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    • 3. 发明公开
    • Socket for inspection of semiconductor device
    • Testhalterfüreine Halbleitervorrichtung
    • EP0922964A1
    • 1999-06-16
    • EP97121732.8
    • 1997-12-10
    • SHIN-ETSU POLYMER CO., LTD.
    • Yamazaki, Kouichi, c/o Shinano Polymer Co., Ltd.Komatsu, Hiroto, c/o Shin-Etsu Polymer Co., Ltd.
    • G01R31/28
    • G01R1/0433H01L2924/0002H01L2924/00
    • Proposed is a socket for inspection of semiconductor devices having laterally extended leads by mounting the device in the mounting seat of the socket body, by means of which the productivity of the inspection process can be greatly improved because troublesome steps such as soldering can be omitted. The socket comprises:

      (a) a socket body (30) mountable on the circuit board (20) positioning having a mounting seat (31) for the body of the semiconductor device in a freely demountable fashion;
      (b) a lead frame (40) intervening between the socket body and the circuit board having resilient contacting shoes (42) extended out of the surface facing the circuit board in the mounting seat of the socket body, the contacting shoes being brought into contact, when the semiconductor device is mounted on the mounting seat, with the leads of the semiconductor device; and
      (c) an anisotropically electroconductive elastic connector sheet (50) interposed between the lead frame and the circuit board to be in contact with the electrode terminals of the circuit board on one surface and with the contacting points of the contacting shoes of the lead frame on the other surface.
    • 提出了一种用于通过将装置安装在插座主体的安装座中来检查具有横向延伸的引线的半导体器件的插座,由此可以省略诸如焊接的麻烦的步骤,从而可以大大提高检查过程的生产率。 插座包括:(a)可安装在电路板(20)上的插座主体(30),其以可自由拆卸的方式定位成具有用于半导体器件主体的安装座(31); (b)介于插座主体和电路板之间的引线框架(40),其具有从插座主体的安装座中的面向电路板的表面延伸出的弹性接触鞋(42),使接触鞋接触 当半导体器件与半导体器件的引线安装在安装座上时; 以及(c)插入在引线框架和电路板之间的各向异性导电弹性连接片(50),以在一个表面上与电路板的电极端子接触,并且引线框架的接触焊盘的接触点 在另一个表面。