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    • 1. 发明申请
    • HIGH SENSITIVITY, SOLID STATE NEUTRON DETECTOR
    • 高灵敏度,固态中性探测器
    • US20110284755A1
    • 2011-11-24
    • US13146780
    • 2009-01-30
    • Pauls StradinsHoward M. BranzQi WangHarold R. Mchugh
    • Pauls StradinsHoward M. BranzQi WangHarold R. Mchugh
    • G01T3/08H01L21/28
    • H01L31/115G01T3/00G01T3/08H01L31/02
    • An apparatus (200) for detecting slow or thermal neutrons (160) including an alpha particle-detecting layer (240) that is a hydrogenated amorphous silicon p-i-n diode structure. The apparatus includes a bottom metal contact (220) and a top metal contact (250) with the diode structure (240) positioned between the two contacts (220, 250) to facilitate detection of alpha particles (170). The apparatus (200) includes a neutron conversion layer (230) formed of a material containing boron-10 isotopes. The top contact (250) is pixilated with each contact pixel extending to or proximate to an edge of the apparatus to facilitate electrical contacting. The contact pixels have elongated bodies to allow them to extend across the apparatus surface (242) with each pixel having a small surface area to match capacitance based upon a current spike detecting circuit or amplifier connected to each pixel. The neutron conversion layer (860) may be deposited on the contact pixels (830) such as with use of inkjet printing of nanoparticle ink.
    • 一种用于检测包括作为氢化非晶硅p-i-n二极管结构的α粒子检测层(240)的慢或热中子(160)的装置(200)。 该装置包括底部金属触点(220)和顶部金属触点(250),二极管结构(240)位于两个触点(220,250)之间,以便于检测α粒子(170)。 装置(200)包括由含有硼-10同位素的材料形成的中子转换层(230)。 顶部接触(250)被像素化,每个接触像素延伸到或靠近设备的边缘以促进电接触。 接触像素具有细长体以允许它们跨越装置表面(242)延伸,每个像素具有小的表面积,以基于连接到每个像素的电流尖峰检测电路或放大器匹配电容。 中子转换层(860)可以沉积在接触像素(830)上,例如使用纳米颗粒油墨的喷墨印刷。
    • 2. 发明授权
    • High sensitivity, solid state neutron detector
    • 高灵敏度,固态中子探测器
    • US08569708B2
    • 2013-10-29
    • US13146780
    • 2009-01-30
    • Pauls StradinsHoward M. BranzQi WangHarold R. McHugh
    • Pauls StradinsHoward M. BranzQi WangHarold R. McHugh
    • G01T3/08
    • H01L31/115G01T3/00G01T3/08H01L31/02
    • An apparatus (200) for detecting slow or thermal neutrons (160) including an alpha particle-detecting layer (240) that is a hydrogenated amorphous silicon p-i-n diode structure. The apparatus includes a bottom metal contact (220) and a top metal contact (250) with the diode structure (240) positioned between the two contacts (220, 250) to facilitate detection of alpha particles (170). The apparatus (200) includes a neutron conversion layer (230) formed of a material containing boron-10 isotopes. The top contact (250) is pixilated with each contact pixel extending to or proximate to an edge of the apparatus to facilitate electrical contacting. The contact pixels have elongated bodies to allow them to extend across the apparatus surface (242) with each pixel having a small surface area to match capacitance based upon a current spike detecting circuit or amplifier connected to each pixel. The neutron conversion layer (860) may be deposited on the contact pixels (830) such as with use of inkjet printing of nanoparticle ink.
    • 一种用于检测包括作为氢化非晶硅p-i-n二极管结构的α粒子检测层(240)的慢或热中子(160)的装置(200)。 该装置包括底部金属触点(220)和顶部金属触点(250),二极管结构(240)位于两个触点(220,250)之间,以便于检测α粒子(170)。 装置(200)包括由含有硼-10同位素的材料形成的中子转换层(230)。 顶部接触(250)被像素化,每个接触像素延伸到或靠近设备的边缘以促进电接触。 接触像素具有细长体以允许它们跨越装置表面(242)延伸,每个像素具有小的表面积,以基于连接到每个像素的电流尖峰检测电路或放大器匹配电容。 中子转换层(860)可以沉积在接触像素(830)上,例如使用纳米颗粒油墨的喷墨印刷。
    • 6. 发明申请
    • RAPID THERMAL PROCESSING BY STAMPING
    • 通过冲压快速热处理
    • US20110130012A1
    • 2011-06-02
    • US12675117
    • 2007-08-31
    • Pauls StradinsQi Wang
    • Pauls StradinsQi Wang
    • H01L21/26B29C59/02C03B32/02B23P11/00
    • H01L21/324H01L21/67103Y10T29/49826
    • A rapid thermal processing device and methods are provided for thermal processing of samples such as semiconductor wafers. The device has components including a stamp (35) having a stamping surface and a heater or cooler (40) to bring it to a selected processing temperature, a sample holder (20) for holding a sample (10) in position for intimate contact with the stamping surface; and positioning components (25) for moving the stamping surface and the stamp (35) in and away from intimate, substantially non-pressured contact. Methods for using and making such devices are also provided. These devices and methods allow inexpensive, efficient, easily controllable thermal processing.
    • 提供快速热处理装置和方法用于诸如半导体晶片的样品的热处理。 该装置具有包括具有冲压表面的印模(35)和使其处于选定的处理温度的加热器或冷却器(40)的部件,用于将样品(10)保持在适当位置的样品保持器(20),以便与 冲压表面; 以及用于将冲压表面和印模(35)移动到和远离紧密的基本上无压力的接触件的定位部件(25)。 还提供了使用和制造这些装置的方法。 这些装置和方法允许廉价,有效,易于控制的热处理。
    • 7. 发明授权
    • Rapid thermal processing by stamping
    • 快速热处理冲压
    • US08389422B2
    • 2013-03-05
    • US12675117
    • 2007-08-31
    • Pauls StradinsQi Wang
    • Pauls StradinsQi Wang
    • H01L21/00
    • H01L21/324H01L21/67103Y10T29/49826
    • A rapid thermal processing device and methods are provided for thermal processing of samples such as semiconductor wafers. The device has components including a stamp (35) having a stamping surface and a heater or cooler (40) to bring it to a selected processing temperature, a sample holder (20) for holding a sample (10) in position for intimate contact with the stamping surface; and positioning components (25) for moving the stamping surface and the stamp (35) in and away from intimate, substantially non-pressured contact. Methods for using and making such devices are also provided. These devices and methods allow inexpensive, efficient, easily controllable thermal processing.
    • 提供快速热处理装置和方法用于诸如半导体晶片的样品的热处理。 该装置具有包括具有冲压表面的印模(35)和使其处于选定的处理温度的加热器或冷却器(40)的部件,用于将样品(10)保持在适当位置的样品保持器(20),以便与 冲压表面; 以及用于将冲压表面和印模(35)移动到和远离紧密的基本上无压力的接触件的定位部件(25)。 还提供了使用和制造这些装置的方法。 这些装置和方法允许廉价,有效,易于控制的热处理。
    • 8. 发明授权
    • Ultra-fast determination of quantum efficiency of a solar cell
    • 超快速测定太阳能电池的量子效率
    • US08239165B1
    • 2012-08-07
    • US12237452
    • 2008-09-25
    • David L. YoungBrian EgaasPauls Stradins
    • David L. YoungBrian EgaasPauls Stradins
    • G06F11/30G06F11/00
    • H02S50/10
    • An apparatus for measuring quantum efficiency (QE) of solar cells. The apparatus includes a light source including an array of light emitting diodes (LEDs) that each emit light corresponding to a differing portion of a test spectrum and each LED is driven by a sinusoidal power supply that operates at a unique frequency. The light source includes an optical coupling focusing the LED light into a test beam targeted on a solar cell, and a signal conditioner converts analog current signals generated by the solar cell into digital voltage signals. A QE measurement module determines a QE value corresponding to each of the LEDs based on the digital voltage signals using a Fast Fourier Transform module that processes the digital voltage signals to generate values for each operating frequency. The QE measurement module determines the QE values by applying a conversion factor to these values. Since all the LEDs can be power-modulated simultaneously and the corresponding cell responses to each of the LEDS can be analyzed simultaneously, the QE spectrum measurement time is greatly shortened as compared to conventional methods.
    • 一种用于测量太阳能电池的量子效率(QE)的装置。 该装置包括一个光源,该光源包括一组发光二极管(LED),每个发光二极管发射对应于测试光谱不同部分的光,每个LED由以唯一频率工作的正弦电源驱动。 光源包括将LED光聚焦到目标在太阳能电池上的测试光束中的光耦合器,并且信号调节器将由太阳能电池产生的模拟电流信号转换为数字电压信号。 QE测量模块基于使用快速傅立叶变换模块的数字电压信号来确定与每个LED相对应的QE值,该模块处理数字电压信号以产生每个工作频率的值。 QE测量模块通过将转换因子应用于这些值来确定QE值。 由于可以同时对所有LED进行功率调制,并且可以同时分析对每个LED的相应的单元响应,所以与常规方法相比,QE光谱测量时间大大缩短。