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1. 发明申请

US20060203578A1 Apparatus and method for self-correcting cache using line delete, data logging, and fuse repair correction 有权
标题翻译：使用行删除，数据记录和保险丝修复校正来自动校正缓存的装置和方法
公开(公告)号：US20060203578A1
公开(公告)日：2006-09-14
申请号：US11079816
申请日：2005-03-14
申请人： Patrick Meaney , William Huott , Thomas Knips , David Lund , Bryan Mechtly , Pradip Patel
发明人： Patrick Meaney , William Huott , Thomas Knips , David Lund , Bryan Mechtly , Pradip Patel
IPC分类号： G11C29/00
CPC分类号： G11C29/44 , G11C11/41 , G11C15/00 , G11C29/4401 , G11C29/789 , G11C2029/0407 , G11C2029/1208
摘要： An apparatus and method for protecting a computer system from array reliability failures uses Array Built-In Self-Test logic along with code and hardware to delete cache lines or sets that are defective, identify corresponding fuse repair values, proactively call home if spare fuses are not available, schedule soft fuse repairs for the next system restart, schedule line deletes at the next restart, store delete and fuse repairs in a table (tagged with electronic serial id, timestamp of delete or ABIST fail event, address, and type of failure) and proactively call home if there were any missed deletes that were not logged. Fuse information can also be more permanently stored into hardware electronic fuses and/or EPROMs. During a restart, previous repairs are able to be applied to the machine so that ABIST will run successfully and previous deletes to be maintained with checking to allow some ABIST failures which are protected by the line deletes to pass.
摘要翻译：一种用于保护计算机系统免受阵列可靠性故障的装置和方法使用阵列内置自检逻辑以及代码和硬件来删除有缺陷的高速缓存行或集合，识别相应的保险丝修复值，如果备用保险丝为主动式，则主动呼叫家庭不可用，为下一次重新启动计划软保险丝修复，下次重新启动时计划行删除，在表中存储删除和保险丝修复（标记为电子序列号，删除时间戳或ABIST失败事件，地址和故障类型），并且如果有任何未被记录的遗漏的删除事件，则主动呼叫回家。保险丝信息也可以更加永久地存储在硬件电子保险丝和/或EPROM中。在重新启动期间，以前的修复可以应用于机器，以便ABIST将成功运行，以前的删除将通过检查进行维护，以允许由删除行保护的一些ABIST故障通过。

2. 发明申请

US20060156130A1 Self test method and apparatus for identifying partially defective memory 失效
标题翻译：用于识别部分缺陷记忆的自检方法和装置
公开(公告)号：US20060156130A1
公开(公告)日：2006-07-13
申请号：US11008371
申请日：2004-12-09
申请人： William Huott , David Lund , Kenneth Marz , Bryan Mechtly , Pradip Patel
发明人： William Huott , David Lund , Kenneth Marz , Bryan Mechtly , Pradip Patel
IPC分类号： G01R31/28
CPC分类号： G06F12/0802 , G06F12/126 , G11C29/44 , G11C29/88 , G11C2029/0401 , G11C2029/0407 , G11C2029/4402
摘要： A computing system is provided which includes a processor having a cache memory. The cache memory includes a plurality of independently configurable subdivisions, each subdivision including a memory array. A service element (SE) of the computing system is operable to cause a built-in-self-test (BIST) to be executed to test the cache memory, the BIST being operable to determine whether any of the subdivisions is defective. When it is determined that one of the subdivisions of the cache memory determined defective by the BIST is non-repairable, the SE logically deletes the defective subdivision from the system configuration, and the SE is operable to permit the processor to operate without the logically deleted subdivision. The SE is further operable to determine that the processor is defective when a number of the defective subdivisions exceeds a threshold.
摘要翻译：提供了一种包括具有高速缓存存储器的处理器的计算系统。高速缓冲存储器包括多个可独立配置的子部分，每个细分包括存储器阵列。计算系统的服务元素（SE）可操作以执行内置自检（BIST）以测试高速缓冲存储器，BIST可操作以确定任何子细分是否有缺陷。当确定由BIST确定为有缺陷的高速缓冲存储器的一个细分是不可修复时，SE从系统配置逻辑地删除缺陷细分，并且SE可操作以允许处理器在没有逻辑删除的情况下操作细分。当有多个缺陷细分超过阈值时，SE还可操作以确定处理器有缺陷。

3. 发明申请

US20060242510A1 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing 有权
公开(公告)号：US20060242510A1
公开(公告)日：2006-10-26
申请号：US11336082
申请日：2006-01-20
申请人： Patrick Meaney , Timothy McNamara , Bryan Mechtly
发明人： Patrick Meaney , Timothy McNamara , Bryan Mechtly
IPC分类号： G01R31/28
CPC分类号： G11C29/78 , G01R31/318541
摘要： An apparatus and method for allowing for dynamic wordline repair in a clock running system in addition to allowing for programmable fuse support of combined Array Built-In Self-Test (ABIST) and Logic Built-In Self-Test (LBIST) testing. The method makes use of programmable fuses which contain Level Sensitive Scan Design (LSSD) latches which also have a system port. The system port allows for simpler reading of the fuses as well as for the dynamic updates of the programmable fuses for wordline and other repairs.

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