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1. 发明授权

US07430075B2 Condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes 有权
标题翻译：用于光场显微镜的明场照明和/或暗场照明的冷凝器布置
公开(公告)号：US07430075B2
公开(公告)日：2008-09-30
申请号：US11193845
申请日：2005-07-29
申请人： Peter Dietrich , Michael Brehm , Heino Heise
发明人： Peter Dietrich , Michael Brehm , Heino Heise
IPC分类号： G02B21/14
CPC分类号： G02B21/125
摘要： A condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes comprises in a housing basic optics having at least one lens, at least one front optics which can be inserted into the illumination beam path in front of the basic optics, and means for inserting the front optics into the illumination beam path of the microscope. A first swiveling arm and a second swiveling arm are swivelably arranged at the housing of the condenser. The first swiveling arm carries first front optics with a high aperture for brightfield illumination and the second swiveling arm carries second front optics for darkfield illumination. The two swiveling arms are arranged at a defined distance from the shared basic optics of the condenser in direction of the optical axis of the illumination beam path. An aperture iris diaphragm is provided on the object side in front of the basic optics and is opened when the cardioid optics are inserted. Further, a darkfield slide with an annular mirror element is provided on the object side at the housing. Operator's controls serve to swivel the two swiveling arms for moving the darkfield slide and for adjusting the aperture iris diaphragm.
摘要翻译：用于光学显微镜的明场照明和/或暗场照明的冷凝器布置包括在具有至少一个透镜的壳体基本光学元件中，至少一个可以被插入到基本光学器件前面的照明光束路径中的前光学器件，以及用于将前光学元件插入显微镜的照明光束路径。第一旋转臂和第二旋转臂可旋转地布置在冷凝器的壳体处。第一个旋转臂承载第一个具有高光圈的前光学器件，用于明场照明，第二个旋转臂承载用于暗场照明的第二个前光学元件。两个旋转臂在照明光束路径的光轴方向上以与冷凝器的共用基本光学器件隔开的距离布置。光阑光阑设置在基本光学元件前方的物体侧，并且当插入心形光学元件时打开。此外，在壳体的物体侧设置具有环形镜元件的暗视野滑块。操作员的控制装置用于旋转两个旋转臂以移动暗场滑块并调节孔径光阑。

2. 发明申请

US20060023301A1 Condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes 有权
标题翻译：用于光场显微镜的明场照明和/或暗场照明的冷凝器布置
公开(公告)号：US20060023301A1
公开(公告)日：2006-02-02
申请号：US11193845
申请日：2005-07-29
申请人： Peter Dietrich , Michael Brehm , Heino Heise
发明人： Peter Dietrich , Michael Brehm , Heino Heise
IPC分类号： G02B21/00 , G02B21/06
CPC分类号： G02B21/125
摘要： A condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes comprises in a housing basic optics having at least one lens, at least one front optics which can be inserted into the illumination beam path in front of the basic optics, and means for inserting the front optics into the illumination beam path of the microscope. A first swiveling arm and a second swiveling arm are swivelably arranged at the housing of the condenser. The first swiveling arm carries first front optics with a high aperture for brightfield illumination and the second swiveling arm carries second front optics for darkfield illumination. The two swiveling arms are arranged at a defined distance from the shared basic optics of the condenser in direction of the optical axis of the illumination beam path. An aperture iris diaphragm is provided on the object side in front of the basic optics and is opened when the cardioid optics are inserted. Further, a darkfield slide with an annular mirror element is provided on the object side at the housing. Operator's controls serve to swivel the two swiveling arms for moving the darkfield slide and for adjusting the aperture iris diaphragm.
摘要翻译：用于光学显微镜的明场照明和/或暗场照明的冷凝器布置包括在具有至少一个透镜的壳体基本光学元件中，至少一个可以被插入到基本光学器件前面的照明光束路径中的前光学器件，以及用于将前光学元件插入显微镜的照明光束路径。第一旋转臂和第二旋转臂可旋转地布置在冷凝器的壳体处。第一个旋转臂承载第一个具有高光圈的前光学器件，用于明场照明，第二个旋转臂承载用于暗场照明的第二个前光学元件。两个旋转臂在照明光束路径的光轴方向上以与冷凝器的共用基本光学器件隔开的距离布置。光阑光阑设置在基本光学元件前方的物体侧，并且当插入心形光学元件时打开。此外，在壳体的物体侧设置具有环形镜元件的暗视野滑块。操作员的控制装置用于旋转两个旋转臂以移动暗场滑块并调节孔径光阑。

3. 发明申请

US20070041109A1 Darkfield illumination system 审中-公开
标题翻译：暗场照明系统
公开(公告)号：US20070041109A1
公开(公告)日：2007-02-22
申请号：US10554728
申请日：2004-03-10
申请人： Michael Brehm , Ingo Fahlbusch , Heino Heise , Werner Kleinschmidt , Anke Vogelsang
发明人： Michael Brehm , Ingo Fahlbusch , Heino Heise , Werner Kleinschmidt , Anke Vogelsang
IPC分类号： G02B5/08
CPC分类号： G02B21/10 , G02B21/084
摘要： The invention is directed to a darkfield illumination system and is applicable in transmitted light microscopy and in incident light microscopy. A combination with a first, segmented mirror and a second, aspherical mirror is proposed for the purpose of uniform illumination of the large object fields occurring at low magnifications.
摘要翻译：本发明涉及一种暗场照明系统，适用于透射光学显微镜和入射光学显微镜。提出了与第一，分段镜和第二非球面镜的组合，用于均匀照明在低倍率下发生的大物体场。

4. 发明申请

US20120126115A1 SPECIMEN HOLDER HAVING ALIGNMENT MARKS 有权
标题翻译：具有对准标志的样品夹
公开(公告)号：US20120126115A1
公开(公告)日：2012-05-24
申请号：US13149285
申请日：2011-05-31
申请人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
发明人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
IPC分类号： G01N23/00 , G02B21/26 , G21K5/08
CPC分类号： G02B21/34
摘要： For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.
摘要翻译：对于具有光学显微镜和粒子束显微镜组合的物体或样品的显微镜，使用导电的试样载体（1），其配置用于粒子束显微镜以及在光学显微镜中并具有至少一个对准标记（2）。对准标记被配置为直通结构，并且可以从样本载体的顶部和底部检测。

5. 发明授权

US09063341B2 Exchangeable alignment marker unit 有权
标题翻译：可更换对齐标记单位
公开(公告)号：US09063341B2
公开(公告)日：2015-06-23
申请号：US13593038
申请日：2012-08-23
申请人： Heino Heise , Ulrich Kohlhaas
发明人： Heino Heise , Ulrich Kohlhaas
IPC分类号： G02B21/34 , G01B3/00 , G02B27/32
CPC分类号： G02B21/34 , G01B3/00 , G02B27/32
摘要： An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.
摘要翻译：用于用显微镜对物体进行显微成像的物体保持器的对准标记单元，其中对准标记单元可以从物体保持器上移除并重新安装在物体保持器上，其中对准标记单元具有用于显微镜支撑的检测的至少一个对准标记，并且其中所述对准标记被设计成确定所述物体保持器的坐标系，其允许所述物体的显微镜支撑校准或所述物体的相对于其对所述物体保持器的位置的物体的面积以及所述物体保持器相对的位置到显微镜。此外，提供了一种包括物体保持器和如上所述的对准标记单元的物体保持器系统。

6. 发明授权

US08304745B2 Specimen holder having alignment marks 有权
标题翻译：标本支架具有对准标记
公开(公告)号：US08304745B2
公开(公告)日：2012-11-06
申请号：US13149285
申请日：2011-05-31
申请人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
发明人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
IPC分类号： G02B21/34 , H01J37/20 , H01J37/26
CPC分类号： G02B21/34
摘要： For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.
摘要翻译：对于具有光学显微镜和粒子束显微镜组合的物体或样品的显微镜，使用导电的试样载体（1），其配置用于粒子束显微镜以及在光学显微镜中并具有至少一个对准标记（2）。对准标记被配置为直通结构，并且可以从样本载体的顶部和底部检测。

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