会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Process for preparation of water-free oxide material
    • 无水氧化物材料的制备方法
    • US4465656A
    • 1984-08-14
    • US481592
    • 1982-04-04
    • Ricardo C. PastorAntonio C. PastorLuisa E. GorreRemedios K. Chew
    • Ricardo C. PastorAntonio C. PastorLuisa E. GorreRemedios K. Chew
    • C01F17/00C03C1/00C01B33/18C01G17/02
    • C03C1/00C01F17/0068
    • The specification discloses new and improved processes for forming water-free metal or non-metal oxide materials, which may then be melted and formed into optical components in vitreous or crystal form, which are free of the hydrogen-impurity absorption in the near infrared wavelength range. In one process, a water-free oxide is prepared by reacting a chosen nonpolar compound containing the desired metal or non-metal with an aprotic oxygen-containing compound to form the oxide as a precipitate in a chosen aprotic nonaqueous liquid solvent which provides a water-free environment during the formation of the oxide, to prevent the inclusion of water and water-derived impurities in the oxide as formed. Then the oxide-containing precipitate is subjected to a reactive atmosphere process by exposing the powder to a chosen gas phase reactive atmosphere comprising atomic halogen at a predetermined elevated temperature for a predetermined period of time, to remove traces of water and water-derived impurities from the oxide.
    • 该说明书公开了用于形成无水金属或非金属氧化物材料的新的和改进的方法,然后将其熔化并形成为玻璃体或晶体形式的光学部件,其在近红外波长中没有吸附氢杂质 范围。 在一个方法中,通过使选择的含有所需金属或非金属的非极性化合物与非质子含氧化合物反应来制备无水氧化物,以在选择的非质子非水性液体溶剂中形成沉淀物的氧化物,所述非质子非水性非水液体溶剂提供水 在氧化物形成过程中的无环境,以防止在形成的氧化物中包含水和水源杂质。 然后通过在预定的高温下将粉末暴露于包含原子卤素的所选择的气相反应性气氛预定的时间内,将含氧化物的沉淀物进行反应性气氛处理,从而将痕量的水和水衍生的杂质从 氧化物。
    • 5. 发明授权
    • Process for low-temperature surface layer oxidation of a semiconductor
substrate
    • 半导体衬底的低温表面层氧化的方法
    • US4409260A
    • 1983-10-11
    • US392499
    • 1982-06-28
    • Ricardo C. PastorRemedios K. ChewLuisa E. Gorre
    • Ricardo C. PastorRemedios K. ChewLuisa E. Gorre
    • C23C8/14H01L21/316
    • H01L21/02238C23C8/14H01L21/02255H01L21/31662
    • The specification discloses a process for forming a coherent, uniform oxide layer on the surface of a selected semiconductor material by heating a wafer of the selected semiconductor material at a temperature of about 750.degree. C. or lower in the presence of a chosen oxygen-containing precursor and a chosen gas phase halogen-containing molecular reactant which reacts with the oxygen-containing precursor to form atomic oxygen. The substrate is heated in the presence of these reactants for a period of time sufficient to enable the atomic oxygen to react with the surface atoms of the wafer and thus form the coherent uniform oxide layer. The temperature of about 750.degree. C. is sufficiently low to avoid adverse effects, such as dopant migration, on the wafer. In a preferred embodiment of the present invention, a coherent, uniform layer of silicon dioxide is formed on the surface of a silicon wafer.
    • 本说明书公开了一种在所选择的半导体材料的表面上形成相干均匀的氧化物层的方法,该方法是在所选择的含氧物质存在下,在约750℃或更低的温度下加热所选半导体材料的晶片 前体和选定的含有气体的含卤素的分子反应物,其与含氧前体反应形成原子氧。 在这些反应物的存在下,将衬底加热足够长的时间以使原子氧与晶片的表面原子反应,从而形成相干均匀的氧化物层。 约750℃的温度足够低,以避免在晶片上的不利影响,例如掺杂剂迁移。 在本发明的优选实施例中,在硅晶片的表面上形成相干均匀的二氧化硅层。
    • 7. 发明授权
    • Process for preparation of ultrapure thorium fluoride
    • 制备超纯钍氟的方法
    • US4519986A
    • 1985-05-28
    • US343637
    • 1982-01-28
    • Ricardo C. PastorRemedios K. Chew
    • Ricardo C. PastorRemedios K. Chew
    • C01B9/08C01F15/00C01F17/00C01G21/16C03C13/04
    • C01G21/16C01B9/08C01F15/00C01F17/0062
    • The specification discloses a process for the preparation of ultrapure thorium fluoride (ThF.sub.4) having minimized water content and consequent maximized optical transmission of 10.6 micrometer radiation. First, thorium oxide is reacted with aqueous hydrofluoric acid to form a solid reaction product, which is then dried under controlled heating to form a hydrated thorium fluoride with a predetermined amount of hydration, namely ThF.sub.4.xH.sub.2 O where x is equal to 0.39. The hydrated thorium fluoride is exposed to a reactive atmosphere of hydrofluoric acid vapor and a selected fluoride compound in the gas phase at elevated temperature for a predetermined period of time. The reactive atmosphere removes substantially all of the water and water-derived impurities from the hydrated thorium fluoride to produce ultrapure thorium fluoride which is highly transmissive to 10.6 micrometer radiation.
    • 该说明书公开了一种制备超纯氟化钍(ThF4)的方法,其具有最小化的水分含量,从而最大化了10.6微米辐射的光学透射。 首先,将氧化钍与氢氟酸水溶液反应以形成固体反应产物,然后在受控加热下干燥以形成具有预定量水合的水合钍氟化物,即ThF4.xH 2 O,其中x等于0.39。 在高温下将水合钍氟化物在气相中暴露于氢氟酸蒸气和选择的氟化物的反应气氛预定的时间。 反应性气氛基本上从水合钍氟中除去水和水的杂质,以产生对10.6微米辐射高度透射的超纯钍氟化物。