专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100204929A1 In-Process Vision Detection of Flaw and FOD Characteristics 有权
标题翻译：缺陷和FOD特征的进程内视觉检测
公开(公告)号：US20100204929A1
公开(公告)日：2010-08-12
申请号：US12729094
申请日：2010-03-22
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G06F19/00 , G01B11/30 , B29C65/02
CPC分类号： G01N21/89 , B29C70/38 , G01N2021/8472
摘要： An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.
摘要翻译：检查系统（9）包括与制造系统（8）连接并与施加材料（64）的背衬层（65）接触的惰轮（61），旋转传感器（63）空转轮（61）并产生旋转信号。控制器（24）耦合到旋转传感器（63）并且响应于旋转信号确定复合结构（12）上的一个或多个缺陷和FOD（19）的特性。

2. 发明授权

US07576850B2 In-process vision detection of flaws and FOD by back field illumination 有权
标题翻译：通过后场照明进行瑕疵和FOD的过程中视觉检测
公开(公告)号：US07576850B2
公开(公告)日：2009-08-18
申请号：US12179674
申请日：2008-07-25
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G01N21/00
CPC分类号： B29C70/38 , B29C70/386 , G01N2021/8472
摘要： A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
摘要翻译：在结构（12）的制造期间使用的缺陷和异物碎片（FOD）检测系统（11）包括照明装置（13）。照明装置（13）构造成与制造系统（10）接近并照亮结构（12）的部分（18）。照明装置（13）相对于部分（18）以锐角引导光线（16）。检测器（14）响应于光线（16）从部分（18）的反射而在制造结构（12）期间监测部分（18）并检测部分（18）中的FOD。

3. 发明申请

US20090000723A1 IN-PROCESS VISION DETECTION OF FLAW AND FOD CHARACTERISTICS 有权
标题翻译： FLASH和FOD特性的进程内视觉检测
公开(公告)号：US20090000723A1
公开(公告)日：2009-01-01
申请号：US12057978
申请日：2008-03-28
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： B32B41/00 , G01N21/00 , B32B37/00
CPC分类号： G01N21/89 , B29C70/38 , G01N2021/8472
摘要： An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.
摘要翻译：检查系统（9）包括与制造系统（8）连接并与施加材料（64）的背衬层（65）接触的惰轮（61），旋转传感器（63）空转轮（61）并产生旋转信号。控制器（24）耦合到旋转传感器（63）并且响应于旋转信号确定复合结构（12）上的一个或多个缺陷和FOD（19）的特性。

4. 发明申请

US20080289742A1 IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION 审中-公开
标题翻译：通过后视场照明进行FLAWS和FOD的进程视觉检测
公开(公告)号：US20080289742A1
公开(公告)日：2008-11-27
申请号：US12179659
申请日：2008-07-25
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： B32B38/00
CPC分类号： B29C70/38 , B29C70/386 , G01N2021/8472
摘要： A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
摘要翻译：在结构（12）的制造期间使用的缺陷和异物碎片（FOD）检测系统（11）包括照明装置（13）。照明装置（13）构造成与制造系统（10）接近并照亮结构（12）的部分（18）。照明装置（13）相对于部分（18）以锐角引导光线（16）。检测器（14）响应于光线（16）从部分（18）的反射而在制造结构（12）期间监测部分（18）并检测部分（18）中的FOD。

5. 发明申请

US20080278716A1 IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION 有权
标题翻译：通过后视场照明进行FLAWS和FOD的进程视觉检测
公开(公告)号：US20080278716A1
公开(公告)日：2008-11-13
申请号：US12179674
申请日：2008-07-25
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G01N21/95 , G01J3/00 , G01N21/88
CPC分类号： B29C70/38 , B29C70/386 , G01N2021/8472
摘要： A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
摘要翻译：在结构（12）的制造期间使用的缺陷和异物碎片（FOD）检测系统（11）包括照明装置（13）。照明装置（13）构造成与制造系统（10）接近并照亮结构（12）的部分（18）。照明装置（13）相对于部分（18）以锐角引导光线（16）。检测器（14）响应于光线（16）从部分（18）的反射而在制造结构（12）期间监测部分（18）并检测部分（18）中的FOD。

6. 发明授权

US07362437B2 Vision inspection system device and method 有权
标题翻译：视觉检测系统装置及方法
公开(公告)号：US07362437B2
公开(公告)日：2008-04-22
申请号：US11390244
申请日：2006-03-28
申请人： Roger W. Engelbart , Reed Hannebaum , Sam Orr , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Sam Orr , Tim Pollock
IPC分类号： G01N21/00 , G01N21/84
CPC分类号： G01N21/8806 , B29C70/32 , B29C70/386 , B29C70/388 , G01N21/8901 , G01N21/94 , G01N2021/8472
摘要： A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.
摘要翻译：通过包括视觉组件的系统来检查在复合物品的制造过程中施加于基材的道路材料。视觉组件包括区域光，线发生器，传感器和图像处理器。区域光照射课程材料的一个区域。线路发生器在该区域产生一束照明。传感器捕获该区域的图像。图像处理器分析图像。图像处理器被配置为响应于被激活的区域光来识别课程材料上的碎片，并且图像处理器被配置为响应于被激活的线发生器来识别放置像差。

7. 发明授权

US08524021B2 In-process vision detection of flaw and FOD characteristics 有权
标题翻译：缺陷和FOD特征的进程内视觉检测
公开(公告)号：US08524021B2
公开(公告)日：2013-09-03
申请号：US12729094
申请日：2010-03-22
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： B32B41/00 , G01N21/47
CPC分类号： G01N21/89 , B29C70/38 , G01N2021/8472
摘要： An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.
摘要翻译：检查系统（9）包括与制造系统（8）连接并与施加材料（64）的背衬层（65）接触的惰轮（61），旋转传感器（63）空转轮（61）并产生旋转信号。控制器（24）耦合到旋转传感器（63）并且响应于旋转信号确定复合结构（12）上的一个或多个缺陷和FOD（19）的特性。

8. 发明授权

US07688434B2 In-process vision detection of flaw and FOD characteristics 有权
公开(公告)号：US07688434B2
公开(公告)日：2010-03-30
申请号：US12056326
申请日：2008-03-27
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G01N21/00 , G01N21/47 , B32B41/00
CPC分类号： G01N21/89 , B29C70/38 , G01N2021/8472
摘要： An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.

9. 发明申请

US20090002693A1 IN-PROCESS VISION DETECTION OF FLAW AND FOD CHARACTERISTICS 有权
公开(公告)号：US20090002693A1
公开(公告)日：2009-01-01
申请号：US12056326
申请日：2008-03-27
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G01N21/00
CPC分类号： G01N21/89 , B29C70/38 , G01N2021/8472
摘要： An inspection system (9) includes an idler wheel (61) that is coupled to a fabrication system (8) and is in contact with a backing layer (65) of an applied material (64), A rotation sensor (63) monitors the idler wheel (61) and generates a rotational signal. A controller (24) is coupled to the rotation sensor (63) and determines a characteristic of one or more flaws and FOD (19) on a composite structure (12) in response to the rotation signal.

10. 发明授权

US07978328B2 Vision inspection system device and method 有权
标题翻译：视觉检测系统装置及方法
公开(公告)号：US07978328B2
公开(公告)日：2011-07-12
申请号：US12107579
申请日：2008-04-22
申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
发明人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
IPC分类号： G01N21/00
CPC分类号： G01N21/8806 , B29C70/32 , B29C70/386 , G01N21/8901
摘要： A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.
摘要翻译：通过包括视觉组件的系统检查在复合物品的制造过程中施加到基底的道路材料。视觉组件包括区域光，线发生器，传感器和图像处理器。区域光照射课程材料的一个区域。线路发生器在该区域产生一束照明。传感器捕获该区域的图像。图像处理器分析图像。图像处理器被配置为响应于被激活的区域光来识别课程材料上的碎片，并且图像处理器被配置为响应于被激活的线发生器来识别放置像差。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式