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1. 发明授权

US06532065B1 Device and method for controlling the surface of an object 有权
标题翻译：用于控制物体表面的装置和方法
公开(公告)号：US06532065B1
公开(公告)日：2003-03-11
申请号：US09403019
申请日：2000-02-07
申请人： Ralf Grimme , Bernhard Klumpp , Michael Hoffmann , John David Smith
发明人： Ralf Grimme , Bernhard Klumpp , Michael Hoffmann , John David Smith
IPC分类号： G01N2188
CPC分类号： G01N21/94 , G01N21/88
摘要： The invention relates to a device (1) suitable for controlling a surface (8) of an object (7), notably with respect to raised areas on said surface (8). The device (1) comprises a light source (2, 3) for generating a light beam (5, 6) directed towards the surface as well as a light sensor (4) for detecting light scattered by a raised area on the surface (8). The light beam (5, 6) generated by the light source (2, 3) is configured so as to scan the surface (8) in such a way that the raised area on the surface scatters the light beam (5, 6). If there is no raised area the light beam (5, 6) undergoes ideally no, or else only slight, changes. The light sensor (4) is arranged in such a way that at least part of the scattered light can be detected. In this manner it is possible to detect, for example, impurities on uneven or structured surfaces.
摘要翻译：本发明涉及适于控制物体（7）的表面（8）的装置（1），特别是相对于所述表面（8）上的凸起区域。装置（1）包括用于产生朝向表面的光束（5,6）的光源（2,3）以及用于检测由表面上的凸起区域散射的光（8）的光传感器（4））。由光源（2,3）产生的光束（5,6）被构造成以使得表面上的凸起区域散射光束（5,6）的方式扫描表面（8）。如果没有凸起区域，则光束（5,6）理想地经历没有，或者仅稍微改变。光传感器（4）以能够检测散射光的至少一部分的方式配置。以这种方式，可以检测例如在不均匀或结构化表面上的杂质。

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