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    • 4. 发明授权
    • Method of fabricating conductive electrodes on the front and backside of a thin film structure
    • 在薄膜结构的正面和背面制造导电电极的方法
    • US08183111B1
    • 2012-05-22
    • US12959232
    • 2010-12-02
    • Phillipe J. TabadaMelody Tabada, legal representativeSatinderpall S. Pannu
    • Phillipe J. TabadaSatinderpall S. Pannu
    • H01L21/336
    • A61N1/0529H01L21/76814H05K1/11H05K3/4038H05K2201/0394
    • A method of fabricating a thin film device having conductive front and backside electrodes or contacts. Top-side cavities are first formed on a first dielectric layer, followed by the deposition of a metal layer on the first dielectric layer to fill the cavities. Defined metal structures are etched from the metal layer to include the cavity-filled metal, followed by depositing a second dielectric layer over the metal structures. Additional levels of defined metal structures may be formed in a similar manner with vias connecting metal structures between levels. After a final dielectric layer is deposited, a top surface of a metal structure of an uppermost metal layer is exposed through the final dielectric layer to form a front-side electrode, and a bottom surface of a cavity-filled portion of a metal structure of a lowermost metal layer is also exposed through the first dielectric layer to form a back-side electrode.
    • 一种制造具有导电正面和背面电极或触点的薄膜器件的方法。 首先在第一介电层上形成顶侧空腔,然后在第一介电层上沉积金属层以填充空腔。 从金属层蚀刻定义的金属结构以包括填充空腔的金属,然后在金属结构上沉积第二介电层。 可以以类似的方式形成限定的金属结构的附加水平,其中通孔在层间之间连接金属结构。 在沉积最终的介电层之后,通过最终介电层暴露最上层金属层的金属结构的顶表面,形成前侧电极,并且将金属结构的空腔填充部分的底表面 最下面的金属层也暴露在第一介电层中以形成背面电极。