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    • 4. 发明授权
    • Memory and interconnect design in fine pitch
    • 存储器和互连设计在细微间距
    • US08482039B1
    • 2013-07-09
    • US13613680
    • 2012-09-13
    • Qiang TangMin SheKen Liao
    • Qiang TangMin SheKen Liao
    • H01L23/52
    • H01L23/522H01L27/105H01L27/10882H01L27/11803H01L2924/0002H01L2924/00
    • A memory array includes a first layer, a second layer, a third layer and a contact. The first layer is disposed on a substrate. The second layer includes a first conductive line. The first conductive line includes first line segments and second line segments. Each of the second line segments are connected to a respective one of the first line segments. The first line segments extend in a first direction on the first layer. The second line segments extend in a second direction on the first layer. The first direction is different than the second direction. The third layer is disposed on the second layer. The contact is disposed through the second layer and connects the third layer to the first conductive line. One of the first line segments extends towards the contact. Each of the first and second line segments are at least a predetermined distance from the contact.
    • 存储器阵列包括第一层,第二层,第三层和接触层。 第一层设置在基板上。 第二层包括第一导电线。 第一导线包括第一线段和第二线段。 每个第二线段连接到第一线段中相应的一个。 第一线段在第一层上沿第一方向延伸。 第二线段在第一层上沿第二方向延伸。 第一方向与第二方向不同。 第三层设置在第二层上。 接触件通过第二层设置,并将第三层连接到第一导电线。 第一个线段之一延伸到联系人。 第一和第二线段中的每一个至少距离接触件的预定距离。
    • 5. 发明授权
    • Asymmetric correction circuit with negative resistance
    • 具有负电阻的非对称校正电路
    • US08378731B1
    • 2013-02-19
    • US13159241
    • 2011-06-13
    • Qiang TangBo Wang
    • Qiang TangBo Wang
    • H03L5/00
    • H03G1/0029G11B20/10027G11B20/10324H03F3/45201H03F3/45475H03F2203/45396H03F2203/45522H03F2203/45562H03F2203/45591
    • In one embodiment, an apparatus includes an amplifier configured to receive an asymmetric signal. A first resistance is coupled between an input node and an output node of the amplifier. A second resistance is coupled to the input node of the amplifier. A first switch is configured to be controlled during a first interval to couple the second resistance to a positive resistance to increase a gain of the amplifier to correct the asymmetric signal. The gain is a function of the first resistance and a combination of the second resistance and the positive resistance. A second switch is configured to be controlled during a second interval to couple the second resistance to a negative resistance to decrease the gain of the amplifier to correct the asymmetric signal. The gain is a function of the first resistance and a combination of the second resistance and the negative resistance.
    • 在一个实施例中,一种装置包括被配置为接收不对称信号的放大器。 第一电阻耦合在放大器的输入节点和输出节点之间。 第二电阻耦合到放大器的输入节点。 第一开关被配置为在第一间隔期间被控制以将第二电阻耦合到正电阻以增加放大器的增益以校正不对称信号。 增益是第一电阻和第二电阻和正电阻的组合的函数。 第二开关被配置为在第二间隔期间被控制以将第二电阻耦合到负电阻以减小放大器的增益以校正不对称信号。 增益是第一电阻和第二电阻和负电阻的组合的函数。
    • 7. 发明申请
    • LAYOUT FOR HIGH DENSITY CONDUCTIVE INTERCONNECTS
    • 高密度导电互连布局
    • US20110006347A1
    • 2011-01-13
    • US12830754
    • 2010-07-06
    • Qiang TangRamin Ghodsi
    • Qiang TangRamin Ghodsi
    • H01L27/118
    • G11C7/18G11C2207/005
    • In one embodiment of the present invention, a method for connecting a plurality of bit lines to sense circuitry comprises providing a plurality of bit lines extending from a memory array in a first metal layer. The plurality of bit lines are separated from each other by an average spacing x in a first region of the first metal layer. The method further comprises elevating a portion of the plurality of bit lines into a second metal layer overlying the first metal layer. The elevated bit lines are separated from each other by an average spacing y in the second metal layer, with y>x. The method further comprises extending a portion of the plurality of bit lines into a second region of the first metal layer. The extended bit lines are separated from each other by an average spacing z in the second region of the first metal layer, with z>x. The method further comprises connecting a bit line in the second metal layer and a bit line in the first metal layer to the sense circuitry.
    • 在本发明的一个实施例中,用于将多个位线连接到感测电路的方法包括提供从第一金属层中的存储器阵列延伸的多个位线。 多个位线在第一金属层的第一区域中彼此间隔开平均间隔x。 该方法还包括将多个位线的一部分升高到覆盖第一金属层的第二金属层。 升高的位线在第二金属层中以平均间隔y彼此分开,y> x。 该方法还包括将多个位线的一部分延伸到第一金属层的第二区域中。 扩展位线在第一金属层的第二区域中的平均间隔z彼此分开,z> x。 该方法还包括将第二金属层中的位线和第一金属层中的位线连接到感测电路。
    • 9. 发明授权
    • Circuit and method for pre-charging from both ends of an array in a read operation in NAND flash memory
    • 在NAND闪存中的读取操作中从阵列的两端预充电的电路和方法
    • US07697343B2
    • 2010-04-13
    • US11862905
    • 2007-09-27
    • Qiang Tang
    • Qiang Tang
    • G11C11/34G11C16/06
    • G11C16/26
    • A circuit for performing a read operation in a NAND flash memory is disclosed. The NAND flash memory includes an array of bit lines grouped into first group of bit lines and second group of bit lines. The circuit includes a plurality of pre-charging and reading circuitries connected at first end of the array of bit lines and a plurality of pre-charging circuitries connected at second end of the array of bit lines. The pre-charging and reading circuitries include a select circuit which selects one group from the first and the second group of bit lines; a first and a second circuit to pre-charge and read the selected group of bit lines from the first end. The plurality of pre-charging circuits include two select lines to select one group of bit lines, and a plurality of pre-charging transistors to pre-charge the selected group of bit lines from the second end.
    • 公开了一种用于在NAND闪速存储器中执行读取操作的电路。 NAND闪存包括分组成第一组位线和第二组位线的位线阵列。 电路包括连接在位线阵列的第一端的多个预充电和读取电路以及连接在位线阵列的第二端的多个预充电电路。 预充电和读取电路包括从第一组和第二组位线选择一组的选择电路; 第一和第二电路,用于从第一端预充电和读取所选择的位线组。 多个预充电电路包括两条用于选择一组位线的选择线,以及多个预充电晶体管,用于从第二端预先选定所选择的一组位线。