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    • 1. 发明公开
    • ENHANCING VOLTMETER FUNCTIONALITY
    • 提高电压表的功能性
    • EP1203202A4
    • 2005-01-12
    • EP00948813
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/36G01R15/12G01R31/00G01R31/02G01C25/00G01R1/067G01R31/28G06F19/00
    • G01R31/024G01R1/36G01R15/125G01R31/006
    • Enhanced voltmeter leads (100A", 100B") includes load circuitry (105) having a test load (115) that can be switchably coupled between the leads (100A", 100B") to help identify faults in a circuit under test (110). In certain embodiments, the value of the test load (115) can be any appropriate value set according to parameters or characteristics of the circuit under test (110). In these embodiments, the value of the test load (115) can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads (100A", 100B") include a switch (130) whose setting is adjustable to couple and decouple the test load (115) between the leads (100A", 100B"). The switch (130) can be located in the leads (100A", 100B") or in a lead handle (100C) of the leads (100A", 100B") for easy access by a user/technician. The leads (100A", 100B") can also include a fuse (135) or circuit breaker for safety reasons. The leads (100A", 100B") can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test (110) with the switch (130) both closed and open. Conventional test leads or the leads, that include the switch (130) to couple/decouple the test load (115) can be used if the load circuitry (105) is integrated into the voltmeter (108') or if the load circuitry (105) has a separate coupling or connection to the voltmeter (108) inputs.
    • 2. 发明专利
    • Enhancing voltmeter functionality
    • AU6225500A
    • 2001-02-13
    • AU6225500
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/36G01R15/12G01R31/00G01R31/02G01C25/00G06F19/00
    • Enhanced voltmeter leads includes load circuitry having a test load that can be switchably coupled between the leads to help identify faults in a circuit under test. In certain embodiments, the value of the test load can be any appropriate value set according to parameters or characteristics of the circuit under test. In these embodiments, the value of the test load can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads include a switch whose setting is adjustable to couple and decouple the test load between the leads. The switch can be located in the leads or in a lead handle of the leads for easy access by a user/technician. The leads can also include a fuse or circuit breaker for safety reasons. The leads can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test with the switch both closed and open. Conventional test leads or the leads that include the switch to couple/decouple the test load can be used if the load circuitry is integrated into the voltmeter or if the load circuitry has a separate coupling or connection to the voltmeter inputs.
    • 3. 发明专利
    • DE60027010D1
    • 2006-05-18
    • DE60027010
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/067G01R1/36G01R15/12G01R31/00G01R31/02G01R31/28
    • Enhanced voltmeter leads includes load circuitry having a test load that can be switchably coupled between the leads to help identify faults in a circuit under test. In certain embodiments, the value of the test load can be any appropriate value set according to parameters or characteristics of the circuit under test. In these embodiments, the value of the test load can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads include a switch whose setting is adjustable to couple and decouple the test load between the leads. The switch can be located in the leads or in a lead handle of the leads for easy access by a user/technician. The leads can also include a fuse or circuit breaker for safety reasons. The leads can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test with the switch both closed and open. Conventional test leads or the leads that include the switch to couple/decouple the test load can be used if the load circuitry is integrated into the voltmeter or if the load circuitry has a separate coupling or connection to the voltmeter inputs.
    • 4. 发明专利
    • DE60027010T2
    • 2007-06-14
    • DE60027010
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/067G01R1/36G01R15/12G01R31/00G01R31/02G01R31/28
    • Enhanced voltmeter leads includes load circuitry having a test load that can be switchably coupled between the leads to help identify faults in a circuit under test. In certain embodiments, the value of the test load can be any appropriate value set according to parameters or characteristics of the circuit under test. In these embodiments, the value of the test load can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads include a switch whose setting is adjustable to couple and decouple the test load between the leads. The switch can be located in the leads or in a lead handle of the leads for easy access by a user/technician. The leads can also include a fuse or circuit breaker for safety reasons. The leads can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test with the switch both closed and open. Conventional test leads or the leads that include the switch to couple/decouple the test load can be used if the load circuitry is integrated into the voltmeter or if the load circuitry has a separate coupling or connection to the voltmeter inputs.
    • 5. 发明专利
    • AT322021T
    • 2006-04-15
    • AT00948813
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/36G01R15/12G01R31/00G01R31/02G01R1/067G01R31/28
    • Enhanced voltmeter leads includes load circuitry having a test load that can be switchably coupled between the leads to help identify faults in a circuit under test. In certain embodiments, the value of the test load can be any appropriate value set according to parameters or characteristics of the circuit under test. In these embodiments, the value of the test load can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads include a switch whose setting is adjustable to couple and decouple the test load between the leads. The switch can be located in the leads or in a lead handle of the leads for easy access by a user/technician. The leads can also include a fuse or circuit breaker for safety reasons. The leads can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test with the switch both closed and open. Conventional test leads or the leads that include the switch to couple/decouple the test load can be used if the load circuitry is integrated into the voltmeter or if the load circuitry has a separate coupling or connection to the voltmeter inputs.
    • 6. 发明专利
    • ENHANCING VOLTMETER FUNCTIONALITY
    • CA2380267A1
    • 2001-02-01
    • CA2380267
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/36G01R15/12G01R31/00G01R31/02G01R31/28G01R19/00
    • Enhanced voltmeter leads (100A", 100B") includes load circuitry (105) having a test load (115) that can be switchably coupled between the leads (100A", 100B") to help identify faults in a circuit under test (110). In certain embodiments, the value of the test load (115) can be any appropriate value s et according to parameters or characteristics of the circuit under test (110). In these embodiments, the value of the test load (115) can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. T he leads (100A", 100B") include a switch (130) whose setting is adjustable to couple and decouple the test load (115) between the leads (100A", 100B"). Th e switch (130) can be located in the leads (100A", 100B") or in a lead handle (100C) of the leads (100A", 100B") for easy access by a user/technician. The leads (100A", 100B") can also include a fuse (135) or circuit breaker for safety reasons. The leads (100A", 100B") can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test (110) with the switch (130) both closed and open. Conventional test leads or the leads, that include the switch (130) to couple/decouple the test load (115) can be used if the load circuitry (105) is integrated into the voltmeter (108') or if the load circuitry (105) has a separate coupling or connection to the voltmeter (108) inputs.
    • 7. 发明申请
    • ENHANCING VOLTMETER FUNCTIONALITY
    • 增强电压功能
    • WO0107871A9
    • 2002-09-06
    • PCT/US0019759
    • 2000-07-21
    • SULLIVAN DANIEL BARBER
    • SULLIVAN DANIEL BARBER
    • G01R1/36G01R15/12G01R31/00G01R31/02G01C25/00G06F19/00
    • G01R31/024G01R1/36G01R15/125G01R31/006
    • Enhanced voltmeter leads (100A", 100B") includes load circuitry (105) having a test load (115) that can be switchably coupled between the leads (100A", 100B") to help identify faults in a circuit under test (110). In certain embodiments, the value of the test load (115) can be any appropriate value set according to parameters or characteristics of the circuit under test (110). In these embodiments, the value of the test load (115) can be set manually or automatically or both. The types of faults that can be identified include a short-to-ground, an open circuit, and a high (e.g., corrosive) resistance. The leads (100A", 100B") include a switch (130) whose setting is adjustable to couple and decouple the test load (115) between the leads (100A", 100B"). The switch (130) can be located in the leads (100A", 100B") or in a lead handle (100C) of the leads (100A", 100B") for easy access by a user/technician. The leads (100A", 100B") can also include a fuse (135) or circuit breaker for safety reasons. The leads (100A", 100B") can be used systematically to help identify the type and location of a fault from voltage readings. The voltage readings are obtained at various points in the circuit under test (110) with the switch (130) both closed and open. Conventional test leads or the leads, that include the switch (130) to couple/decouple the test load (115) can be used if the load circuitry (105) is integrated into the voltmeter (108') or if the load circuitry (105) has a separate coupling or connection to the voltmeter (108) inputs.
    • 增强的电压表引线(100A“,100B”)包括负载电路(105),其具有能够切换地耦合在引线(100A“,100B”)之间的测试负载(115),以帮助识别被测电路(110)中的故障, 。 在某些实施例中,测试负载(115)的值可以是根据被测电路(110)的参数或特性设置的任何适当值。 在这些实施例中,测试负载(115)的值可以手动设置或自动设置,也可以两者设定。 可以识别的故障类型包括短路对接,开路和高(例如腐蚀性)电阻。 引线(100A“,100B”)包括开关(130),其开关可设置为在引线(100A“,100B”)之间耦合和分离测试负载(115)。 开关(130)可以位于引线(100A“,100B”)的引线(100A“,100B”)或引线手柄(100C)中,以便用户/技术人员方便地访问。 出于安全原因,引线(100A“,100B”)还可以包括保险丝(135)或断路器。 引线(100A“,100B”)可以系统地使用,以帮助从电压读数识别故障的类型和位置。 电压读数在被测电路(110)中的各个点处获得,开关(130)都闭合并打开。 如果负载电路(105)集成到电压表(108')中,或者如果负载电路(105)是负载电路(105),那么可以使用传统的测试引线或引线,包括用于耦合/去耦测试负载(115)的开关(130) )具有与电压表(108)输入的单独耦合或连接。