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    • 1. 发明申请
    • IMPROVED IMAGE SENSOR ARRANGEMENT
    • 改进的图像传感器布置
    • WO2012080732A1
    • 2012-06-21
    • PCT/GB2011/052478
    • 2011-12-14
    • STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITEDSTORM, GraemePURCELL, MatthewTOLMIE, DerekMOORE, John KevinWIGLEY, Michael
    • STORM, GraemePURCELL, MatthewTOLMIE, DerekMOORE, John KevinWIGLEY, Michael
    • H04N5/378H04N5/363H04N5/347
    • H04N5/378H04N5/347H04N5/363
    • Disclosed is an image sensor comprising: a plurality of pixels arranged in rows and columns to form a pixel array, each pixel column comprising at least two column bitlines, such that an output of each pixel is connected to one of the column bitlines of the column of which it is comprised; a readout input circuit comprising a plurality of first inputs and a second input, each of the first inputs and the second input being connected via a capacitance to a single comparator input node; and a readout comparator circuit connected to the single comparator input node. Each of the first inputs receives, in parallel, an analogue signal, the analogue signals being acquired from the signal output of one or more of the pixels via the column bitline to which the pixel is connected, the analogue signals varying during a pixel readout period and having a first level during a first calibration period and a second level during a second read period. The analogue signals at the first inputs and a reference signal from a time varying reference circuit on the second input are constantly read onto their respective capacitances during both the first calibration period and the second read period. The readout comparator circuit compares an average of the signals on each of the plurality of first inputs to the reference signal.
    • 公开了一种图像传感器,包括:排列成行和列以形成像素阵列的多个像素,每个像素列包括至少两列列位线,使得每个像素的输出连接到列的列位线之一 它包括在内; 读出输入电路,包括多个第一输入和第二输入,所述第一输入和所述第二输入中的每一个经由电容连接到单个比较器输入节点; 以及连接到单个比较器输入节点的读出比较器电路。 每个第一输入并行地接收模拟信号,模拟信号是通过与像素连接的列位线从一个或多个像素的信号输出中获取的,模拟信号在像素读出期间变化 并且在第一读取周期期间在第一校准周期期间具有第一电平和第二电平。 第一输入处的模拟信号和来自第二输入端的时变参考电路的参考信号在第一校准周期和第二读取周期期间都恒定地读取到它们各自的电容上。 读出比较器电路将多个第一输入中的每一个上的信号的平均值与参考信号进行比较。