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    • 1. 发明授权
    • Integrated semiconductor circuit having transistors that are switched with different frequencies
    • 具有以不同频率切换的晶体管的集成半导体电路
    • US06816432B2
    • 2004-11-09
    • US10146582
    • 2002-05-15
    • Robert FeurleDominique Savignac
    • Robert FeurleDominique Savignac
    • G11C800
    • H01L27/10873H01L21/823462H01L27/10894H01L27/10897
    • It is known to adapt the dimensions of transistors, in particular a layer thickness of a local gate oxide in a manner dependent on an operating voltage. Therefore, semiconductor circuits having transistors with different operating voltages are provided with transistors having gate oxides of different thicknesses. This allows the gate oxide thickness to be influenced even more extensively. In this case, account is taken of the fact that infrequently addressed transistors, in particular memory transistors given the same gate oxide thickness, have a significantly longer lifetime than frequently switched transistors. An integrated semiconductor circuit having transistors whose gate oxide thicknesses are adapted to the switching frequency having different magnitudes, is proposed.
    • 已知以取决于工作电压的方式适应晶体管的尺寸,特别是局部栅极氧化物的层厚度。 因此,具有不同工作电压的晶体管的半导体电路设置有具有不同厚度的栅极氧化物的晶体管。 这允许栅极氧化物厚度更广泛地影响。 在这种情况下,考虑到这样一个事实,即不常寻址的晶体管,特别是赋予相同栅极氧化物厚度的存储器晶体,具有比频率切换晶体管显着更长的寿命。 提出了具有栅极氧化物厚度适应于具有不同幅度的开关频率的晶体管的集成半导体电路。
    • 2. 发明授权
    • Integrated memory having memory cells and buffer capacitors
    • 具有存储单元和缓冲电容器的集成存储器
    • US06456522B1
    • 2002-09-24
    • US09953729
    • 2001-09-17
    • Robert FeurleDominique Savignac
    • Robert FeurleDominique Savignac
    • G11C700
    • H01L29/66181H01L27/10805H01L27/10861H01L27/10897
    • An integrated memory includes memory cells each having a selector transistor and a storage capacitor. In each memory cell, the storage capacitor is connected to one of a plurality of column lines through the selector transistor, and a control terminal of the selector transistor is connected to one of a plurality of row lines. Buffer capacitors are each connected to a contact to another one of the column lines. The buffer capacitors are disposed in such a way that a connection between the respective buffer capacitor and the contact is disposed parallel to another one of the row lines. As a result, a permanently high dielectric strength is ensured through the use of the buffer capacitors.
    • 集成存储器包括各自具有选择晶体管和存储电容器的存储单元。 在每个存储单元中,存储电容器通过选择晶体管连接到多条列线之一,并且选择晶体管的控制端连接到多行行之一。 缓冲电容器各自连接到另一个列线的触点。 缓冲电容器以这样的方式设置,使得各个缓冲电容器和触点之间的连接平行于另一条行线设置。 结果,通过使用缓冲电容器确保了永久的高介电强度。
    • 3. 发明授权
    • Semiconductor memory configuration with a bit-line twist
    • 半导体存储器配置有位线扭曲
    • US06310399B1
    • 2001-10-30
    • US09514268
    • 2000-02-28
    • Robert FeurleSabine MandelDominique SavignacHelmut Schneider
    • Robert FeurleSabine MandelDominique SavignacHelmut Schneider
    • H01L2348
    • H01L27/10885H01L23/5225H01L27/10891H01L27/10897H01L2924/0002Y10S257/907H01L2924/00
    • A semiconductor memory configuration includes bit lines in a bit-line plane, a further plane different from the bit-line plane, word lines, and a memory cell area adjacent the bit-line plane, some of the bit lines having a twist running alongside others of the bit lines being untwisted, pairs of the some of the bit lines with a twist each respectively defining a twist bit-line pair, the twist bit-line pair having contacts for crossing one bit line of the twist bit-line pair over another bit line of the twist bit-line pair and over the memory-cell area through the further plane, the untwisted others of the bit lines having dummy contacts leading from the bit-line plane to the further plane. The dummy contacts lead to the word-line plane to give the word lines a homogeneous environment. The further plane can be a word-line plane including the word lines. The bit lines in the twist-free area can be approximately from 150 nm to 250 nm wide, preferably 200 nm. The twist area can only include the twist of the bit lines. The bit lines in the twist area can be approximately from 250 nm to 350 nm wide, preferably, 330 nm wide. The bit lines can have spacing from 150 to 180 nm wide. The bit lines, the word lines, the contacts, and the dummy contacts can be made from copper or aluminum.
    • 半导体存储器配置包括位线平面中的位线,不同于位线平面的另一个平面,字线和与位线平面相邻的存储单元区域,一些位线沿着一条扭转 位线中的其他位线被解捻,一些位线的对成对分别限定扭转位线对,扭转位线对具有用于使扭转位线对的一个位线交叉的触点 扭转位线对的另一个位线和通过另一个平面的存储单元区域之后,未扭绞的其它位线具有从位线平面引导到另一个平面的虚拟触点。 虚拟触点导致字线平面,使字线成为均匀的环境。 另外的平面可以是包括字线的字线平面。 无捻区域中的位线可以约为150nm至250nm宽,优选为200nm。 扭曲区域只能包括位线的扭曲。 扭转区域中的位线可以约为250nm至350nm宽,优选为330nm宽。 位线可以具有150至180nm宽的间距。 位线,字线,触点和虚拟触点可以由铜或铝制成。
    • 5. 发明授权
    • Integrated memory with a buffer circuit
    • 具有缓冲电路的集成存储器
    • US06426899B1
    • 2002-07-30
    • US09594911
    • 2000-06-15
    • Dominique SavignacRobert FeurleHelmut Schneider
    • Dominique SavignacRobert FeurleHelmut Schneider
    • G11C700
    • G11C11/4074G11C5/141H02J9/061
    • An integrated memory includes two potential nodes at which a supply voltage is present. Memory cells each have a selection transistor and a storage capacitor. At least one series circuit is disposed between the two potential nodes. The series circuits each have at least one buffer capacitor and one associated transistor. The associated transistor effects current limiting in the event of a defect in the at least one buffer capacitor. Each of the buffer capacitor and associated transistor have a mutual configuration and dimensions like the selection transistor and storage capacitor of one of the memory cells and have only an electrical connection differing from the selection transistor and storage capacitor.
    • 集成存储器包括存在电源电压的两个潜在节点。 存储单元各自具有选择晶体管和存储电容器。 在两个电位节点之间设置至少一个串联电路。 串联电路各自具有至少一个缓冲电容器和一个相关联的晶体管。 相关的晶体管在至少一个缓冲电容器的缺陷的情况下影响电流限制。 缓冲电容器和相关晶体管中的每一个具有与存储单元之一的选择晶体管和存储电容器相互的配置和尺寸,并且仅具有与选择晶体管和存储电容器不同的电连接。
    • 7. 发明授权
    • Volatile semiconductor memory and mobile device
    • 易失性半导体存储器和移动设备
    • US06751145B2
    • 2004-06-15
    • US10233968
    • 2002-09-03
    • Robert FeurleDominique Savignac
    • Robert FeurleDominique Savignac
    • G11C700
    • G11C11/406
    • The volatile semiconductor memory is constructed from a plurality of memory segments. The information stored in the memory cells must be regularly reconditioned. Here, the time interval after the expiry of which the memory contents of the memory cells are reconditioned is set individually for each memory segment using corresponding subcircuits. The subcircuits receive, in a cyclical sequence, a refresh instruction. The passing on of the refresh instruction to the respective memory segment is interrupted if the segment-specific refresh time has not yet expired. This method of driving is implemented very easily and in a space-saving and cost-effective way in terms of circuitry.
    • 易失性半导体存储器由多个存储器段构成。 存储在存储单元中的信息必须定期修复。 这里,使用相应的子电路,针对每个存储器段分别对存储器单元的存储器内容进行再生的期满之后的时间间隔进行设置。 子电路以周期性顺序接收刷新指令。 如果片段特定的刷新时间尚未到期,则将刷新指令传递到相应的存储器段被中断。 这种驾驶方法在电路方面非常容易地以节省空间和成本有效的方式实现。
    • 9. 发明授权
    • Buffer circuit
    • 缓冲电路
    • US06317378B1
    • 2001-11-13
    • US09592225
    • 2000-06-12
    • Dominique SavignacRobert FeurleHelmut Schneider
    • Dominique SavignacRobert FeurleHelmut Schneider
    • G11C514
    • H03K19/017509G05F3/247
    • A buffer circuit serves for buffering a supply voltage of an integrated circuit. The supply voltage is present between two potential nodes. A series circuit is disposed between the two potential nodes and includes at least two buffer capacitors between which a third potential node is disposed. The third potential node is connected to an additional circuit which influences the potential of the third potential node in such a way that it does not exceed an upper and/or lower limit value when a leakage current occurs through one of the capacitors. The advantage of the buffer circuit is that when there is a defect in just one of the buffer capacitors, the other capacitor is prevented from being destroyed.
    • 缓冲电路用于缓冲集成电路的电源电压。 电源电压存在于两个电位节点之间。 串联电路设置在两个电位节点之间,并且包括至少两个缓冲电容器,第三电位节点之间设置有缓冲电容器。 第三电位节点连接到附加电路,该附加电路以这样的方式影响第三电位节点的电位,使得当通过电容器之一发生漏电流时,其不超过上限值和/或下限值。 缓冲电路的优点在于,当仅缓冲电容器中的一个存在缺陷时,防止另一电容器被破坏。