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1. 发明授权

US07110933B2 Line modeling tool 失效
标题翻译：线建模工具
公开(公告)号：US07110933B2
公开(公告)日：2006-09-19
申请号：US10628195
申请日：2003-07-28
申请人： Rex E. Lowther , Gregg D. Croft , Yiqun Lin , Robert Lomenic , James P. Furino, Jr. , Joseph A. Czagas
发明人： Rex E. Lowther , Gregg D. Croft , Yiqun Lin , Robert Lomenic , James P. Furino, Jr. , Joseph A. Czagas
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A method of a modeling metallization parasitics with the use of a simulation program. In one embodiment, a method of simulating interconnect lines in an electronic design automation simulation is disclosed. The method comprises partitioning the interconnect lines into groups of interconnect lines. Each group of interconnect lines does not have interactions with any of the other groups of interconnect lines. Moreover, at least one of the groups of interconnect lines contains at least three interconnect lines. The interconnect lines in each group are modeled. The modeling includes at least one of modeling mutual inductances and modeling of mutual capacitances.
摘要翻译：使用仿真程序建模金属化寄生效应的方法。在一个实施例中，公开了一种在电子设计自动化仿真中模拟互连线的方法。该方法包括将互连线划分成互连线组。每组互连线不与任何其他互连线组相互作用。此外，互连线组中的至少一个包含至少三条互连线。每组中的互连线被建模。该建模包括至少一个模拟互感和互电容建模。

2. 发明申请

US20050027502A1 Line modeling tool 失效
标题翻译：线建模工具
公开(公告)号：US20050027502A1
公开(公告)日：2005-02-03
申请号：US10628195
申请日：2003-07-28
申请人： Rex Lowther , Gregg Croft , Yiqun Lin , Robert Lomenic , James Furino , Joseph Czagas
发明人： Rex Lowther , Gregg Croft , Yiqun Lin , Robert Lomenic , James Furino , Joseph Czagas
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A method of a modeling metallization parasitics with the use of a simulation program. In one embodiment, a method of simulating interconnect lines in an electronic design automation simulation is disclosed. The method comprises partitioning the interconnect lines into groups of interconnect lines. Each group of interconnect lines does not have interactions with any of the other groups of interconnect lines. Moreover, at least one of the groups of interconnect lines contains at least three interconnect lines. The interconnect lines in each group are modeled. The modeling includes at least one of modeling mutual inductances and modeling of mutual capacitances.
摘要翻译：使用仿真程序建模金属化寄生效应的方法。在一个实施例中，公开了一种在电子设计自动化仿真中模拟互连线的方法。该方法包括将互连线划分成互连线组。每组互连线不与任何其他互连线组相互作用。此外，互连线组中的至少一个包含至少三条互连线。每组中的互连线被建模。该建模包括至少一个模拟互感和互电容建模。

3. 发明申请

US20050028113A1 Process translation tool for analog/RF IP reuse 审中-公开
标题翻译：用于模拟/ RF IP重用的过程翻译工具
公开(公告)号：US20050028113A1
公开(公告)日：2005-02-03
申请号：US10633125
申请日：2003-08-01
申请人： Yiqun Lin , Jeffrey Shoemaker
发明人： Yiqun Lin , Jeffrey Shoemaker
IPC分类号： G06F17/50
CPC分类号： G06F17/5068
摘要： A translation tool for the design of integrated circuits. In one embodiment, a method comprises translating select device parameters in a first database associated with a first process to device parameters in a second database associated with a second process and displaying a design based on the device parameters in the second database.
摘要翻译：用于集成电路设计的翻译工具。在一个实施例中，一种方法包括将与第一过程相关联的第一数据库中的选择设备参数转换为与第二过程相关联的第二数据库中的设备参数，并且基于第二数据库中的设备参数显示设计。

4. 发明申请

US20050038639A1 Multiple variable monte carlo simulation 审中-公开
标题翻译：多变量蒙特卡罗模拟
公开(公告)号：US20050038639A1
公开(公告)日：2005-02-17
申请号：US10641698
申请日：2003-08-15
申请人： Yiqun Lin
发明人： Yiqun Lin
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A circuit simulation and analysis tool for analyzing circuit parameters. In one embodiment, a method of evaluating circuit parameters of an integrated circuit design is disclosed. The method comprises defining two or more variables to apply to the circuit parameters and running a simulation with the two or more variables on the circuit parameters.
摘要翻译：用于分析电路参数的电路仿真和分析工具。在一个实施例中，公开了一种评估集成电路设计的电路参数的方法。该方法包括定义两个或更多个变量以应用于电路参数，并在电路参数上运行两个或多个变量的仿真。

5. 发明申请

US20110269640A1 PROBES FOR DETECTING MUTATIONS OF kRas GENE, LIQUICHIP AND DETECTION METHODS THEREOF 审中-公开
标题翻译：检测kRas基因突变的检测方法及其检测方法
公开(公告)号：US20110269640A1
公开(公告)日：2011-11-03
申请号：US13125196
申请日：2009-10-19
申请人： Jiasen Xu , Shiyang Wu , Lifen Ren , Jiaying He , Huiyi Yang , Yiqun Lin
发明人： Jiasen Xu , Shiyang Wu , Lifen Ren , Jiaying He , Huiyi Yang , Yiqun Lin
IPC分类号： C40B30/04 , C40B40/06 , C07H21/04
CPC分类号： C12Q1/6886 , C12Q2600/156
摘要： Nucleic acid probes for detecting kRas gene mutations, liquid chips and detection methods thereof are provided. The liquid chips for detecting kRas gene mutations comprise: microspheres coupled with wild-type and mutant-type probes, each of which is amino-substituted at 5′-terminal, specific for kRas codons 12, 13 and/or 61, and primers for amplifying the target sequence biotin-labeled at the terminal which are enriched with mutant alleles of kRas codons 12, 13 and/or 61 to be detected. The detection methods are rapid and accurate, and the processes of the methods are easy to perform. The liquid chip can be used to detect mutations of kRas as assistance to early diagnosis of pancreatic cancer, and can be used to prognose efficiency of the molecular targeted therapy to choose right medicine accurately clinically and avoiding economic loss and time loss caused by unnecessary treatment.
摘要翻译：提供了用于检测kRas基因突变的核酸探针，液芯片及其检测方法。用于检测kRas基因突变的液体芯片包括：与野生型和突变型探针偶联的微球体，其每个在5'端被氨基取代，对kRas密码子12,13和/或61是特异性的，以及用于扩增在末端有生物素标记的靶序列，其富含待检测的kRas密码子12,13和/或61的突变型等位基因。检测方法快速准确，方法简单易行。液体芯片可用于检测kRas的突变，作为对胰腺癌早期诊断的辅助，可用于预测分子靶向治疗的效率，临床选择正确的药物，避免由不必要的治疗引起的经济损失和时间损失。

6. 发明授权

US07310595B2 Numerically modeling inductive circuit elements 失效
标题翻译：数字模拟感应电路元件
公开(公告)号：US07310595B2
公开(公告)日：2007-12-18
申请号：US10863542
申请日：2004-06-08
申请人： Rex Lowther , Yiqun Lin
发明人： Rex Lowther , Yiqun Lin
IPC分类号： G06F17/50
CPC分类号： G06F17/50 , G06F17/5036
摘要： A method of determining electrical parameters of inductive elements includes a novel technique of inverting an impedance matrix representative of said inductive circuit element. The method reduces model simulation time by a factor of 3000. In one embodiment, simulation time of a device model was reduced from 1 hour to less than 3 seconds. The method is suitable for use with circuit element modeling tools, circuit simulation environments, and antenna modeling systems. The method may be applied to inductors, transformers, antennas, etc.
摘要翻译：一种确定电感元件电参数的方法包括一种新颖的技术，用于反转表示所述电感电路元件的阻抗矩阵。该方法将模型模拟时间缩短了3000倍。在一个实施例中，设备模型的模拟时间从1小时缩短到小于3秒。该方法适用于电路元件建模工具，电路仿真环境和天线建模系统。该方法可以应用于电感器，变压器，天线等

7. 发明申请

US20050055650A1 Automatic layout fill generation 审中-公开
标题翻译：自动布局填充生成
公开(公告)号：US20050055650A1
公开(公告)日：2005-03-10
申请号：US10655829
申请日：2003-09-05
申请人： Yiqun Lin , Jeffrey Shoemaker
发明人： Yiqun Lin , Jeffrey Shoemaker
IPC分类号： G06F9/45 , G06F17/50
CPC分类号： G06F17/5068
摘要： Methods of filling empty areas in a layout simulation. In one embodiment, a method of simulating an integrated circuit layout is disclosed. The method comprises automatically identifying empty areas in a layout that can be filled and generating fill patterns to fill the empty areas.
摘要翻译：在布局模拟中填充空白区域的方法。在一个实施例中，公开了一种模拟集成电路布局的方法。该方法包括自动识别可填充的布局中的空白区域并产生填充图案以填充空白区域。

8. 发明授权

US06775807B2 Numerically modeling inductive circuit elements 失效
公开(公告)号：US06775807B2
公开(公告)日：2004-08-10
申请号：US10224170
申请日：2002-08-19
申请人： Rex Lowther , Yiqun Lin
发明人： Rex Lowther , Yiqun Lin
IPC分类号： G06F1750
CPC分类号： G06F17/50 , G06F17/5036
摘要： A method of determining electrical parameters of inductive elements includes a novel technique of inverting an impedance matrix representative of said inductive circuit element. The method reduces model simulation time by a factor of 3000. In one embodiment, simulation time of a device model was reduced from 1 hour to less than 3 seconds. The method is suitable for use with circuit element modeling tools, circuit simulation environments, and antenna modeling systems. The method may be applied to inductors, transformers, antennas, etc.

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