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    • 10. 发明申请
    • Leak rate measuring device
    • 泄漏率测量装置
    • US20060283235A1
    • 2006-12-21
    • US10558164
    • 2004-05-10
    • Ludolf GerdauRandolf RolffRalf Killian
    • Ludolf GerdauRandolf RolffRalf Killian
    • G01M3/20
    • G01M3/202
    • A leak rate measuring device contains a strip spectrometer in which the ion path of the respective gas is influenced by at least one variable influencing quantity. When a gas having a predetermined mass is detected, and leakages of a gas having other predetermined masses interfere with this detection due to lack of selectivity of the spectrometer, the influencing quantity is modulated in a sinusoidal manner, and the wanted signal is subsequently selected in a lock-in amplifier. This modulation enables, for example, the elimination of the interfering influence of underground water during the leak rate measurement while using helium as a test gas.
    • 泄漏率测量装置包含带状分光计,其中各气体的离子路径受到至少一个可变影响量的影响。 当检测到具有预定质量的气体并且由于缺乏光谱仪的选择性而具有其它预定质量的气体的泄漏干扰该检测时,影响量以正弦方式被调制,随后选择有用信号 锁定放大器。 该调制例如能够在使用氦气作为测试气体的同时,消除泄漏率测量期间地下水的干扰影响。