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    • 4. 发明授权
    • Device orientation test method suitable for automatic test equipment
    • 设备方向测试方法适用于自动测试设备
    • US4727317A
    • 1988-02-23
    • US796351
    • 1985-11-07
    • Martin J. Oliver
    • Martin J. Oliver
    • G01R31/26G01R19/14G01R31/28G01R31/00
    • G01R19/14G01R31/2813
    • Part of a printed circuit board circuit is made up of three gates (30, 31, 32) each of which are formed on a different device and interconnected by the board print so that connections (35, 36) may be established by means of probes. Associated with the inputs and outputs of each device are phantom diodes (such as diode 32) which are normally connected to circuit ground (38) but which in the case of one gate (31) are connected the supply rail (37), the device of which it forms part having been mounted in the board in the wrong orientation. By the steps of connecting one device power input pin to a test ground potential (38), raising the potential of the other power input pin via connection to a supply rail (37) and lowering the potential of an active pin (33) a diode (302) may be made to conduct current via path (304) indicating that the device (31) is wrongly orientated. The applied low potential is insufficient to bring correctly connected diodes (such as that of device 30) into conduction.
    • 印刷电路板电路的一部分由三个门(30,31,32)组成,每个栅极形成在不同的装置上并通过板印刷互连,使得可以通过探针建立连接(35,36) 。 与每个设备的输入和输出相关联的是虚拟二极管(例如二极管32),其通常连接到电路接地(38),但是在一个栅极(31)的情况下连接到供电轨(37)的情况下,该设备 其形成部分已经以错误的方向安装在板中。 通过将一个设备电源输入引脚连接到测试地电位(38)的步骤,通过连接到电源轨(37)来提高另一个电源输入引脚的电位并降低有源引脚(33)的电位,二极管 (302)可以被制成以指示装置(31)错误地定向的电流通路(304)。 所施加的低电位不足以使正确连接的二极管(诸如器件30的二极管)导通。
    • 8. 发明授权
    • Circuit testers
    • 电路测试仪
    • US4827208A
    • 1989-05-02
    • US013886
    • 1987-02-12
    • Martin J. OliverKevin E. BrazierStephen R. Boote
    • Martin J. OliverKevin E. BrazierStephen R. Boote
    • G01R31/28G01R31/319G06F11/22H05K3/00G01R15/12
    • G06F11/2273G01R31/31915
    • In circuit testers, notably automatic test equipment for the in circuit testing of digital devices, overheating damage can result if outputs are repeatedly "overdriven", that is, while applying a test input to a first device, an output of a second connected device is forced into a state contrary to that it would normally adopt. Damage is avoided by enforcing a cooling interval between overdriving tests based upon a list of parameters representative of the overdriven device and its environment. In order to reduce the overall test time, a parameter is based on a measurement derived from a circuit of the type under test. A first test results in device heating to a value. A cooling interval is enforced so that a subsequent test which results in further heating of the device, may be made without exceeding device maximum allowable temperature .sup.T max.
    • 在电路测试器中,特别是用于数字设备的电路测试的自动测试设备,如果输出被重复地“过驱动”,即在将测试输入应用于第一设备的同时,则可能导致过热损坏,第二连接设备的输出 被迫成为与通常通过的状态相反的状态。 通过基于表示过驱动装置及其环境的参数列表,实施过驱动试验之间的冷却间隔来避免损害。 为了减少总体测试时间,参数基于从被测类型的电路得到的测量值。 第一个测试结果是将设备加热到一个值。 执行冷却间隔使得可以在不超过设备最大允许温度Tmax的情况下进行导致设备进一步加热的随后测试。