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1. 发明公开

EP2720281A4 PHOTODIODE, METHOD FOR MANUFACTURING SAME, PHOTODIODE ARRAY, SPECTROPHOTOMETER, AND DEVICE FOR IMAGING SOLIDS 有权转让
标题翻译：光电二极管，其制造方法，光电二极管阵列，分光光度计和用于成像固体的装置
公开(公告)号：EP2720281A4
公开(公告)日：2014-10-22
申请号：EP12796420
申请日：2012-06-04
申请人： UNIV TOHOKU , SHIMADZU CORP
发明人： SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： H01L31/10 , G01J3/36 , H01L27/146 , H01L31/0236 , H01L31/06 , H01L31/18
CPC分类号： G01J3/2803 , G01J3/2823 , G01J2003/2813 , H01L27/1446 , H01L27/14601 , H01L27/14609 , H01L27/14643 , H01L31/02363 , H01L31/06 , H01L31/103 , H01L31/18 , H01L31/1804 , H01L31/1864 , Y02E10/50 , Y02E10/547 , Y02P70/521

2. 发明公开

EP2911384A4 LINEAR IMAGE SENSOR AND DRIVING METHOD THEREFOR 审中-公开
标题翻译：线性图像传感器及其方法控制
公开(公告)号：EP2911384A4
公开(公告)日：2015-11-04
申请号：EP13851721
申请日：2013-10-28
申请人： SHIMADZU CORP , UNIV TOHOKU
发明人： TOMINAGA HIDEKI , HIROSE RYUTA , TAKUBO KENJI , SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： H04N5/369 , H01L27/146 , H04N5/374
CPC分类号： H04N5/378 , H01L27/14609 , H04N5/3692 , H04N5/3742 , H04N5/3765

3. 发明公开

EP2833106A4 PHOTODIODE ARRAY FOR SPECTROSCOPIC MEASUREMENT, AND SPECTROSCOPIC MEASUREMENT APPARATUS 无效
标题翻译：光二极管阵列，用于光谱测量光谱测量和设备
公开(公告)号：EP2833106A4
公开(公告)日：2015-04-22
申请号：EP13767497
申请日：2013-03-26
申请人： SHIMADZU CORP , UNIV TOHOKU
发明人： TOMINAGA HIDEKI , HIROSE RYUTA , TAKUBO KENJI , SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： G01J3/36 , G01J3/28 , G02B1/11
CPC分类号： G01J3/2803 , G01J3/0213 , G01J3/0229 , G01J2003/123 , G01J2003/1234 , G01J2003/2806 , G02B1/116 , H01L27/1462 , H01L27/14643
摘要： A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure (the material and/or thickness of the coating) of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO 2 coating layer (104) on the silicon substrate (102) and an Al 2 O 3 coating layer (105) are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance (the rate at which incident light reaches a photoelectric conversion region) can be improved while making the best efforts to avoid a complex manufacturing process. As a result, high levels of sensitivity can be achieved without omission even within the ultraviolet wavelength region in a spectrometric measurement system using a photodiode array detector.

4. 发明专利

SG11201701014VA CONCENTRATION MEASURING METHOD 未知
公开(公告)号：SG11201701014VA
公开(公告)日：2017-04-27
申请号：SG11201701014V
申请日：2015-08-24
申请人： UNIV TOHOKU
发明人： SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： G01N21/61 , G01N21/27
摘要： To provide a concentration measuring method with which the concentration of a predetermined chemical component can be accurately, quickly, and nondestructively measured down to a concentration range of an extremely small amount with a simple means, and to provide a concentration measuring method with which the concentration of a chemical component in an object to be measured can be accurately and quickly measured down to a concentration range of a nano-order extremely small amount in real time, the method having universality, i.e., the ability to be embodied in various forms and modes. Light having a first wavelength and light having a second wavelength, which have different light absorptances with respect to an object to be measured, are each radiated onto the object to be measured using a time-sharing method; the light having the first wavelength and the light having the second wavelength, optically passing through the object to be measured as a result of the irradiation with the light having the first and second wavelengths, are received with a common light receiving sensor; a differential signal between a signal related to the light having the first wavelength and a signal related to the light having the second wavelength to be output from the light receiving sensor according to the received light is formed; and the concentration of a chemical component in the object to be measured is derived on the basis of the differential signal.

5. 发明专利

SG11201703289YA OPTICAL GAS CONCENTRATION MEASURING METHOD, AND METHOD FOR MONITORING GAS CONCENTRATION BY SAID METHOD 未知
公开(公告)号：SG11201703289YA
公开(公告)日：2017-06-29
申请号：SG11201703289Y
申请日：2015-11-20
申请人： FUJIKIN KK , UNIV TOHOKU
发明人： NAGASE MASAAKI , NISHINO KOJI , IKEDA SHINICHI , YAMAJI MICHIO , SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： C23C16/52 , G01N21/27 , G01N21/33 , H01L21/205
摘要： To provide a concentration measurement method with which the concentrations of predetermined chemical components can be measured non-destructively, accurately, and rapidly by a simple means, up to the concentrations in trace amount ranges, as well as a concentration measurement method with which the concentrations of chemical components in a measurement target can be accurately and rapidly measured in real time up to the concentrations in nano-order trace amount ranges, and which is endowed with a versatility that can be realized in a variety of embodiments and modes. [Solution] In the present invention, a measurement target is irradiated, in a time sharing manner, with light of a first wavelength and light of a second wavelength that have different optical absorption rates with respect to the measurement target. The light of each wavelength, arriving optically via the measurement target as a result of irradiation with the light of each wavelength, is received at a shared light-receiving sensor. A differential signal is formed, the differential signal being of a signal pertaining to the light of the first wavelength and a signal pertaining to the light of the second wavelength, the signals outputted from the light-receiving sensor upon receipt of the light. The concentration of a chemical component in the measurement target is derived on the basis of the differential signal.

6. 发明专利

SG11201701015QA OPTICAL CONCENTRATION MEASURING METHOD 未知
公开(公告)号：SG11201701015QA
公开(公告)日：2017-03-30
申请号：SG11201701015Q
申请日：2015-02-23
申请人： UNIV TOHOKU
发明人： SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： G01N21/27
摘要： To provide a concentration measuring method with which the concentration of a predetermined chemical component can be accurately, quickly, and nondestructively measured down to a concentration range of an extremely small amount with a simple means, and to provide a concentration measuring method with which the concentration of a chemical component in an object to be measured can be accurately and quickly measured down to a concentration range of a nano-order extremely small amount in real time, the method having universality, i.e., the ability to be embodied in various forms and modes. Light having a first wavelength and light having a second wavelength, which have different light absorptances with respect to an object to be measured, are each radiated onto the object to be measured using a time-sharing method; the light having the first wavelength and the light having the second wavelength, optically passing through the object to be measured as a result of the irradiation with the light having the first and second wavelengths, are received with a common light receiving sensor; a differential signal between a signal related to the light having the first wavelength and a signal related to the light having the second wavelength to be output from the light receiving sensor according to the received light is formed; and the concentration of a chemical component in the object to be measured is derived on the basis of the differential signal.

7. 发明公开

EP3222995A4 OPTICAL GAS CONCENTRATION MEASUREMENT METHOD, AND METHOD FOR MONITORING GAS CONCENTRATION BY SUCH METHOD 有权
公开(公告)号：EP3222995A4
公开(公告)日：2018-06-06
申请号：EP15860939
申请日：2015-11-20
申请人： FUJIKIN KK , UNIV TOHOKU
发明人： NAGASE MASAAKI , NISHINO KOUJI , IKEDA NOBUKAZU , YAMAJI MICHIO , SUGAWA SHIGETOSHI , KURODA RIHITO
IPC分类号： G01N21/31 , C23C16/18 , C23C16/52 , G01N33/00 , H01L21/205
CPC分类号： G01N21/27 , C23C16/18 , C23C16/52 , G01N21/314 , G01N21/3151 , G01N21/33 , G01N33/0027 , G01N2021/3155 , G01N2021/3159 , G01N2021/3181 , G01N2201/0627 , G01N2201/0696 , G01N2201/12 , H01L21/205
摘要： To provide a concentration measurement method with which the concentrations of predetermined chemical components can be measured non-destructively, accurately, and rapidly by a simple means, up to the concentrations in trace amount ranges, as well as a concentration measurement method with which the concentrations of chemical components in a measurement target can be accurately and rapidly measured in real time up to the concentrations in nano-order trace amount ranges, and which is endowed with a versatility that can be realized in a variety of embodiments and modes. [Solution] In the present invention, a measurement target is irradiated, in a time sharing manner, with light of a first wavelength and light of a second wavelength that have different optical absorption rates with respect to the measurement target. The light of each wavelength, arriving optically via the measurement target as a result of irradiation with the light of each wavelength, is received at a shared light-receiving sensor. A differential signal is formed, the differential signal being of a signal pertaining to the light of the first wavelength and a signal pertaining to the light of the second wavelength, the signals outputted from the light-receiving sensor upon receipt of the light. The concentration of a chemical component in the measurement target is derived on the basis of the differential signal.

8. 发明公开

EP2197023A4 SEMICONDUCTOR SUBSTRATE AND SEMICONDUCTOR DEVICE 审中-公开
标题翻译：半导体基板及半导体装置
公开(公告)号：EP2197023A4
公开(公告)日：2013-05-22
申请号：EP08835197
申请日：2008-10-06
申请人： UNIV TOHOKU NAT UNIV CORP , SHINETSU HANDOTAI KK
发明人： OHMI TADAHIRO , TERAMOTO AKINOBU , SUWA TOMOYUKI , KURODA RIHITO , KUDO HIDEO , HAYAMI YOSHINORI
IPC分类号： H01L21/02 , H01L21/324 , H01L29/04 , H01L29/78
CPC分类号： H01L29/045 , H01L21/02381 , H01L21/02433 , H01L29/78
摘要： On a surface of a semiconductor substrate, a plurality of terraces formed stepwise by an atomic step are formed in the substantially same direction. Using the semiconductor substrate, a MOS transistor is formed so that no step exists in a carrier traveling direction (source-drain direction).

9. 发明公开

EP2043159A4 TRANSISTOR AND SEMICONDUCTOR DEVICE 审中-公开
标题翻译：晶体管及半导体元件
公开(公告)号：EP2043159A4
公开(公告)日：2011-05-18
申请号：EP07790721
申请日：2007-07-12
申请人： UNIV TOHOKU NAT UNIV CORP , FOUND ADVANCEMENT INT SCIENCE
发明人： OHMI TADAHIRO , TERAMOTO AKINOBU , KURODA RIHITO
IPC分类号： H01L29/786 , H01L21/28 , H01L21/8238 , H01L27/08 , H01L27/092 , H01L29/417
CPC分类号： H01L27/1203 , H01L21/28202 , H01L29/518 , H01L29/78654 , H01L29/78696

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