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    • 3. 发明授权
    • ZONE BOUNDARY ADJUSTMENT FOR DEFECTS IN NON-VOLATILE MEMORIES
    • BEZUG中的ZONENGRENZENEINSTELLUNG在NICHTFLÜCHTIGENSPEICHERN
    • EP1570489B1
    • 2012-04-25
    • EP03790271.5
    • 2003-12-02
    • SanDisk Technologies Inc.
    • CONLEY, Kevin, M.
    • G06F12/02G11C29/00
    • G06F12/0246G11C16/04G11C29/4401G11C29/76G11C29/808
    • A non-volatile memory is divided into logical zones by the card controller in order reduce the size of the data structures it uses for address translation. Zone boundaries are adjusted to accommodate defects allowed by memory test to improve card yields and to adjust boundaries in the field to extend the usable lifetime of the card. Firmware scans for the presence of defective blocks on the card. Once the locations of these blocks are known, the firmware calculates the zone boundaries in such a way that good blocks are equally distributed among the zones. Since the number of good blocks meets the card test criteria by the memory test criteria, defects will reduce card yield fallout. The controller can perform dynamic boundary adjustments. When defects occur, the controller can perform the analysis again and, if needed, redistributes the zone boundaries, moving any user data.
    • 非易失性存储器由卡控制器分为逻辑区,以减小其用于地址转换的数据结构的大小。 调整区域边界以适应内存测试允许的缺陷,以提高卡片产量并调整现场边界以延长卡片的使用寿命。 固件扫描卡上有缺陷块的存在。 一旦这些块的位置是已知的,固件就以这样一种方式来计算区域边界,使得良好的块在区域之间是均匀分布的。 由于良好块的数量符合内存测试标准的卡测试标准,因此缺陷会降低卡片产生的影响。 控制器可以进行动态边界调整。 当发生故障时,控制器可以再次进行分析,如果需要,可以重新分配区域边界,移动任何用户数据。