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    • 3. 发明申请
    • MEMORY DEVICE AND METHODS THEREOF
    • 存储器件及其方法
    • US20100260001A1
    • 2010-10-14
    • US12422448
    • 2009-04-13
    • Keith KasprakRussell Schreiber
    • Keith KasprakRussell Schreiber
    • G11C29/00G11C7/00G11C17/16
    • G11C11/413G11C11/412G11C29/50G11C29/50012
    • A device includes a memory configured so that, in the event that one pass-gate transistor associated with a bit cell is determined to be excessively weak such that reading the bit cell could be undesirably difficult, a second pass-gate transistor can be configured to support a read operation. For example, during a manufacturing test procedure, the access speed of each bit cell at a memory device is determined. If a bit cell fails to achieve a desired access speed, the column of the memory that includes the defective bit cell can be configured to access information stored at the bit cell using the second bit line associated with the second pass-gate transistor.
    • 一种器件包括存储器,其被配置为使得在与比特单元相关联的一个通过栅极晶体管被确定为过弱的情况下,使得读取该位单元可能是不期望的困难的,第二通过栅极晶体管可被配置为 支持读操作。 例如,在制造测试过程中,确定存储器件处的每个位单元的存取速度。 如果位单元不能达到期望的访问速度,则包括有缺陷位单元的存储器列可被配置为使用与第二通过栅极晶体管相关联的第二位线访问存储在位单元处的信息。
    • 4. 发明授权
    • Memory device and methods thereof
    • 存储器件及其方法
    • US07961536B2
    • 2011-06-14
    • US12422448
    • 2009-04-13
    • Keith KasprakRussell Schreiber
    • Keith KasprakRussell Schreiber
    • G11C29/00
    • G11C11/413G11C11/412G11C29/50G11C29/50012
    • A device includes a memory configured so that, in the event that one pass-gate transistor associated with a bit cell is determined to be excessively weak such that reading the bit cell could be undesirably difficult, a second pass-gate transistor can be configured to support a read operation. For example, during a manufacturing test procedure, the access speed of each bit cell at a memory device is determined. If a bit cell fails to achieve a desired access speed, the column of the memory that includes the defective bit cell can be configured to access information stored at the bit cell using the second bit line associated with the second pass-gate transistor.
    • 一种器件包括存储器,其被配置为使得在与比特单元相关联的一个通过栅极晶体管被确定为过弱的情况下,使得读取该位单元可能是不期望的困难的,第二通过栅极晶体管可被配置为 支持读操作。 例如,在制造测试过程中,确定存储器件处的每个位单元的存取速度。 如果位单元不能达到期望的访问速度,则包括有缺陷位单元的存储器列可被配置为使用与第二通过栅极晶体管相关联的第二位线访问存储在位单元处的信息。