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    • 2. 发明申请
    • Tissue cutting device
    • 组织切割装置
    • US20070142852A1
    • 2007-06-21
    • US11316600
    • 2005-12-21
    • Roberta LeeHuddee HoSamuel Zuckswert
    • Roberta LeeHuddee HoSamuel Zuckswert
    • A61B17/32
    • A61B10/0266A61B2017/008
    • Devices and methods for efficient severing or cutting of a material or substance, such as soft tissue, suitable for use in open surgical and/or minimally invasive procedures, such as percutaneous procedures in breast tissue, are disclosed. A tissue cutting device may generally include a probe, a cutting assembly configured to be in a storage configuration or a preformed cutting configuration for cutting the specimen, a tissue fixator and a specimen retriever. When in the cutting configuration, the cutting assembly may be configured to move and cut the specimen relative to the tissue fixator along an axis of the probe. The tissue fixator may facilitate in stabilizing a region of tissue during cutting of the specimen. The region of tissue may be the specimen and/or tissue adjacent to and/or near the specimen. The specimen retriever may optionally be coupled to the cutting assembly and integrated as part of the tissue fixator.
    • 公开了用于有效切断或切割适合用于开放手术和/或微创手术(例如乳房组织中经皮手术)的材料或物质(例如软组织)的装置和方法。 组织切割装置通常可以包括探针,被配置为处于存储结构的切割组件或用于切割样本的预成型切割构造,组织固定器和样本检索器。 当处于切割配置时,切割组件可以被配置成沿着探针的轴线相对于组织固定器移动和切割样本。 组织固定器可以有助于在切割样本期间稳定组织区域。 组织区域可以是与样本相邻和/或附近的样本和/或组织。 样本检索器可以可选地耦合到切割组件并且被集成为组织固定器的一部分。
    • 3. 发明申请
    • Tissue cutting devices and methods
    • 组织切割装置和方法
    • US20050228403A1
    • 2005-10-13
    • US10815912
    • 2004-03-31
    • Huddee HoRoberta LeeSamuel Zuckswert
    • Huddee HoRoberta LeeSamuel Zuckswert
    • A61B10/00A61B10/02A61B17/00A61B17/32A61B18/14
    • A61B10/0266A61B17/32056A61B2017/008A61B2017/32006A61B2018/1407
    • Minimally invasive devices and methods for cutting a volume of soft tissue such as a biopsy or a therapeutic excision of cancer are disclosed. The device generally includes a probe, a cutting loop with sufficient elasticity, shape memory or superelastic property such that the loop returns to a cutting configuration when released from a storage configuration, and a loop holder to hold and rotate the cutting loop about a loop holder axis when the cutting loop is in the cutting configuration so as to adjust a loop angle between the probe axis and the cutting loop. The method generally includes positioning the tissue cutting device adjacent the volume of tissue, releasing the cutting loop from the storage configuration to the cutting configuration, rotating the cutting loop to adjust the loop angle, and moving the tissue cutting device to cut the volume of tissue.
    • 公开了用于切割大量软组织的微创装置和方法,例如活检或癌症的治疗性切除。 该装置通常包括探针,具有足够弹性的切割环,形状记忆或超弹性,使得当从储存构造释放时环路返回到切割构造,以及环保持器,用于保持和旋转切割环绕环支架 当切割环处于切割配置时,以便调节探针轴和切割环之间的回转角度。 该方法通常包括将组织切割装置定位成邻近组织体积,将切割环从存储配置释放到切割构造,旋转切割环以调节环形角度,以及移动组织切割装置以切割组织体积 。
    • 4. 发明授权
    • Scanning probe microscope apparatus for use in a scanning electron
microscope
    • 用于扫描电子显微镜的扫描探针显微镜装置
    • US5510615A
    • 1996-04-23
    • US478479
    • 1995-06-07
    • Huddee HoPaul E. West
    • Huddee HoPaul E. West
    • G01Q10/04G01Q30/02G01Q30/16G01Q30/18G01Q70/02H01J37/28H01J37/067
    • G01Q30/02B82Y35/00G01Q30/18G01Q70/02H01J37/28H01J2237/2818Y10S977/86
    • The scanning probe microscope translation apparatus includes a scanning probe microscope for examining a specimen, with a specimen stage for mounting the specimen for examination by the scanning probe microscope, and a first translator mounted to the scanning probe microscope for translating the specimen stage relative to the scanning probe microscope. A support frame is dimensioned and adapted to be mounted in a specimen chamber of a scanning electron microscope, and a second translator is provided for scanning the scanning probe microscope relative to the support frame. The second translator is mounted on dual mass plates provided for isolating the scanning probe microscope from external vibrations, and suspension device are provided for suspending the mass plates from the support frame. A vacuum load lock system permits moving the scanning probe microscope, specimen stage, first translator, and mounting assembly into and out of the vacuum of the scanning electron microscope vacuum chamber.
    • 扫描探针显微镜转印装置包括用于检查样本的扫描探针显微镜,具有用于通过扫描探针显微镜安装用于检查的样本的样本台和安装到扫描探针显微镜上的第一平移器,用于将样本台相对于 扫描探针显微镜。 支撑框架尺寸适于安装在扫描电子显微镜的样本室中,并且提供第二平移器用于相对于支撑框架扫描扫描探针显微镜。 第二个翻译器安装在双重质量板上,用于将扫描探针显微镜与外部振动隔离,并提供悬挂装置,用于将质量板从支撑架悬挂下来。 真空负载锁定系统允许将扫描探针显微镜,样品台,第一平移器和安装组件移入和移出扫描电子显微镜真空室的真空。
    • 5. 发明授权
    • Scanning probe microscope apparatus for use in a scanning electron
    • 用于扫描电子显微镜的扫描探针显微镜装置
    • US5455420A
    • 1995-10-03
    • US273740
    • 1994-07-12
    • Huddee HoPaul E. West
    • Huddee HoPaul E. West
    • G01Q10/04G01Q30/02G01Q30/16G01Q30/18G01Q70/02H01J37/28H01J37/067
    • G01Q30/02B82Y35/00G01Q30/18G01Q70/02H01J37/28H01J2237/2818Y10S977/86
    • The scanning probe microscope translation apparatus includes a scanning probe microscope for examining a specimen, with a specimen stage for mounting the specimen for examination by the scanning probe microscope, and a first translator mounted to the scanning probe microscope for translating the specimen stage relative to the scanning probe microscope. A support frame is dimensioned and adapted to be mounted in a specimen chamber of a scanning electron microscope, and a second translator is provided for scanning the scanning probe microscope relative to the support frame. The second translator is mounted on dual mass plates provided for isolating the scanning probe microscope from external vibrations, and suspension O-rings are provided for suspending the mass plates from the support frame. A vacuum load lock system permits moving the scanning probe microscope, specimen stage, first translator, and mounting assembly into and out of the vacuum of the scanning electron microscope vacuum chamber.
    • 扫描探针显微镜转印装置包括用于检查样本的扫描探针显微镜,具有用于通过扫描探针显微镜安装用于检查的样本的样本台和安装到扫描探针显微镜上的第一平移器,用于将样本台相对于 扫描探针显微镜。 支撑框架尺寸适于安装在扫描电子显微镜的样本室中,并且提供第二平移器用于相对于支撑框架扫描扫描探针显微镜。 第二个翻译器安装在双重质量板上,用于将扫描探针显微镜与外部振动隔离,并提供悬挂O形环用于将质量块悬挂在支撑框架上。 真空负载锁定系统允许将扫描探针显微镜,样品台,第一平移器和安装组件移入和移出扫描电子显微镜真空室的真空。