会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Optical head
    • 光头
    • US5978346A
    • 1999-11-02
    • US16527
    • 1998-01-30
    • Sadao MizunoTsuguhiro KorenagaShinji Uchida
    • Sadao MizunoTsuguhiro KorenagaShinji Uchida
    • G11B7/00G11B7/135G11B7/12
    • G11B7/1395G11B7/1353G11B7/1356G11B7/1365G11B7/1374G11B7/1381G11B2007/0006G11B2007/13727
    • An optical head has a light source; luminous flux splitting means for splitting radiation luminous flux of linearly polarized light radiated from the light source into plural luminous fluxes without changing the luminous flux diameter substantially; a wavelength plate for polarizing at least one of the luminous fluxes split by the luminous flux splitting means into a nearly circularly polarized light as illumination luminous flux; an objective lens for converging the illumination luminous flux through the wavelength plate on an optical information medium and collecting the reflected light; and a photodetector for receiving the reflected luminous flux collected by the objective lens after passing through the wavelength plate and the luminous flux splitting means. The quantity of received light for maintaining the S/N ratio is sufficient for reproducing a high density optical disk and a conventional optical disk with a large birefringence.
    • 光头具有光源; 光束分离装置,用于将从光源辐射的线偏振光的辐射光束分散成多个光束而不改变光通量; 波长板,用于将由光束分离装置分割的光束中的至少一个偏振成近似圆偏振光作为照明光束; 用于将通过波长板的照明光束会聚在光信息介质上并收集反射光的物镜; 以及光电检测器,用于接收通过波长板和光通量分离装置之后由物镜收集的反射光通量。 用于保持S / N比的接收光量足以再现高密度光盘和具有大双折射率的传统光盘。
    • 2. 发明授权
    • Optical head
    • 光头
    • US5790503A
    • 1998-08-04
    • US755405
    • 1996-11-22
    • Sadao MizunoTsuguhiro KorenagaShinji Uchida
    • Sadao MizunoTsuguhiro KorenagaShinji Uchida
    • G11B7/00G11B7/135
    • G11B7/1395G11B7/1353G11B7/1356G11B7/1365G11B7/1374G11B7/1381G11B2007/0006G11B2007/13727
    • An optical head has a light source, luminous flux splitting means for splitting radiation luminous flux of linearly polarized light radiated from the light source into plural luminous fluxes, a wavelength plate for polarizing at least one of the luminous fluxes split by the luminous flux splitting means into a nearly circularly polarized light as illumination luminous flux, an objective lens for converging the illumination luminous flux on an optical information medium and collecting the reflected light, and a photo detector for receiving the reflected luminous flux, after passing through the wavelength plate and the luminous flux splitting means, wherein supposing a power efficiency when splitting the illumination luminous flux from the radiation luminous flux to be E1, a power efficiency when transmitting a polarized light component of the reflected luminous flux, the component being orthogonal to a direction of polarization of the illumination luminous flux, to the photo detector to be E2, and a power efficiency when transmitting a polarized light component of the reflected luminous flux, the component having substantially same direction as a direction of polarization of the illumination luminous flux, to the photo detector to be E3, the E2 is larger than the E1 and the E1.times.E3 is such amount that can be detected by the photo detector.
    • 光头具有光源,用于将从光源辐射的线偏振光的辐射光束分解成多个光束的光束分离装置,用于偏振由光束分离装置分割的至少一个光束的波长板 成为近似圆偏振光作为照明光束,用于将照明光束会聚在光信息介质上并收集反射光的物镜,以及用于接收反射光束的光检测器,在经过波长板和 光束分离装置,其中当将从所述辐射光通量分离所述照明光束时的功率效率设定为E1时,将所述反射光束的偏振光分量透射时的功率效率,所述偏振光分量正交于偏振方向 照明光通量,到光电检测器 为E2,当将具有与照明光束的偏振方向大致相同的方向的反射光束的偏振光分量发送到光电检测器时的功率效率为E2,E2大于 E1和E1xE3是可以由光电检测器检测到的量。
    • 5. 发明授权
    • Multilayer film forming apparatus and film forming method
    • 多层成膜装置及成膜方法
    • US5863379A
    • 1999-01-26
    • US275273
    • 1994-07-15
    • Shinji UchidaTsuguhiro KorenagaHideo KurokawaAkito Sawada
    • Shinji UchidaTsuguhiro KorenagaHideo KurokawaAkito Sawada
    • C23C14/54G01B11/06B32B31/00
    • C23C14/547G01B11/0683Y10T156/10
    • A multilayer film forming apparatus including a film forming chamber, a substrate on which a multilayer film is formed, an optical thickness monitoring substrate which controls an optical thickness of each layer of a multilayer film, a monitor exchange system which exchanges the optical thickness monitoring substrate for each layer and a multilayer film monitoring substrate which is disposed under the optical thickness monitoring substrate to observe spectral characteristics of the multilayer film. The invention also includes a light source which irradiates light to the optical thickness monitoring substrate and to the multilayer film monitoring substrate, an optical lens which reshapes the light radiated from the light source, an optical window which lets the light into and out of the film forming chamber, a detector which detects the light quantity reflected from the optical thickness monitoring substrate and a spectral characteristics evaluation device which measures spectral characteristics of the light reflected from the multilayer film monitoring substrate. The multilayer film monitoring substrate is fixed to a holding jig to prevent itself from inclining more than ten minutes against the disposed state.
    • 一种多层膜形成装置,包括:成膜室,形成有多层膜的基板;控制多层膜的各层的光学厚度的光学厚度监视基板;交换光学厚度监视基板的监视器交换系统 并且设置在光学厚度监视基板下方以观察多层膜的光谱特性的多层膜监视基板。 本发明还包括将光照射到光学厚度监测基板和多层膜监视基板的光源,重新形成从光源照射的光的光学透镜,使光入射到膜的光学窗口 检测从光学厚度监测基板反射的光量的检测器和测量从多层膜监测基板反射的光的光谱特性的光谱特性评价装置。 多层膜监视基板固定在保持夹具上,以防止自身相对于处置状态倾斜超过十分钟。
    • 8. 发明申请
    • IMAGING DEVICE
    • 成像装置
    • US20130141634A1
    • 2013-06-06
    • US13701924
    • 2012-05-18
    • Tsuguhiro KorenagaNorihiro Imamura
    • Tsuguhiro KorenagaNorihiro Imamura
    • H04N5/238
    • H04N5/238A61B1/00009A61B1/00096A61B1/00188A61B1/00193A61B1/051G02B27/4205H04N5/225H04N5/2254H04N5/332H04N9/07
    • An imaging device includes: a lens optical system including a first region and a second region having different optical properties; an imaging element including first pixels and second pixels; an arrayed optical element which is provided between the lens optical system and the imaging element, allows light passing through the first region to enter the first pixels, and allows light passing through the second region to enter the second pixels; a signal processing unit configured to generate object information using pixel values obtained from the first pixels and the second pixels; and a diffractive optical element provided between the arrayed optical element and the lens optical system and including a diffraction grating symmetrical about an optical axis of the lens optical system.
    • 成像装置包括:透镜光学系统,包括具有不同光学特性的第一区域和第二区域; 成像元件,包括第一像素和第二像素; 设置在透镜光学系统和成像元件之间的排列的光学元件允许通过第一区域的光进入第一像素,并允许穿过第二区域的光进入第二像素; 信号处理单元,被配置为使用从所述第一像素和所述第二像素获得的像素值来生成对象信息; 以及衍射光学元件,设置在所述阵列的光学元件和所述透镜光学系统之间并且包括关于所述透镜光学系统的光轴对称的衍射光栅。
    • 9. 发明授权
    • Diffractive lens and image pickup device using the same
    • 衍射透镜和使用其的图像拾取装置
    • US08441728B2
    • 2013-05-14
    • US13000430
    • 2009-12-18
    • Tsuguhiro KorenagaTakamasa Ando
    • Tsuguhiro KorenagaTakamasa Ando
    • G02B5/18
    • G02B13/003G02B5/1814G02B13/06G02B27/4211
    • A diffractive lens 11 that includes: a lens base 18, which has a second surface 13 with first and second groups of diffraction grating portions 20 and 21; and a protective coating 17, which is arranged on the first group of diffraction grating portions 20. The first group of diffraction grating portions 20 has a first group of diffraction steps and the second group of diffraction grating portions 21 has a second group of diffraction steps, which is lower in height than the first group of diffraction steps. One of the respective materials of the base 18 and the protective coating 17 has a higher refractive index and a greater Abbe number than the other material. And the second group of diffraction steps is not covered with the protective coating 17.
    • 衍射透镜11,其包括:透镜基部18,其具有带有第一和第二组衍射光栅部分20和21的第二表面13; 以及设置在第一组衍射光栅部分20上的保护涂层17.第一组衍射光栅部分20具有第一组衍射级,第二组衍射光栅部分21具有第二组衍射级 ,其高度比第一组衍射级高。 基部18和保护涂层17的各个材料之一具有比其他材料更高的折射率和更大的阿贝数。 第二组衍射步骤未被保护涂层17覆盖。
    • 10. 发明授权
    • Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element
    • 用于测量衍射光学元件的光学特性的方法和用于测量衍射光学元件的光学特性的装置
    • US08284388B2
    • 2012-10-09
    • US13308097
    • 2011-11-30
    • Takamasa AndoTsuguhiro Korenaga
    • Takamasa AndoTsuguhiro Korenaga
    • G01B9/00
    • G01M11/0228G02B5/189
    • A measurement method and an evaluating apparatus are provided which accurately evaluate the light amount of a spot beam, the diffraction efficiency, and the intensity distribution in the optical axis direction by detecting even a weak diffracted beam in an arbitrary wavelength range converged by a diffraction optical element as an imaging lens. Light emitted from a white light source passes through a wavelength band-pass filter and is diaphragmed by a pinhole slit. The resultant light is paralleled by a collimator lens and enters a diffraction optical element as an imaging lens. The light getting out from the diffraction optical element is converged to be a spot beam, is magnified by a microscope 18, and is then projected on a CCD. A distance changing member changes the distance between the CCD and the diffraction optical element, and then, the intensity distribution in the optical axis direction is measured.
    • 提供一种测量方法和评估装置,通过检测由衍射光学会聚的任意波长范围内的弱衍射光束,可以精确地评估光束的光量,衍射效率和光轴方向的强度分布 元素作为成像透镜。 从白色光源发射的光通过波长带通滤光器,并被针孔狭缝隔开。 所得到的光由准直透镜并联,并且作为成像透镜进入衍射光学元件。 从衍射光学元件出射的光会聚成点光束,用显微镜18放大,然后投射到CCD上。 距离改变构件改变CCD与衍射光学元件之间的距离,然后测量光轴方向上的强度分布。