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    • 1. 发明专利
    • TEST EQUIPMENT
    • JP2006226684A
    • 2006-08-31
    • JP2005037163
    • 2005-02-15
    • SHIBASOKU CO LTD
    • YAMAZAKI MITSUONISHINO KENJIRO
    • G01R31/28G01R31/26
    • PROBLEM TO BE SOLVED: To further shorten the test time as compared to before on integrated circuits of multipin output which operate on a high voltage, such as a driver IC for PDP. SOLUTION: This test equipment is provided with a plurality of measuring module multiplex board 11 for outputting DC power for each pin of an object to be tested 5, and a plurality of high-voltage measuring module 6 for measuring at least the voltage of the DC power impressed on each pin via each measuring module multiplex board 11. By using them, simultaneously and in parallel, it tests the characteristics of each pin. Each measuring module multiplex board 11 is provided with an instantaneous overcurrent protection circuit 14 for making a load current flow through a DC circuit of a MOSFET and a current detection circuit, making a bipolar transistor operate in an ON-state at the current detection circuit by the increase of the load current, and raising a bias voltage of the MOSFET. COPYRIGHT: (C)2006,JPO&NCIPI