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    • 8. 发明授权
    • Trochoidal analysis of scattered electrons in a merged electron-ion beam
geometry
    • 在合并的电子 - 离子束几何中的散射电子的卷积分析
    • US4818868A
    • 1989-04-04
    • US154713
    • 1988-02-11
    • Ara Chutjian
    • Ara Chutjian
    • G01T1/29H01S1/00G01K1/08H01J3/14
    • G01T1/29
    • The method and apparatus of this invention provides a plurality of measurements indicative of the absolute cross section for excitation of an ion beam. The ion beam is merged for excitation by specific energies of electrons in an electron beam. Both beams are merged in an evacuated enclosure having a longitudinal magnetic field and a crossed uniform electric field. The ions and electrons interact over a known merged longitudinal length in a merged beam area. After collision, the electron and ion beams are demerged. Forward and backward-scattered electrons are collected and position-detected by a pair of microchannel plate arrays located at opposite ends of the longitudinal beam-merging area. A series of electron and ion primary current measurements are taken at full ion and electron beam strength. Measurements are also taken at greatly reduced beam strength to obtain a beam overlap profile.
    • 本发明的方法和装置提供多个指示离子束激发的绝对横截面的测量结果。 离子束通过电子束中的特定能量的电子被合并以进行激发。 两个梁合并在具有纵向磁场和交叉均匀电场的真空外壳中。 离子和电子在合并光束区域中的已知合并纵向长度上相互作用。 碰撞后,电子和离子束被分流。 通过位于纵向束合并区域的相对端的一对微通道板阵列收集正向和反向散射的电子并进行位置检测。 在全离子和电子束强度下进行一系列电子和离子初级电流测量。 在大大减小的光束强度下也进行测量以获得光束重叠轮廓。