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    • 1. 发明授权
    • Shingled recording systems using multiple pass write, single pass read architecture
    • 嵌入式录音系统采用多通写,单通读结构
    • US08786969B2
    • 2014-07-22
    • US13251031
    • 2011-09-30
    • Prakash KasirajThomas R. Albrecht
    • Prakash KasirajThomas R. Albrecht
    • G11B20/10
    • G11B5/012G11B5/746
    • In one embodiment, a magnetic data storage system includes a bit patterned magnetic medium, wherein centers of bits in adjacent data tracks do not lie on a common line in a cross-track direction, a magnetic head having a writer element having a width greater than a width of a data track in a track width direction adapted for writing data successively to at least two adjacent data tracks of the magnetic medium, and a reader element having a width larger than the width of a data track in the track width direction adapted for reading data concurrently from the at least two adjacent data tracks of the magnetic medium in a single pass, a drive mechanism for passing the magnetic medium over the magnetic head, and a controller electrically coupled to the magnetic head for controlling operation of the magnetic head.
    • 在一个实施例中,磁数据存储系统包括位图形磁介质,其中相邻数据磁道中的位中心不位于交叉磁道方向上的公共线上,磁头具有写入器元件,宽度大于 适于将数据连续地写入磁介质的至少两个相邻数据轨道的轨道宽度方向上的数据轨道的宽度,以及宽度大于轨道宽度方向上的数据轨道的宽度的读取器元件, 在单次通过中从磁介质的至少两个相邻数据轨道同时读取数据,用于使磁介质通过磁头的驱动机构,以及电耦合到磁头的控制器,用于控制磁头的操作。
    • 4. 发明申请
    • SHINGLED RECORDING SYSTEMS USING MULTIPLE PASS WRITE, SINGLE PASS READ ARCHITECTURE
    • 使用多个通用写入的单声道记录系统,单通道阅读架构
    • US20130083416A1
    • 2013-04-04
    • US13251031
    • 2011-09-30
    • Prakash KasirajThomas R. Albrecht
    • Prakash KasirajThomas R. Albrecht
    • G11B5/09
    • G11B5/012G11B5/746
    • In one embodiment, a magnetic data storage system includes a bit patterned magnetic medium, wherein centers of bits in adjacent data tracks do not lie on a common line in a cross-track direction, a magnetic head having a writer element having a width greater than a width of a data track in a track width direction adapted for writing data successively to at least two adjacent data tracks of the magnetic medium, and a reader element having a width larger than the width of a data track in the track width direction adapted for reading data concurrently from the at least two adjacent data tracks of the magnetic medium in a single pass, a drive mechanism for passing the magnetic medium over the magnetic head, and a controller electrically coupled to the magnetic head for controlling operation of the magnetic head.
    • 在一个实施例中,磁数据存储系统包括位图形磁介质,其中相邻数据磁道中的位中心不位于交叉磁道方向上的公共线上,磁头具有写入器元件,宽度大于 适于将数据连续地写入磁介质的至少两个相邻数据轨道的轨道宽度方向上的数据轨道的宽度,以及宽度大于轨道宽度方向上的数据轨道的宽度的读取器元件, 在单次通过中从磁介质的至少两个相邻数据轨道同时读取数据,用于使磁介质通过磁头的驱动机构,以及电耦合到磁头的控制器,用于控制磁头的操作。
    • 9. 发明授权
    • Method for reducing damage to sliders during lapping
    • 在研磨过程中减少滑块损坏的方法
    • US07360296B2
    • 2008-04-22
    • US10957098
    • 2004-09-30
    • Marie-Claire CyrillePrakash KasirajHuey-Ming Tzeng
    • Marie-Claire CyrillePrakash KasirajHuey-Ming Tzeng
    • G11B5/187B24B1/00
    • G11B5/3169G11B5/332G11B5/3932Y10T29/49041Y10T29/49046Y10T29/49048Y10T29/49052
    • A process is described for fabricating sliders with reduced lapping damage to the hard-bias materials. The stack of layers for the magnetic sensor is deposited on a wafer and patterned into an initial shape. The hard-bias structures are fabricated at the side of the magnetic sensor as in the prior art. In each of the two described embodiments of the invention, the hard-bias material below the ABS is reduced or removed and replaced with a fill material such as alumina. A first embodiment reduces the hard-bias material below the ABS by forming an extended lapping gap along the ABS in both the sensor and hard-bias material. A second embodiment forms a photoresist mask over the sensor and the portion of the hard-bias/lead structures above the ABS and the exposed hard-bias/lead material below the ABS is thinned or completely removed by milling.
    • 描述了一种用于制造滑块的方法,减少了对硬偏置材料的研磨损伤。 用于磁传感器的层堆叠沉积在晶片上并图案化成初始形状。 如现有技术那样,在磁性传感器侧制造硬偏压结构。 在本发明的两个所描述的实施例的每一个中,ABS下面的硬偏压材料被减少或移除,并用诸如氧化铝的填充材料代替。 第一实施例通过在传感器和硬偏压材料中沿着ABS形成延伸的研磨间隙来减少ABS之下的硬偏置材料。 第二实施例在传感器上形成光致抗蚀剂掩模,并且在ABS之上的硬偏置/引线结构的部分以及ABS下方的暴露的硬偏置/引线材料通过研磨被薄化或完全去除。