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    • 1. 发明授权
    • Optical analytical instrument for testing the transmission and
reflection of a sample
    • 用于测试样品透射和反射的光学分析仪器
    • US4786169A
    • 1988-11-22
    • US763919
    • 1985-08-08
    • Philip R. BrierleyDoug Pfrang
    • Philip R. BrierleyDoug Pfrang
    • G01N21/01G01N21/25G01N21/35G01N21/47G01N21/49G01N21/55G01N21/59
    • G01N21/474G01N21/255G01N2021/1742G01N21/35
    • An analytical instrument includes an optical system having a source of incoming radiation (11) which in a transmission test is focused by a primary focusing element (15) onto a sample (16). The radiation transmitted through the sample is collimate by a focusing-collimating element (20) and directed across the beam of incoming radiation (14) before focused on a detector (12). To perform a test of the reflectance of the sample, an intercept element (28) is moved into position in the incoming beam (14) to deflect a portion (36) of the beam which is directed to the focusing-collimating element (20) and focused on the sample. The reflected radiation from the sample is collected by the focusing-collimating element (20) into a collimated beam (38) that is parallel and adjacent to the incoming beam, and which is directed in a path which passes by the intercept element (28) to be focused onto the detector (12). By selectively moving the intercept element (28) into and out of the path of the beam (14 ), a sample may be analyzed for both transmission and reflectance characteristics without moving the sample.
    • 分析仪器包括具有入射辐射源(11)的光学系统,其在透射测试中被主要聚焦元件(15)聚焦到样品(16)上。 透射通过样品的辐射通过聚焦准直元件(20)准直,并且在聚焦在检测器(12)上之前被引导穿过入射辐射束(14)。 为了对样品的反射率进行测试,截距元件(28)移动到入射光束(14)中的位置,以偏转被引导到聚焦准直元件(20)的光束的部分(36) 并专注于样品。 来自样品的反射辐射由聚焦准直元件(20)收集成与入射光束平行并相邻的准直光束(38),并被引导在通过截距元件(28)的路径中, 被聚焦到检测器(12)上。 通过选择性地将拦截元件(28)移动进入和离开光束(14)的路径,可以在不移动样本的情况下分析透射和反射特性的样本。
    • 2. 发明授权
    • Single adjustment specular reflection accessory for spectroscopy
    • 用于光谱的单调镜面反射附件
    • US5106196A
    • 1992-04-21
    • US570478
    • 1990-08-21
    • Philip R. Brierley
    • Philip R. Brierley
    • G01J3/453G01N21/55G02B17/06
    • G01N21/55G02B19/0023G02B19/0033G02B19/009G01J3/453G01N21/552
    • A specular reflection analyzer uses opposed parabolic mirror sections to direct a focussed beam at an angle of incidence against a sample surface and to receive a reflected beam at a corresponding angle of reflection. A first collimated beam of light is directed at a constant angle against the first parabolic mirror from a beam diverter movable parallel to the mirror's axis of symmetry and within the first collimated beam of light. Translation of the constant angle beam along a meridian on the surface of the first parabolic mirror changes the angle of incidence of a beam focused on the sample without changing the focal point. The light reflected from the sample is received in a corresponding manner by the second parabolic mirror and transformed into a collimated beam of constant angle to be received by a second beam diverter tracking the first beam diverter. Transfer optics may be used to adapt the apparatus for use in a conventional transmission spectrometer.
    • 镜面反射分析仪使用相反的抛物面镜部分以相对于样品表面的入射角引导聚焦光束并且以相应的反射角接收反射光束。 第一准直光束从平行于镜的对称轴并且在第一准直光束内的光束分流器以相对于第一抛物面镜的恒定角度被引导。 沿着第一抛物面镜的表面上的子午线的恒定角度光束的平移改变聚焦在样品上的光束的入射角而不改变焦点。 从样品反射的光以相应的方式被第二抛物面反射镜接收并变换为恒定角度的准直光束,以被跟踪第一光束分流器的第二光束分流器接收。 可以使用传输光学器件来适应在常规透射光谱仪中使用的装置。
    • 3. 发明授权
    • Interferometer spectrometer having tiltable reflector assembly and
reflector assembly therefor
    • 具有可倾斜反射器组件和反射器组件的干涉仪光谱仪
    • US5150172A
    • 1992-09-22
    • US715705
    • 1991-05-17
    • Philip R. Brierley
    • Philip R. Brierley
    • G01J3/453
    • G01J3/4532
    • A twin-arm interferometer spectrometer having a tiltable reflector assembly, which includes a pair of mutually facing parallel reflective elements, varies the path length of both interferometer arms simultaneously to achieve high resolution in a small, low maintenance design. Collimated electromagnetic radiation is split by a beamsplitter into first and second arm beams. Both arm beams impinge on the tiltable reflector assembly, to retroreflectors, and back to the beamsplitter wherein they recombine to form an exit beam. The exit beam is directed to a sample and then to a suitable detector. Modulation of the exit beam is produced by tilting the reflector assembly about an axis parallel to the reflective elements in the reflector assembly. This tilting causes a simultaneous variation in the path length of both interferometer arms, and thereby yields a large total path difference with a relatively small movement. Symmetry between the paths of the reference beam and test beam results in greater stability and greater immunity to thermal expansion.
    • 具有可倾斜反射器组件的双臂干涉仪光谱仪,其包括一对相互面对的平行反射元件,同时改变两个干涉仪臂的路径长度,以在小的维护设计中实现高分辨率。 准直的电磁辐射由分束器分裂成第一和第二臂梁。 两个臂梁都碰到可倾斜的反射器组件,后向反射器,并且回到分束器,在这些分束器中,它们重组以形成出射光束。 出射光束被引导到样品,然后被引导到合适的检测器。 通过使反射器组件围绕平行于反射器组件中的反射元件的轴线倾斜来产生出射光束的调制。 这种倾斜导致两个干涉仪臂的路径长度的同时变化,从而在相对较小的运动下产生大的总路径差。 参考光束和测试光束的路径之间的对称性导致更大的稳定性和更大的热膨胀免疫力。
    • 4. 发明授权
    • Optical analytical instrument with automatic sample changing
    • 具有自动样品更换功能的光学分析仪器
    • US4695727A
    • 1987-09-22
    • US837608
    • 1986-03-07
    • Philip R. BrierleyStephen R. Lowry
    • Philip R. BrierleyStephen R. Lowry
    • G01N35/00G01N21/35
    • G01N35/00029G01N2035/00049G01N2035/00089G01N2035/00138
    • An infrared spectroscopy instrument includes a housing having a sample chamber which is sized and shaped to accommodate the body of an automatic feeding slide projector of the type commonly utilized with standard photographic slide transparencies. The infrared beam is reflected by a system of mirrors into a beam path which extends through a portion of the slide projector mechanism ordinarily occupied by the projector lamp and optics, which have been removed. Samples are held in special sample holders adapted in size and shape to fit the compartments utilized in the slide magazine of the projector. These sample holders are indexed one at a time under the control of the instrument into a viewing position in the path of the infrared beam, and the beam passed through the sample is then collected and focused onto a detector. The feeding apparatus of the projector allows any selected sample holder in the magazine to be indexed into the slide viewing position, and allows automatic computer control of the order in which the samples are analyzed.
    • 红外光谱仪包括具有样品室的壳体,其尺寸和形状适于容纳通常与标准摄影幻灯片幻灯片一起使用的类型的自动进给幻灯机的主体。 红外光束由反射镜系统反射成光束路径,该光束路径延伸通过已被去除的投影灯和光学器件通常占据的幻灯机投影机构的一部分。 样品保持在适合于尺寸和形状的特殊样品保持器中,以适合投影机的滑轨库中使用的隔间。 这些样品保持器在仪器的控制下一次被分离成红外光束的路径中的观察位置,然后将通过样品的光束收集并聚焦到检测器上。 投影机的进给装置允许盒中的任何选定的样本保持器被索引到幻灯片观看位置,并允许自动计算机控制样本被分析的顺序。