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    • 3. 发明授权
    • Method of characterizing array of resistive heaters
    • 表征电阻加热器阵列的方法
    • US08439477B2
    • 2013-05-14
    • US13190505
    • 2011-07-26
    • Roger G. MarkhamDavid P. TrauernichtJohn A. LebensChristopher R. Morton
    • Roger G. MarkhamDavid P. TrauernichtJohn A. LebensChristopher R. Morton
    • B41J29/393
    • B41J2/14129B41J2/1412
    • A method of characterizing an array of resistive heaters, a first resistive heater of the array having a nominal sheet resistance, a first nominal length and a first nominal width, the method includes (a) providing a first configuration test resistor disposed proximate the first resistive heater, the first configuration test resistor including a second nominal length and a second nominal width, wherein the second nominal length is different from the first nominal length; (b) measuring a resistance of the first resistive heater; (c) measuring a resistance of the first configuration test resistor; and (d) determining the actual sheet resistance and the actual length of the first resistive heater based on the measured resistances of the first resistive heater and the first configuration test resistor.
    • 一种表征电阻加热器阵列的方法,所述阵列的第一电阻加热器具有标称薄层电阻,第一标称长度和第一标称宽度,所述方法包括(a)提供设置在第一电阻 加热器,第一配置测试电阻器包括第二标称长度和第二标称宽度,其中第二标称长度不同于第一标称长度; (b)测量第一电阻加热器的电阻; (c)测量第一配置测试电阻的电阻; 以及(d)基于所测量的第一电阻加热器和第一配置测试电阻器的电阻确定第一电阻加热器的实际薄层电阻和实际长度。