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    • 1. 发明授权
    • Selectively changeable line width memory
    • 可选择的行宽记忆
    • US07406579B2
    • 2008-07-29
    • US11160184
    • 2005-08-19
    • Rafael BlancoJack R. SmithSebastian T. Ventrone
    • Rafael BlancoJack R. SmithSebastian T. Ventrone
    • G06F12/00
    • G06F12/0886G06F12/0864
    • The invention provides for selectively changing a line width for a memory, i.e., selecting one of a plurality of line widths for a memory. The selected line width is used in communicating with one or more processors. This provides increased flexibility and efficiency for communicating with the memory. In particular, a register can be set based on a desired line width, and subsequently used when locating data in the memory. The selected line width can be associated with each data block in the memory to allow multiple line widths to be used simultaneously. When implemented in a cache, multiple ways of the cache can be processed as a group to provide data during a single memory operation. The line width can be varied based on a task, a processor, and/or a performance evaluation.
    • 本发明提供了选择性地改变存储器的线宽,即选择存储器的多条线宽之一。 选择的线宽用于与一个或多个处理器进行通信。 这提高了与内存通信的灵活性和效率。 特别地,可以基于期望的线宽来设置寄存器,并且随后在将数据定位在存储器中时使用。 所选线宽可以与存储器中的每个数据块相关联,以允许同时使用多个线宽。 当在缓存中实现时,高速缓存的多种方式可以被处理为一组以在单个存储器操作期间提供数据。 线宽可以根据任务,处理器和/或性能评估而变化。
    • 2. 发明授权
    • Asynchronous circuit with an at-speed built-in self-test (BIST) architecture
    • 具有高速内置自检(BIST)架构的异步电路
    • US08612815B2
    • 2013-12-17
    • US13327847
    • 2011-12-16
    • Faraydon PakbazJack R. SmithSebastian T. Ventrone
    • Faraydon PakbazJack R. SmithSebastian T. Ventrone
    • G01R31/28
    • G01R31/31813G01R31/3187
    • Disclosed are integrated circuits that incorporate an asynchronous circuit with a built-in self-test (BIST) architecture using a handshaking protocol for at-speed testing to detect stuck-at faults. Specifically, a test pattern generator applies test patterns to an asynchronous circuit and an analyzer analyzes the output test data. The handshaking protocol is achieved through the use of a single pulse generator, which applies a single pulse to the test pattern generator to force switching of the test pattern request signal and, thereby to control application of the test patterns to the asynchronous circuit and subsequent switching of the test pattern acknowledge signal. Generation of this single pulse can in turn be forced by the switching of the test pattern acknowledge signal.
    • 公开了集成电路,其包括具有内置自检(BIST)架构的异步电路,其使用用于高速测试的握手协议来检测卡住的故障。 具体来说,测试模式发生器将测试模式应用于异步电路,分析仪分析输出测试数据。 握手协议通过使用单个脉冲发生器来实现,该单个脉冲发生器向测试模式发生器施加单个脉冲以强制测试模式请求信号的切换,从而控制测试模式对异步电路的应用和随后的切换 的测试模式确认信号。 可以通过切换测试模式确认信号来强制产生该单个脉冲。
    • 8. 发明授权
    • Virtual cache registers with selectable width for accommodating different precision data formats
    • 具有可选宽度的虚拟缓存寄存器,以适应不同精度的数据格式
    • US06253299B1
    • 2001-06-26
    • US09224793
    • 1999-01-04
    • Jack R. SmithSebastian T. VentroneKeith R. Williams
    • Jack R. SmithSebastian T. VentroneKeith R. Williams
    • G06F1200
    • G06F9/30112G06F9/30036G06F9/3013G06F9/30138G06F12/0875
    • A structure and method for processing data comprises a processing unit having a base cache, base registers having a base width and being operatively connected to the processing unit, and virtual cache registers having a virtual width and being located in the base cache and operatively connected to the processing unit, wherein a base processing precision of the processing system is determined by the base width of the base registers and a selectable enhanced processing precision is determined by the virtual width of the virtual cache registers, wherein the base registers store base instructions and data and the virtual cache registers store enhanced data, the virtual width being greater than the base width, and wherein the base cache includes tags identifying a portion of the base cache as the virtual registers, the virtual cache registers being accessible by the processing unit only for execution of enhanced instructions for providing the enhanced processing precision.
    • 用于处理数据的结构和方法包括具有基本高速缓存,具有基本宽度并且可操作地连接到处理单元的基本寄存器的处理单元和具有虚拟宽度并位于基本高速缓存中并可操作地连接到 所述处理单元,其中所述处理系统的基本处理精度由所述基本寄存器的基本宽度确定,并且可选择的增强处理精度由所述虚拟高速缓存寄存器的虚拟宽度确定,其中所述基本寄存器存储基本指令和数据 并且所述虚拟高速缓存寄存器存储增强数据,所述虚拟宽度大于所述基本宽度,并且其中所述基本高速缓存包括标识所述基本高速缓存的一部分作为所述虚拟寄存器的标签,所述虚拟高速缓存寄存器仅由所述处理单元访问 执行增强的指令以提供增强的处理精度。
    • 9. 发明申请
    • ASYNCHRONOUS CIRCUIT WITH AN AT-SPEED BUILT-IN SELF-TEST (BIST) ARCHITECTURE
    • 具有快速内置自检(BIST)架构的异步电路
    • US20130159803A1
    • 2013-06-20
    • US13327847
    • 2011-12-16
    • Faraydon PakbazJack R. SmithSebastian T. Ventrone
    • Faraydon PakbazJack R. SmithSebastian T. Ventrone
    • G01R31/28
    • G01R31/31813G01R31/3187
    • Disclosed are embodiments of an integrated circuit that incorporates an asynchronous circuit with a built-in self-test (BIST) architecture using a handshaking protocol for at-speed testing to detect stuck-at faults. In the embodiments, a test pattern generator applies test patterns to an asynchronous circuit and an analyzer analyzes the output test data. The handshaking protocol is achieved through the use of a single pulse generator, which applies a single pulse to the test pattern generator to force switching of the test pattern request signal and, thereby to control application of the test patterns to the asynchronous circuit and subsequent switching of the test pattern acknowledge signal. Generation of this single pulse can in turn be forced by the switching of the test pattern acknowledge signal. Optionally, a time constraint can be added to the capture of the output test data to allow for detection of delay faults.
    • 公开了集成电路的实施例,该集成电路结合具有内置自检(BIST)架构的异步电路,使用用于高速测试的握手协议来检测卡住故障。 在实施例中,测试模式发生器将测试模式应用于异步电路,分析器分析输出测试数据。 握手协议通过使用单个脉冲发生器来实现,该单个脉冲发生器向测试模式发生器施加单个脉冲以强制测试模式请求信号的切换,从而控制测试模式对异步电路的应用和随后的切换 的测试模式确认信号。 可以通过切换测试模式确认信号来强制产生该单个脉冲。 可选地,可以将时间约束添加到捕获输出测试数据以允许检测延迟故障。