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    • 6. 发明公开
    • Photometric printing apparatus
    • 光学印刷设备
    • EP0111660A3
    • 1984-10-03
    • EP83110141
    • 1980-03-13
    • Optimetrix Corporation
    • Phillips, Edward H.Johannsmeier, Karl-Heinz
    • G03B41/00
    • G03F9/70
    • A photometric printing apparatus including a holder (16) for holding a first object (12) in a first plane; a stage (20) for holding a second object (14) in a second plane (77); a light source unit (24), optically disposed on one side of the holder (16), for illuminating the first object (12); a projection lens (18), optically disposed on the other side of the holder (16) and between the holder (16) and the stage (20) for projecting an image of illuminated portions of the first object (12) onto the second object (14); and control means (25, 27), for moving the stage (20) relatively to said holder to facilitate printing of an image of an illuminated portion (160) of the first object (12) at different regions (162) of the second object (14) comprises additionally viewing means (21,90,93) optically disposed between the projection lens (18) and the holder (16), for providing a viewing port to permit viewing of an aerial image of a portion (170) of the second object (14) illuminated by an image of another illuminated portion (172) of the first object (12).
    • 10. 发明公开
    • Two stage wafer prealignment system for an optical alignment and exposure machine
    • 光学对准和曝光机的两级抛光预处理系统
    • EP0027570A3
    • 1981-11-18
    • EP80105862
    • 1980-09-27
    • Optimetrix Corporation
    • Phillips, Edward H.
    • G03B41/00
    • G03F9/7011
    • In an optical alignment and exposure machine, particularly suited for printing microelectronic circuit patterns on semi-conductive wafers, two stages of wafer prealignment are performed, In the first stage of prealignment the periphery of the wafer engages three belt-driven rollers which turn the wafer to align a flat edge thereof with two of the rollers. A transfer arm then picks up the prealigned wafer and transfers itto a rotatable chuck on an X-Y addressable work stage. In the second stage of prealignment a pair of alignment members carried by the chuck index with the flat edge of the wafer, and another pair of alignment members carried by the chuck indexes either the center or a rounded edge of the wafer to a predetermined position. An optical alignment system permits rotation of the chuck to align alignment marks on the wafer with respect to projected images of alignment marks on the mask. The addressable work stage carrying the chuck includes apparatus for selectively moving the chuck and wafer into engagement with a stop carried by the work stage for accurately positioning the plane of an emulsion on the wafer with respect to a focal plane of the optical alignment system.