专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20130217199A1 METHOD FOR FABRICATING RESISTIVE MEMORY DEVICE 审中-公开
标题翻译：用于制造电阻式存储器件的方法
公开(公告)号：US20130217199A1
公开(公告)日：2013-08-22
申请号：US13580952
申请日：2012-04-16
申请人： Ru Huang , Shenghu Tan , Lijie Zhang , Yue Pan , Yinglong Huang , Gengyu Yang , Yu Tang , Jun Mao , Yimao Cai
发明人： Ru Huang , Shenghu Tan , Lijie Zhang , Yue Pan , Yinglong Huang , Gengyu Yang , Yu Tang , Jun Mao , Yimao Cai
IPC分类号： H01L21/02
CPC分类号： H01L45/04 , G11C13/0007 , G11C2013/0073 , G11C2213/15 , H01L45/1233 , H01L45/146 , H01L45/1633
摘要： The present invention discloses a method for fabricating a resistive memory, including: fabricating a bottom electrode over a substrate; partially oxidizing a metal of the bottom electrode through dry-oxygen oxidation or wet-oxygen oxidation to form a metal oxide with a thickness of 3 nm to 50 nm as a resistive material layer; finally fabricating a top electrode over the resistive material layer. The present invention omits a step of depositing a resistive material layer in a conventional method, so as to greatly reduce the process complexity. Meanwhile, a self alignment between the resistive material layer and the bottom electrode can be realized. A full isolation between devices may be ensured so as to obviate the parasite effects occurred in the conventional process methods. Meanwhile, the actual area and designed area of the device are ensured to be consistent.
摘要翻译：本发明公开了一种制造电阻式存储器的方法，包括：在衬底上制造底电极; 通过干氧氧化或湿氧氧化部分氧化底部电极的金属，形成厚度为3nm至50nm的金属氧化物作为电阻材料层; 最后在电阻材料层上制造顶部电极。本发明省略了以常规方法沉积电阻材料层的步骤，从而大大降低了工艺的复杂性。同时，可以实现电阻材料层和底部电极之间的自对准。可以确保器件之间的完全隔离，以便消除常规工艺方法中发生的寄生效应。同时，确保设备的实际面积和设计面积一致。

2. 发明授权

US08633465B2 Multilevel resistive memory having large storage capacity 有权
标题翻译：具有大存储容量的多电阻电阻存储器
公开(公告)号：US08633465B2
公开(公告)日：2014-01-21
申请号：US13513155
申请日：2012-02-08
申请人： Ru Huang , Gengyu Yang , Yimao Cai , Yu Tang , Lijie Zhang , Yue Pan , Shenghu Tan , Yinglong Huang
发明人： Ru Huang , Gengyu Yang , Yimao Cai , Yu Tang , Lijie Zhang , Yue Pan , Shenghu Tan , Yinglong Huang
IPC分类号： H01L47/00
CPC分类号： H01L45/08 , G11C11/5685 , G11C13/0007 , H01L45/12 , H01L45/1233 , H01L45/146
摘要： The present invention discloses a multilevel resistive memory having large storage capacity, which belongs to a field of a fabrication technology of a resistive memory. The resistive memory includes an top electrode and a bottom electrode, and a combination of a plurality of switching layers and defective layers interposed between the top electrode and the bottom electrode, wherein, the top electrode and the bottom electrode are respectively contacted with a switching layer (a film such as Ta2O5, TiO2, HfO2), and the defective layers (metal film such as Ti, Au, Ag) are interposed between the switching layers. By using the present invention, a storage capacity of a resistive memory can be increased.
摘要翻译：本发明公开了一种具有大存储容量的多电平电阻存储器，属于电阻式存储器的制造技术领域。电阻性存储器包括顶电极和底电极，以及插入在顶电极和底电极之间的多个开关层和有缺陷层的组合，其中，顶电极和底电极分别与开关层（诸如Ta 2 O 5，TiO 2，HfO 2的膜）和缺陷层（诸如Ti，Au，Ag的金属膜）介于切换层之间。通过使用本发明，可以提高电阻式存储器的存储容量。

3. 发明申请

US20130069031A1 MULTILEVEL RESISTIVE MEMORY HAVING LARGE STORAGE CAPACITY 有权
标题翻译：具有大容量存储容量的多电阻存储器
公开(公告)号：US20130069031A1
公开(公告)日：2013-03-21
申请号：US13513155
申请日：2012-02-08
申请人： Ru Huang , Gengyu Yang , Yimao Cai , Yu Tang , Lijie Zhang , Yue Pan , Shenghu Tan , Yinglong Huang
发明人： Ru Huang , Gengyu Yang , Yimao Cai , Yu Tang , Lijie Zhang , Yue Pan , Shenghu Tan , Yinglong Huang
IPC分类号： H01L45/00
CPC分类号： H01L45/08 , G11C11/5685 , G11C13/0007 , H01L45/12 , H01L45/1233 , H01L45/146
摘要： The present invention discloses a multilevel resistive memory having large storage capacity, which belongs to a field of a fabrication technology of a resistive memory. The resistive memory includes an top electrode and a bottom electrode, and a combination of a plurality of switching layers and defective layers interposed between the top electrode and the bottom electrode, wherein, the top electrode and the bottom electrode are respectively contacted with a switching layer (a film such as Ta2O5, TiO2, HfO2), and the defective layers (metal film such as Ti, Au, Ag) are interposed between the switching layers. By using the present invention, a storage capacity of a resistive memory can be increased.
摘要翻译：本发明公开了一种具有大存储容量的多电平电阻存储器，属于电阻式存储器的制造技术领域。电阻性存储器包括顶电极和底电极，以及插入在顶电极和底电极之间的多个开关层和有缺陷层的组合，其中，顶电极和底电极分别与开关层（诸如Ta 2 O 5，TiO 2，HfO 2的膜）和缺陷层（诸如Ti，Au，Ag的金属膜）介于切换层之间。通过使用本发明，可以提高电阻式存储器的存储容量。

4. 发明申请

US20140145139A1 TRANSPARENT FLEXIBLE RESISTIVE MEMORY AND FABRICATION METHOD THEREOF 审中-公开
标题翻译：透明柔性电阻记忆及其制造方法
公开(公告)号：US20140145139A1
公开(公告)日：2014-05-29
申请号：US13581470
申请日：2012-02-22
申请人： Ru Huang , Yu Tang , Yimao Cai , Lijie Zhang , Gengyu Yang , Shenghu Tan , Yue Pan , Poren Tang
发明人： Ru Huang , Yu Tang , Yimao Cai , Lijie Zhang , Gengyu Yang , Shenghu Tan , Yue Pan , Poren Tang
IPC分类号： H01L45/00
CPC分类号： H01L45/149 , H01L45/1675 , H01L51/0591
摘要： The present invention discloses a transparent flexible resistive memory and a fabrication method thereof. The transparent flexible resistive memory includes a transparent flexible substrate, a memory unit with a MIM capacitor structure over the substrate, wherein a bottom electrode and a top electrode of the memory unit are transparent and flexible, and an intermediate resistive layer is a transparent flexible film of poly(p-xylylene). Poly(p-xylylene) has excellent resistive characteristics. In the device, the substrate, the electrodes and the intermediate resistive layer are all formed of transparent flexible material so that a completely transparent flexible resistive memory which can be used in a transparent flexible electronic system is obtained.
摘要翻译：本发明公开了一种透明柔性电阻式存储器及其制造方法。透明柔性电阻存储器包括透明柔性衬底，在衬底上具有MIM电容器结构的存储单元，其中存储单元的底电极和顶电极是透明和柔性的，中间电阻层是透明柔性膜的聚（对二甲苯）。聚（对二甲苯）具有优异的电阻特性。在该器件中，衬底，电极和中间电阻层均由透明柔性材料形成，从而获得可用于透明柔性电子系统中的完全透明的柔性电阻性存储器。

5. 发明授权

US09142768B2 Resistive memory with small electrode and method for fabricating the same 有权
标题翻译：具有小电极的电阻记忆及其制造方法
公开(公告)号：US09142768B2
公开(公告)日：2015-09-22
申请号：US13698799
申请日：2012-05-02
申请人： Yimao Cai , Jun Mao , Ru Huang , Shenghu Tan , Yinglong Huang , Yue Pan
发明人： Yimao Cai , Jun Mao , Ru Huang , Shenghu Tan , Yinglong Huang , Yue Pan
IPC分类号： H01L45/00
CPC分类号： H01L45/1253 , H01L45/04 , H01L45/122 , H01L45/1233 , H01L45/1273 , H01L45/146 , H01L45/1608 , H01L45/1616 , H01L45/1625
摘要： Systems and methods are disclosed involving a resistive memory with a small electrode, relating to the field of semiconductor resistive memory in ULSI. An illustrative resistive memory may include an Al electrode layer, a SiO2 layer, a Si layer, a resistive material layer and a lower electrode layer in sequence, wherein the Al electrode layer and the resistive material layer are electrically connected through one or more conductive channel and the conductive channel is formed by penetrating Al material into the Si layer via defects in the SiO2 layer and dissolving Si material into the Al material. Methods may include forming a lower electrode layer, a resistive layer, a Si layer and a SiO2 layer over a substrate; fabricating a Al electrode layer over the SiO2 layer; and performing an anneal process to the resultant structure. Consistent with innovations herein, a small electrode may be obtained via a conventional process.
摘要翻译：公开了涉及具有与ULSI中的半导体电阻性存储器的领域相关的具有小电极的电阻性存储器的系统和方法。示例性电阻存储器可以依次包括Al电极层，SiO 2层，Si层，电阻材料层和下电极层，其中Al电极层和电阻材料层通过一个或多个导电沟道电连接并且通过SiO 2层中的缺陷将Al材料穿过Si层而将Si材料溶解到Al材料中而形成导电通道。方法可以包括在衬底上形成下电极层，电阻层，Si层和SiO 2层; 在SiO 2层上制造Al电极层; 对所得到的结构进行退火处理。与本文的创新一致，可以通过常规方法获得小电极。

6. 发明授权

US08942036B2 Method for achieving four-bit storage using flash memory having splitting trench gate 有权
标题翻译：用于使用具有分裂沟槽栅极的闪存实现四位存储的方法
公开(公告)号：US08942036B2
公开(公告)日：2015-01-27
申请号：US13499596
申请日：2011-10-14
申请人： Yimao Cai , Ru Huang , Shiqiang Qin , Poren Tang , Yu Tang , Shenghu Tan , Xin Huang , Yue Pan
发明人： Yimao Cai , Ru Huang , Shiqiang Qin , Poren Tang , Yu Tang , Shenghu Tan , Xin Huang , Yue Pan
IPC分类号： G11C11/40 , H01L29/423 , G11C16/04 , H01L29/788 , H01L29/792
CPC分类号： H01L29/42352 , G11C16/0475 , H01L29/7887 , H01L29/7923
摘要： The present invention discloses a method for achieving four-bit storage by using a flash memory having a splitting trench gate. The flash memory with the splitting trench gate is disclosed in a Chinese patent No. 200710105964.2. At one side that each of two trenches is contacted with a channel, a programming for electrons is achieved by using a channel hot electron injection method; and at the other side that each of the two trenches is contacted with a source or a drain, a programming for electrons is achieved by using an FN injection method, so that a function of a four-bit storage of the device is achieved by changing a programming mode. Thus, a performance of the device is improved while a storage density is greatly increased.
摘要翻译：本发明公开了一种通过使用具有分割沟槽栅的闪存来实现四位存储的方法。具有分割沟槽栅的闪速存储器在中国专利No.200710105964.2中公开。在两个沟槽中的每一个与沟道接触的一侧，通过使用沟道热电子注入方法实现电子编程; 并且在另一侧，两个沟槽中的每一个与源极或漏极接触，通过使用FN注入方法来实现电子编程，使得通过改变器件的四位存储器的功能来实现一种编程模式。因此，提高了存储密度的装置的性能。

7. 发明申请

US20120188821A1 METHOD FOR ACHIEVING FOUR-BIT STORAGE USING FLASH MEMORY HAVING SPLITTING TRENCH GATE 有权
标题翻译：使用具有分割式闸门的闪存存储器实现四位存储的方法
公开(公告)号：US20120188821A1
公开(公告)日：2012-07-26
申请号：US13499596
申请日：2011-10-14
申请人： Yimao Cai , Ru Huang , Shiqiang Qin , Poren Tang , Yu Tang , Shenghu Tan , Xin Huang , Yue Pan
发明人： Yimao Cai , Ru Huang , Shiqiang Qin , Poren Tang , Yu Tang , Shenghu Tan , Xin Huang , Yue Pan
IPC分类号： G11C16/34
CPC分类号： H01L29/42352 , G11C16/0475 , H01L29/7887 , H01L29/7923
摘要： The present invention discloses a method for achieving four-bit storage by using a flash memory having a splitting trench gate. The flash memory with the splitting trench gate is disclosed in a Chinese patent No. 200710105964.2. At one side that each of two trenches is contacted with a channel, a programming for electrons is achieved by using a channel hot electron injection method; and at the other side that each of the two trenches is contacted with a source or a drain, a programming for electrons is achieved by using an FN injection method, so that a function of a four-bit storage of the device is achieved by changing a programming mode. Thus, a performance of the device is improved while a storage density is greatly increased.
摘要翻译：本发明公开了一种通过使用具有分割沟槽栅的闪存来实现四位存储的方法。具有分割沟槽栅的闪速存储器在中国专利No.200710105964.2中公开。在两个沟槽中的每一个与沟道接触的一侧，通过使用沟道热电子注入方法实现电子编程; 并且在另一侧，两个沟槽中的每一个与源极或漏极接触，通过使用FN注入方法来实现电子编程，使得通过改变器件的四位存储器的功能来实现一种编程模式。因此，提高了存储密度的装置的性能。

8. 发明授权

US09953638B2 Meta-data inputs to front end processing for automatic speech recognition 有权
公开(公告)号：US09953638B2
公开(公告)日：2018-04-24
申请号：US14411236
申请日：2012-06-28
申请人： Daniel Willett , Karl Jonas Lööf , Yue Pan , Joel Pinto , Christian Gollan
发明人： Daniel Willett , Karl Jonas Lööf , Yue Pan , Joel Pinto , Christian Gollan
IPC分类号： G10L15/14 , G10L15/20 , G10L25/30 , G10L15/02
CPC分类号： G10L15/14 , G10L15/02 , G10L15/20 , G10L25/30
摘要： A computer-implemented method is described for front end speech processing for automatic speech recognition. A sequence of speech features which characterize an unknown speech input provided on an audio input channel and associated meta-data which characterize the audio input channel are received. The speech features are transformed with a computer process that uses a trained mapping function controlled by the meta-data, and automatic speech recognition is performed of the transformed speech features.

9. 发明授权

US09798858B2 Method and system for automatically evaluating the quality of medical records 有权
公开(公告)号：US09798858B2
公开(公告)日：2017-10-24
申请号：US12430348
申请日：2009-04-27
申请人： Bo Li , Xue Qiao Hou , Hui-I Hsiao , Gang Hu , Yue Pan
发明人： Bo Li , Xue Qiao Hou , Hui-I Hsiao , Gang Hu , Yue Pan
IPC分类号： G06F19/00 , G06Q50/22 , G06Q50/24
CPC分类号： G06F19/324 , G06F19/00 , G06Q50/22 , G06Q50/24
摘要： A method, a system, and a computer readable article of manufacture tangibly embodying computer readable instructions for executing a computer implemented method for automatically evaluating the quality of a medical record. The method includes: generating temporary facts from a medical record to be evaluated; constructing a query to a knowledge base of standard facts of standard medical records from the temporary facts; executing the query to the knowledge base by using a reasoning engine; and determining the quality of a medical record to be evaluated based on the result of the query.

10. 发明授权

US09763937B2 Aminoheteroaryl benzamides as kinase inhibitors 有权
公开(公告)号：US09763937B2
公开(公告)日：2017-09-19
申请号：US14964057
申请日：2015-12-09
申请人： Jeffrey T. Bagdanoff , Yu Ding , Wooseok Han , Zilin Huang , Qun Jiang , Xianming Jin , Xiang Kou , Patrick Lee , Mika Lindvall , Zhongcheng Min , Yue Pan , Sabina Pecchi , Keith Bruce Pfister , Daniel Poon , Vivek Rauniyar , Xiaojing Michael Wang , Qiong Zhang , Jianguang Zhou , Shejin Zhu
发明人： Jeffrey T. Bagdanoff , Yu Ding , Wooseok Han , Zilin Huang , Qun Jiang , Xianming Jin , Xiang Kou , Patrick Lee , Mika Lindvall , Zhongcheng Min , Yue Pan , Sabina Pecchi , Keith Bruce Pfister , Daniel Poon , Vivek Rauniyar , Xiaojing Michael Wang , Qiong Zhang , Jianguang Zhou , Shejin Zhu
IPC分类号： C07D241/02 , A61K31/4965 , A61K31/497 , A61K31/4433 , A61K31/44 , A61K31/4436 , A61K31/5355
CPC分类号： A61K31/497 , A61K31/44 , A61K31/4433 , A61K31/4436 , A61K31/4439 , A61K31/4545 , A61K31/4965 , A61K31/506 , A61K31/5355 , A61K31/5377 , A61K31/5383 , A61K31/553 , A61K45/06 , A61K2121/00 , C07D213/73 , C07D241/20 , C07D401/04 , C07D401/06 , C07D401/12 , C07D403/06 , C07D405/04 , C07D405/14 , C07D409/04 , C07D413/14 , C07D498/04
摘要： The present invention provides a compound of Formula (I) or a salt thereof; and therapeutic uses of these compounds. The present invention further provides pharmaceutical compositions comprising these compounds, and compositions comprising these compounds with a therapeutic co-agent.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式