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1. 发明授权

US08935582B2 Generating test sets for diagnosing scan chain failures 有权
标题翻译：生成用于诊断扫描链故障的测试集
公开(公告)号：US08935582B2
公开(公告)日：2015-01-13
申请号：US13460407
申请日：2012-04-30
申请人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
发明人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
IPC分类号： G01R31/28 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318525 , G01R31/31853 , G01R31/318533 , G01R31/318544 , G01R31/318569
摘要： Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.
摘要翻译：所公开的技术的实施例包括可用于改进扫描链测试模式生成和扫描链故障诊断解析的基于软件的技术。例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。这样的实施例可用于产生“完整”测试集，即，能够将故障扫描链中的任何扫描链缺陷分离到单个扫描单元的一组链诊断测试模式。

2. 发明授权

US08615695B2 Fault dictionary-based scan chain failure diagnosis 有权
标题翻译：基于故障字典的扫描链故障诊断
公开(公告)号：US08615695B2
公开(公告)日：2013-12-24
申请号：US11818440
申请日：2007-06-13
申请人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
发明人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/3177 , G01R31/318525 , G01R31/318541
摘要： A dictionary-based scan chain fault detector includes a dictionary with fault signatures computed for scan cells in the scan chain. Entries in the fault dictionary are compared with failures in the failure log to identify a faulty scan cell. In one embodiment a single fault in a scan chain is identified. In another embodiment, a last fault and a first fault in a scan chain are identified.
摘要翻译：基于字典的扫描链故障检测器包括为扫描链中的扫描单元计算的具有故障签名的字典。将故障字典中的条目与故障日志中的故障进行比较，以识别故障扫描单元。在一个实施例中，识别扫描链中的单个故障。在另一个实施例中，识别扫描链中的最后故障和第一故障。

3. 发明授权

US09086459B2 Detection and diagnosis of scan cell internal defects 有权
标题翻译：检测和诊断扫描单元内部缺陷
公开(公告)号：US09086459B2
公开(公告)日：2015-07-21
申请号：US12918986
申请日：2009-02-23
申请人： Ruifeng Guo , Liyang Lai , Yu Huang , Wu-Tung Cheng
发明人： Ruifeng Guo , Liyang Lai , Yu Huang , Wu-Tung Cheng
IPC分类号： G01R31/28 , G01R31/3185 , G01R35/00
CPC分类号： G01R31/318583 , G01R31/318541 , G01R35/00
摘要： A diagnosis technique to improve scan cell internal defect diagnostic resolution using scan cell internal fault models.
摘要翻译：使用扫描单元内部故障模型提高扫描单元内部缺陷诊断分辨率的诊断技术。

4. 发明授权

US08261142B2 Generating test sets for diagnosing scan chain failures 有权
标题翻译：生成用于诊断扫描链失败的测试集
公开(公告)号：US08261142B2
公开(公告)日：2012-09-04
申请号：US12074162
申请日：2008-02-29
申请人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
发明人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318525 , G01R31/31853 , G01R31/318533 , G01R31/318544 , G01R31/318569
摘要： Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.
摘要翻译：所公开技术的实施例包括可用于改进扫描链测试模式生成和扫描链故障诊断解析的基于软件的技术。例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。这样的实施例可以用于产生“完整”测试集，即，能够将故障扫描链中的任何扫描链缺陷分离到单个扫描单元的一组链诊断测试模式。

5. 发明授权

US07788561B2 Diagnosing mixed scan chain and system logic defects 有权
标题翻译：诊断混合扫描链和系统逻辑缺陷
公开(公告)号：US07788561B2
公开(公告)日：2010-08-31
申请号：US11838858
申请日：2007-08-14
申请人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo
发明人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo
IPC分类号： G01R31/28
CPC分类号： G01R31/318569
摘要： Technologies disclosed herein can be used to diagnose defects on die having both scan chain and system logic defects, including in situations where the presence of one or more faults in the system logic potentially obscures the detectability of one or more faults in the scan chains (or channels) and vice versa. At least some embodiments employ an iterative approach where at least some scan chain faults are identified, these chain faults are used to identify system logic faults, and then additional chain faults are identified using the system logic faults and vice versa. Failing bits can be partitioned into at least two groups: failing bits determined as being caused by system logic failures, and failing bits determined as being possibly caused by chain defects, system logic defects, or the compound effects of both types of defects.
摘要翻译：本文公开的技术可用于诊断具有扫描链和系统逻辑缺陷的裸片上的缺陷，包括在系统逻辑中存在一个或多个故障潜在地掩盖扫描链中的一个或多个故障的可检测性的情况下（或频道），反之亦然。至少一些实施例采用迭代方法，其中识别出至少一些扫描链故障，这些链故障用于识别系统逻辑故障，然后使用系统逻辑故障来识别附加链故障，反之亦然。失败的位可被划分为至少两组：确定为由系统逻辑故障引起的故障位，以及确定为可能由链缺陷，系统逻辑缺陷或两种类型的缺陷的复合效应引起的故障位。

6. 发明申请

US20090235134A1 TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES 有权
标题翻译：用于诊断扫描链失败的测试图形生成
公开(公告)号：US20090235134A1
公开(公告)日：2009-09-17
申请号：US12471227
申请日：2009-05-22
申请人： Ruifeng Guo , Wu-Tung Cheng , Yu Huang
发明人： Ruifeng Guo , Wu-Tung Cheng , Yu Huang
IPC分类号： G01R31/3177 , G06F11/25 , G06F15/16
CPC分类号： G01R31/318544
摘要： Embodiments of the disclosed technology comprise techniques that can be used to generate scan chain test patterns and improve scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. At least some embodiments can be used to locate faults over multiple capture cycles in the scan chain.
摘要翻译：所公开技术的实施例包括可用于产生扫描链测试模式并提高扫描链故障诊断分辨率的技术。例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。至少一些实施例可用于在扫描链中的多个捕获周期上定位故障。

7. 发明申请

US20080215943A1 Generating test sets for diagnosing scan chain failures 有权
标题翻译：生成用于诊断扫描链故障的测试集
公开(公告)号：US20080215943A1
公开(公告)日：2008-09-04
申请号：US12074162
申请日：2008-02-29
申请人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
发明人： Ruifeng Guo , Yu Huang , Wu-Tung Cheng
IPC分类号： G01R31/28
CPC分类号： G01R31/3177 , G01R31/318525 , G01R31/31853 , G01R31/318533 , G01R31/318544 , G01R31/318569
摘要： Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.
摘要翻译：所公开的技术的实施例包括可用于改进扫描链测试模式生成和扫描链故障诊断解析的基于软件的技术。例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。这样的实施例可用于产生“完整”测试集，即，能够将故障扫描链中的任何扫描链缺陷分离到单个扫描单元的一组链诊断测试模式。

8. 发明授权

US09222978B2 Two-dimensional scan architecture 有权
标题翻译：二维扫描架构
公开(公告)号：US09222978B2
公开(公告)日：2015-12-29
申请号：US13416912
申请日：2012-03-09
申请人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
发明人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
IPC分类号： G01R31/28 , G01R31/3185
CPC分类号： G01R31/318536 , G01R31/318544
摘要： Aspects of the invention relate to techniques of using two-dimensional scan architecture for testing and diagnosis. A two-dimensional scan cell network may be constructed by coupling input for each scan cell to outputs for two or more other scan cells and/or primary inputs through a multiplexer. To test and diagnose the two-dimensional scan cell network, the two-dimensional scan cell network may be loaded with chain patterns and unloaded with corresponding chain test data along two or more sets of scan paths. Based on the chain test data, one or more defective scan cells or defective scan cell candidates may be determined.
摘要翻译：本发明的方面涉及使用二维扫描结构进行测试和诊断的技术。可以通过将每个扫描单元的输入耦合到通过多路复用器的两个或更多个其它扫描单元和/或主要输入的输出来构造二维扫描单元网络。为了测试和诊断二维扫描单元网络，二维扫描单元网络可以加载链模式并且沿着两组或更多组扫描路径卸载相应的链测试数据。基于链测试数据，可以确定一个或多个有缺陷的扫描单元或有缺陷的扫描单元候选。

9. 发明授权

US08689070B2 Method and system for scan chain diagnosis 有权
标题翻译：扫描链诊断方法与系统
公开(公告)号：US08689070B2
公开(公告)日：2014-04-01
申请号：US12781695
申请日：2010-05-17
申请人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Ting-Pu Tai
发明人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Ting-Pu Tai
IPC分类号： G06F11/00
CPC分类号： G01R31/318544 , G01R31/318547 , G06F11/2215
摘要： Scan chain diagnosis techniques are disclosed. Faulty scan chains are modeled and scan patterns are masked to filter out loading-caused failures. By simulating the masked scan patterns, failing probabilities are determined for cells on a faulty scan chain. One or more defective cells are identified based upon the failing probability information. A noise filtering system such as the one based upon adaptive feedback may be adopted for the identification process.
摘要翻译：公开扫描链诊断技术。对扫描链进行建模和扫描模式被屏蔽，以过滤掉加载引起的故障。通过模拟掩蔽的扫描模式，确定故障扫描链上的单元的故障概率。基于故障概率信息来识别一个或多个有缺陷的小区。可以采用诸如基于自适应反馈的噪声滤波系统来进行识别处理。

10. 发明申请

US20120233512A1 Two-Dimensional Scan Architecture 有权
标题翻译：二维扫描架构
公开(公告)号：US20120233512A1
公开(公告)日：2012-09-13
申请号：US13416912
申请日：2012-03-09
申请人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
发明人： Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318536 , G01R31/318544
摘要： Aspects of the invention relate to techniques of using two-dimensional scan architecture for testing and diagnosis. A two-dimensional scan cell network may be constructed by coupling input for each scan cell to outputs for two or more other scan cells and/or primary inputs through a multiplexer. To test and diagnose the two-dimensional scan cell network, the two-dimensional scan cell network may be loaded with chain patterns and unloaded with corresponding chain test data along two or more sets of scan paths. Based on the chain test data, one or more defective scan cells or defective scan cell candidates may be determined.
摘要翻译：本发明的方面涉及使用二维扫描结构进行测试和诊断的技术。可以通过将每个扫描单元的输入耦合到通过多路复用器的两个或更多个其它扫描单元和/或主要输入的输出来构造二维扫描单元网络。为了测试和诊断二维扫描单元网络，二维扫描单元网络可以加载链模式并且沿着两组或更多组扫描路径卸载相应的链测试数据。基于链测试数据，可以确定一个或多个有缺陷的扫描单元或有缺陷的扫描单元候选。

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