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    • 1. 发明申请
    • SURFACE SENSING DEVICE
    • 表面感应装置
    • WO2008029094A1
    • 2008-03-13
    • PCT/GB2007/003295
    • 2007-08-31
    • RENISHAW PLCWALLACE, David, SvenHAJDUKIEWICZ, PeterMCFARLAND, Geoffrey
    • WALLACE, David, SvenHAJDUKIEWICZ, PeterMCFARLAND, Geoffrey
    • G01B5/012
    • G01B5/012G01B7/012
    • An apparatus for measuring a surface of a workpiece is described. The apparatus comprises a support (7), attachable to the moveable arm of a machine (26), such as a coordinate positioning machine, and rotatable about first (1A) and second (2A) axes of rotation, the axes driven by first (M1) and second (M2) motors respectively. The apparatus additionally comprises a surface sensing device (4) for sensing the surface of a workpiece, rotatable about a third axis of rotation (4A). This third axis (4A) of rotation is alignable with the first axis of rotation (1A), and when aligned, rotation of the support (7) relative to the surface sensing device (4) is actuatable by the first motor (M1) when the surface sensing device (4) is held stationary by a holder (70). A method for using an apparatus for measuring a surface of a workpiece is also described.
    • 描述了一种用于测量工件表面的设备。 该装置包括可附接到诸如坐标定位机的机器(26)的可动臂的支撑件(7),并且可围绕第一(1A)和第二(2A)旋转轴线旋转,所述轴线由第一( M1)和第二(M2)马达。 该装置还包括用于感测工件的表面的表面感测装置(4),其可围绕第三旋转轴线(4A)旋转。 该旋转第三轴线(4A)可与第一旋转轴线(1A)对准,并且当对齐时,支撑件(7)相对于表面检测装置(4)的旋转可由第一马达(M1)致动, 表面感测装置(4)由保持器(70)保持固定。 还描述了一种使用用于测量工件表面的装置的方法。
    • 2. 发明申请
    • CALIBRATION OF A PROBE
    • 一个探测器的校准
    • WO2003038375A1
    • 2003-05-08
    • PCT/GB2002/004936
    • 2002-11-01
    • RENISHAW PLCHAJDUKIEWICZ, PeterMCFARLAND, GeoffreyWALLACE, David, Sven
    • HAJDUKIEWICZ, PeterMCFARLAND, GeoffreyWALLACE, David, Sven
    • G01B21/04
    • G01B21/042
    • A method of calibrating an analogue probe (10) having a stylus (12) with a workpiece-contacting tip (14) or a non-contact probe (26). A calibration artefact such as a calibration sphere (16) is mounted on a coordinate measuring machine (CMM) (18). The probe (10,26) is mounted on an arm (8) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe (10) having a workpiece-contacting stylus (12), the path is such that the deflection of the stylus varies along the path. For a non-contact probe (26) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g . a sinusoidal, path.
    • 一种校准具有工件接触尖端(14)或非接触式探头(26)的触针(12)的模拟探头(10)的方法。 诸如校准球(16)的校准人工制品安装在坐标测量机(CMM)(18)上。 探针(10,26)安装在CMM的臂(8)上,并且探头沿着路径移动,同时连续扫描校准伪影的表面,使得探针在其整个工作范围内被行使。 对于具有工件接触触针(12)的模拟探头(10),路径使得触针的偏转沿着路径变化。 对于非接触式探针(26),路径使路径和校准伪影之间的径向距离发生变化。 探测路径可以包括平行于校准球的和弦的路径,或者弯曲的,例如, 正弦曲线,路径。
    • 4. 发明申请
    • ANALOGUE PROBE
    • 模拟探头
    • WO2003062738A2
    • 2003-07-31
    • PCT/GB2003/000335
    • 2003-01-27
    • RENISHAW PLCHAJDUKIEWICZ, PeterMcFARLAND, Geoffrey
    • HAJDUKIEWICZ, PeterMcFARLAND, Geoffrey
    • G01B
    • G01B5/012
    • A probe (8) comprises a housing (10) and a member (20) movable with respect to the housing onto which a stylus (12) may be mounted such that movement of the stylus results in movement of the member and a primary transducer (50,52) for measuring movement of the member relative to the housing. The member may be located in a precisely defined rest position (22,24) with respect to the housing, putting the probe in a mechanical datum position. For a combined transducer probe, this enables the primary transducer (52,54) to be locked whilst enabling use of a secondary transducer (70). The primary transducer outputs can be datumed whilst in this mechanical datum position. Drive (40,50,60) or bias (26) means in one axis secure the member in its rest position in all axes.
    • 探针(8)包括壳体(10)和相对于壳体可移动的构件(20),触针(12)可以安装在该壳体上,使得触针的移动导致构件和初级换能器 50,52),用于测量构件相对于壳体的运动。 构件可以相对于壳体位于精确定义的静止位置(22,24)中,将探针放置在机械基准位置。 对于组合的换能器探头,这使得能够锁定主换能器(52,54),同时能够使用次级换能器(70)。 主传感器输出可以在该机械基准位置的同时进行。 驱动器(40,50,60)或偏压(26)表示在一个轴上将构件固定在所有轴上的静止位置。