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    • 3. 发明申请
    • Temperature insensitive testing device and method
    • 温度不敏感的测试装置和方法
    • US20150185278A1
    • 2015-07-02
    • US14531612
    • 2014-11-03
    • REALTEK SEMICONDUCTOR CORPORATION
    • Ching-Yao SuLiang-Wei HuangShih-Wei WangSheng-Fu Chuang
    • G01R31/28
    • G01R31/2837G01R31/2841H04L1/243
    • The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to process the test sequence according to a transmission clock and thereby generate a test signal; a reception circuit to process an echo of the test signal and generate a digital echo signal; a correlation-value generating circuit to generate correlation values including a maximum correlation value according to the test sequence and the digital echo signal; and a decision circuit to determine whether a relation between the maximum correlation value and at least one threshold satisfies a predetermined condition and thereby generate a decision result, wherein the frequency of the transmission clock is lower than a predetermined frequency which confines the variation of the maximum correlation value to a predetermined range provided that the temperature variation of the transmission cable is within a temperature variation range.
    • 本发明公开了一种温度不敏感测试装置,包括:发送端测试序列产生电路,用于产生测试序列; 传输电路,用于根据传输时钟处理测试序列,从而产生测试信号; 接收电路,用于处理测试信号的回波并产生数字回波信号; 相关值产生电路,用于产生包括根据测试序列和数字回声信号的最大相关值的相关值; 以及确定所述最大相关值和至少一个阈值之间的关系是否满足预定条件并由此产生判定结果的判定电路,其中所述传输时钟的频率低于限制所述最大相关值的最大值的变化的预定频率 相关值为预定范围,前提是传输电缆的温度变化在温度变化范围内。
    • 5. 发明申请
    • PARAMETER GENERATING DEVICE AND METHOD
    • 参数生成装置和方法
    • US20150052181A1
    • 2015-02-19
    • US14323411
    • 2014-07-03
    • REALTEK SEMICONDUCTOR CORPORATION
    • Ching-Yao SuLiang-Wei HuangShih-Wei WangWan-Chun Huang
    • G06F7/50
    • G06F17/10
    • The present invention discloses a parameter generating device and the method thereof to generate a parameter for circuit operation in which the parameter corresponds to an N degree polynomial of a characteristic curve while said N is a positive integer. The parameter generating device comprises: a storage circuit to store at least N+1 initial values that are determined by a start value and a unit variation amount; and an parameter calculating circuit, coupled to the storage circuit, to carry out addition calculation for at least [(K−1)×N+1] time(s) if a multiple K is positive or subtraction calculation for at least −K×N time(s) if the multiple K is negative, so as to generate the aforementioned parameter, wherein the multiple K is derived from a difference divided by the unit variation amount while the difference is a current value minus the start value.
    • 本发明公开了一种参数产生装置及其产生用于电路操作的参数的方法,其中参数对应于特性曲线的N度多项式,而所述N是正整数。 参数产生装置包括:存储电路,用于存储由起始值和单位变化量确定的至少N + 1个初始值; 以及耦合到存储电路的参数计算电路,如果多个K是至少-K×的正或减计算,则至少执行[(K-1)×N + 1]个时间的加法运算 如果多个K为负,则产生N个时间,从而产生上述参数,其中多个K是根据除以单位变化量的差导出的,而该差是当前值减去起始值。
    • 7. 发明授权
    • Parameter generating device and method
    • 参数生成装置及方法
    • US09471542B2
    • 2016-10-18
    • US14323411
    • 2014-07-03
    • REALTEK SEMICONDUCTOR CORPORATION
    • Ching-Yao SuLiang-Wei HuangShih-Wei WangWan-Chun Huang
    • G06F17/10G06F7/50G06F17/13G06F7/64
    • G06F17/10
    • The present invention discloses a parameter generating device and the method thereof to generate a parameter for circuit operation in which the parameter corresponds to an N degree polynomial of a characteristic curve while said N is a positive integer. The parameter generating device comprises: a storage circuit to store at least N+1 initial values that are determined by a start value and a unit variation amount; and a parameter calculating circuit, coupled to the storage circuit, to carry out addition calculation for at least [(K−1)×N+1] time(s) if a multiple K is positive or subtraction calculation for at least −K×N time(s) if the multiple K is negative, so as to generate the aforementioned parameter, wherein the multiple K is derived from a difference divided by the unit variation amount while the difference is a current value minus the start value.
    • 本发明公开了一种参数产生装置及其产生用于电路操作的参数的方法,其中参数对应于特性曲线的N度多项式,而所述N是正整数。 参数产生装置包括:存储电路,用于存储由起始值和单位变化量确定的至少N + 1个初始值; 以及耦合到存储电路的参数计算电路,如果多个K是至少-K×的正或减计算,则对至少[(K-1)×N + 1]个时间(s)进行加法运算 如果多个K为负,则产生N个时间,从而产生上述参数,其中多个K是根据除以单位变化量的差导出的,而该差是当前值减去起始值。
    • 10. 发明授权
    • Signal level decision device and method
    • 信号电平决策装置及方法
    • US09001937B2
    • 2015-04-07
    • US14184594
    • 2014-02-19
    • Realtek Semiconductor Corporation
    • Sheng-Fu ChuangLiang-Wei HuangHsuan-Ting HoChing-Yao Su
    • H04L27/06H04L27/08H04L25/03
    • H04L27/08H04L25/03828
    • The present invention discloses a signal level decision device to determine the level of a source signal. Said source signal comprises a plurality of source messages along a time axis; each source message corresponds to one of a plurality of normal levels; and each normal level is equivalent to at least one of a plurality of extension levels. The signal decision device comprises: a storage circuit to store the level information of the normal level(s) and the equivalent extension level(s) thereof in connection with some or all of the source messages; a transition parameter calculation circuit to calculate a plurality of transition parameters of the normal level and its equivalent extension level(s) in connection with each of the source messages according to the level information; and a decision circuit to determine the level of each of the source messages according to the plurality of transition parameters.
    • 本发明公开了一种用于确定源信号电平的信号电平判定装置。 所述源信号包括沿着时间轴的多个源消息; 每个源消息对应于多个正常级中的一个; 并且每个正常级别等同于多个扩展级别中的至少一个。 信号判定装置包括:存储电路,用于存储与某些或所有源消息相关的正常级别的级别信息及其等效扩展级别; 转换参数计算电路,根据电平信息,计算与每个源消息相关联的正常电平及其等效扩展电平的多个转换参数; 以及判定电路,用于根据多个转换参数来确定每个源消息的级别。