还连接到处理器中的低级别资产,并且被配置为监视预定事件。 当预定义的事件发生时,快速响应信号电路引起动作发生,例如报告器快速响应电路的激活。