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    • 1. 发明申请
    • SAMPLING CIRCUIT WITH OVERVOLTAGE PROTECTION
    • 采用过电压保护的采样电路
    • WO2015101563A1
    • 2015-07-09
    • PCT/EP2014/079204
    • 2014-12-23
    • SIEMENS AKTIENGESELLSCHAFT
    • CUI, Yi Tian
    • H02H9/04
    • H02H9/046
    • The present application relates to a sampling circuit for an electronic transformer (CT), wherein the electronic transformer has first (12) and second (14) output terminals. The sampling circuit includes a differential sampling chip (IC), a first division resistor (R1), a first voltage clamping device (Z1) and a second voltage clamping device (Z2). The differential sampling chip (IC) has a positive input terminal (IN+) and a negative input terminal (IN-). One end of the first division resistor (R1) is connected to the first output terminal (12), and the other end thereof is connected to the positive input terminal (IN+). The anode of the first voltage clamping device (Z1) is connected to the positive input terminal (IN+). The cathode of the second voltage clamping device (Z2) is connected to the cathode of the first voltage clamping device (Z1), and the anode of the second voltage clamping device (Z2) is connected to the negative input terminal (IN-). As a signal input to the differential sampling chip (IC) is a differential signal, the influence of electromagnetic interference on the signal input to the differential sampling chip can be effectively reduced.
    • 本申请涉及一种用于电子变压器(CT)的采样电路,其中电子变压器具有第一(12)和第二(14)个输出端子。 采样电路包括差分采样芯片(IC),第一除法电阻器(R1),第一电压钳位装置(Z1)和第二电压钳位装置(Z2)。 差分采样芯片(IC)具有正输入端(IN +)和负输入端(IN-)。 第一除法电阻器(R1)的一端连接到第一输出端子(12),另一端连接到正输入端子(IN +)。 第一钳位装置(Z1)的阳极连接到正输入端子(IN +)。 第二电压钳位装置(Z2)的阴极连接到第一钳位装置(Z1)的阴极,第二钳位装置(Z2)的负极连接到负输入端子(IN-)。 由于差分采样芯片(IC)的信号输入是差分信号,所以可以有效降低电磁干扰对差分采样芯片输入信号的影响。